175 related articles for article (PubMed ID: 21817717)
1. Variations in properties of atomic force microscope cantilevers fashioned from the same wafer.
Webber GB; Stevens GW; Grieser F; Dagastine RR; Chan DY
Nanotechnology; 2008 Mar; 19(10):105709. PubMed ID: 21817717
[TBL] [Abstract][Full Text] [Related]
2. Effects of anisotropic material property on the spring constant and the resonant frequency of atomic force microscope cantilever.
Yeh MK; Tai NH; Chen BY
Rev Sci Instrum; 2009 Apr; 80(4):043705. PubMed ID: 19405664
[TBL] [Abstract][Full Text] [Related]
3. Calibration of AFM cantilever spring constants.
Gibson CT; Weeks BL; Abell C; Rayment T; Myhra S
Ultramicroscopy; 2003; 97(1-4):113-8. PubMed ID: 12801663
[TBL] [Abstract][Full Text] [Related]
4. Influence of Poisson's ratio variation on lateral spring constant of atomic force microscopy cantilevers.
Yeh MK; Tai NH; Chen BY
Ultramicroscopy; 2008 Sep; 108(10):1025-9. PubMed ID: 18547729
[TBL] [Abstract][Full Text] [Related]
5. Accuracy of the spring constant of atomic force microscopy cantilevers by finite element method.
Chen BY; Yeh MK; Tai NH
Anal Chem; 2007 Feb; 79(4):1333-8. PubMed ID: 17297931
[TBL] [Abstract][Full Text] [Related]
6. Calibration of the spring constant of cantilevers of arbitrary shape using the phase signal in an atomic force microscope.
Rawlings C; Durkan C
Nanotechnology; 2012 Dec; 23(48):485708. PubMed ID: 23137943
[TBL] [Abstract][Full Text] [Related]
7. Spring constant calibration of atomic force microscopy cantilevers with a piezosensor transfer standard.
Langlois ED; Shaw GA; Kramar JA; Pratt JR; Hurley DC
Rev Sci Instrum; 2007 Sep; 78(9):093705. PubMed ID: 17902953
[TBL] [Abstract][Full Text] [Related]
8. Error in dynamic spring constant calibration of atomic force microscope probes due to nonuniform cantilevers.
Frentrup H; Allen MS
Nanotechnology; 2011 Jul; 22(29):295703. PubMed ID: 21673383
[TBL] [Abstract][Full Text] [Related]
9. Study of thermal and acoustic noise interferences in low stiffness atomic force microscope cantilevers and characterization of their dynamic properties.
Boudaoud M; Haddab Y; Le Gorrec Y; Lutz P
Rev Sci Instrum; 2012 Jan; 83(1):013704. PubMed ID: 22299959
[TBL] [Abstract][Full Text] [Related]
10. Spring constant calibration techniques for next-generation fast-scanning atomic force microscope cantilevers.
Slattery AD; Blanch AJ; Ejov V; Quinton JS; Gibson CT
Nanotechnology; 2014 Aug; 25(33):335705. PubMed ID: 25074581
[TBL] [Abstract][Full Text] [Related]
11. Nondestructive and noncontact method for determining the spring constant of rectangular cantilevers.
Golovko DS; Haschke T; Wiechert W; Bonaccurso E
Rev Sci Instrum; 2007 Apr; 78(4):043705. PubMed ID: 17477668
[TBL] [Abstract][Full Text] [Related]
12. Calibration of silicon atomic force microscope cantilevers.
Gibson CT; Alastair Smith D; Roberts CJ
Nanotechnology; 2005 Feb; 16(2):234-8. PubMed ID: 21727428
[TBL] [Abstract][Full Text] [Related]
13. Calibration of higher eigenmode spring constants of atomic force microscope cantilevers.
Lozano JR; Kiracofe D; Melcher J; Garcia R; Raman A
Nanotechnology; 2010 Nov; 21(46):465502. PubMed ID: 20972309
[TBL] [Abstract][Full Text] [Related]
14. Atomic force microscope cantilever calibration using a focused ion beam.
Slattery AD; Quinton JS; Gibson CT
Nanotechnology; 2012 Jul; 23(28):285704. PubMed ID: 22728463
[TBL] [Abstract][Full Text] [Related]
15. Interlaboratory round robin on cantilever calibration for AFM force spectroscopy.
te Riet J; Katan AJ; Rankl C; Stahl SW; van Buul AM; Phang IY; Gomez-Casado A; Schön P; Gerritsen JW; Cambi A; Rowan AE; Vancso GJ; Jonkheijm P; Huskens J; Oosterkamp TH; Gaub H; Hinterdorfer P; Figdor CG; Speller S
Ultramicroscopy; 2011 Dec; 111(12):1659-69. PubMed ID: 22094372
[TBL] [Abstract][Full Text] [Related]
16. Accurate measurement of Atomic Force Microscope cantilever deflection excluding tip-surface contact with application to force calibration.
Slattery AD; Blanch AJ; Quinton JS; Gibson CT
Ultramicroscopy; 2013 Aug; 131():46-55. PubMed ID: 23685172
[TBL] [Abstract][Full Text] [Related]
17. Spring constant calibration of atomic force microscope cantilevers of arbitrary shape.
Sader JE; Sanelli JA; Adamson BD; Monty JP; Wei X; Crawford SA; Friend JR; Marusic I; Mulvaney P; Bieske EJ
Rev Sci Instrum; 2012 Oct; 83(10):103705. PubMed ID: 23126772
[TBL] [Abstract][Full Text] [Related]
18. Experimental determination of mode correction factors for thermal method spring constant calibration of AFM cantilevers using laser Doppler vibrometry.
Gates RS; Osborn WA; Pratt JR
Nanotechnology; 2013 Jun; 24(25):255706. PubMed ID: 23723188
[TBL] [Abstract][Full Text] [Related]
19. Precise atomic force microscope cantilever spring constant calibration using a reference cantilever array.
Gates RS; Reitsma MG
Rev Sci Instrum; 2007 Aug; 78(8):086101. PubMed ID: 17764361
[TBL] [Abstract][Full Text] [Related]
20. Design of V-shaped cantilevers for enhanced multifrequency AFM measurements.
Damircheli M; Eslami B
Beilstein J Nanotechnol; 2020; 11():1525-1541. PubMed ID: 33094086
[TBL] [Abstract][Full Text] [Related]
[Next] [New Search]
