These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.


BIOMARKERS

Molecular Biopsy of Human Tumors

- a resource for Precision Medicine *

111 related articles for article (PubMed ID: 21828563)

  • 1. Aspects of lateral resolution in energy-filtered core level photoelectron emission microscopy.
    Bailly A; Renault O; Barrett N; Desrues T; Mariolle D; Zagonel LF; Escher M
    J Phys Condens Matter; 2009 Aug; 21(31):314002. PubMed ID: 21828563
    [TBL] [Abstract][Full Text] [Related]  

  • 2. A simple energy filter for low energy electron microscopy/photoelectron emission microscopy instruments.
    Tromp RM; Fujikawa Y; Hannon JB; Ellis AW; Berghaus A; Schaff O
    J Phys Condens Matter; 2009 Aug; 21(31):314007. PubMed ID: 21828568
    [TBL] [Abstract][Full Text] [Related]  

  • 3. A new aberration-corrected, energy-filtered LEEM/PEEM instrument. I. Principles and design.
    Tromp RM; Hannon JB; Ellis AW; Wan W; Berghaus A; Schaff O
    Ultramicroscopy; 2010 Jun; 110(7):852-61. PubMed ID: 20395048
    [TBL] [Abstract][Full Text] [Related]  

  • 4. Spectromicroscope for the PHotoelectron Imaging of Nanostructures with X-rays (SPHINX): performance in biology, medicine and geology.
    Frazer BH; Girasole M; Wiese LM; Franz T; De Stasio G
    Ultramicroscopy; 2004 May; 99(2-3):87-94. PubMed ID: 15093935
    [TBL] [Abstract][Full Text] [Related]  

  • 5. Quantitative spin polarization analysis in photoelectron emission microscopy with an imaging spin filter.
    Tusche C; Ellguth M; Krasyuk A; Winkelmann A; Kutnyakhov D; Lushchyk P; Medjanik K; Schönhense G; Kirschner J
    Ultramicroscopy; 2013 Jul; 130():70-6. PubMed ID: 23561302
    [TBL] [Abstract][Full Text] [Related]  

  • 6. First experimental proof for aberration correction in XPEEM: resolution, transmission enhancement, and limitation by space charge effects.
    Schmidt T; Sala A; Marchetto H; Umbach E; Freund HJ
    Ultramicroscopy; 2013 Mar; 126():23-32. PubMed ID: 23376403
    [TBL] [Abstract][Full Text] [Related]  

  • 7. Image blur and energy broadening effects in XPEEM.
    Locatelli A; Menteş TO; Niño MÁ; Bauer E
    Ultramicroscopy; 2011 Jul; 111(8):1447-54. PubMed ID: 21232862
    [TBL] [Abstract][Full Text] [Related]  

  • 8. Laboratory-based real and reciprocal space imaging of the electronic structure of few layer graphene on SiC(0001¯) using photoelectron emission microscopy.
    Barrett N; Winkler K; Krömker B; Conrad EH
    Ultramicroscopy; 2013 Jul; 130():94-100. PubMed ID: 23541462
    [TBL] [Abstract][Full Text] [Related]  

  • 9. Spatially resolved, energy-filtered imaging of core level and valence band photoemission of highly p and n doped silicon patterns.
    Barrett N; Zagonel LF; Renault O; Bailly A
    J Phys Condens Matter; 2009 Aug; 21(31):314015. PubMed ID: 21828576
    [TBL] [Abstract][Full Text] [Related]  

  • 10. A Contrast Transfer Function approach for image calculations in standard and aberration-corrected LEEM and PEEM.
    Schramm SM; Pang AB; Altman MS; Tromp RM
    Ultramicroscopy; 2012 Apr; 115():88-108. PubMed ID: 22209472
    [TBL] [Abstract][Full Text] [Related]  

  • 11. Chemical-state-selective mapping at nanometer scale using synchrotron radiation and photoelectron emission microscopy.
    Hirao N; Baba Y; Sekiguchi T; Shimoyama I; Honda M
    Anal Sci; 2010; 26(8):835-40. PubMed ID: 20702935
    [TBL] [Abstract][Full Text] [Related]  

  • 12. Dark field photoelectron emission microscopy of micron scale few layer graphene.
    Barrett N; Conrad E; Winkler K; Krömker B
    Rev Sci Instrum; 2012 Aug; 83(8):083706. PubMed ID: 22938302
    [TBL] [Abstract][Full Text] [Related]  

  • 13. X-PEEM Study on Surface Orientation of Stylized and Rubbed Polyimides.
    Cossy-Favre A; Díaz J; Liu Y; Brown HR; Samant MG; Stöhr J; Hanna AJ; Anders S; Russell TP
    Macromolecules; 1998 Jul; 31(15):4957-62. PubMed ID: 9680434
    [TBL] [Abstract][Full Text] [Related]  

  • 14. Bulk sensitive hard x-ray photoemission electron microscopy.
    Patt M; Wiemann C; Weber N; Escher M; Gloskovskii A; Drube W; Merkel M; Schneider CM
    Rev Sci Instrum; 2014 Nov; 85(11):113704. PubMed ID: 25430117
    [TBL] [Abstract][Full Text] [Related]  

  • 15. Development of a momentum microscope for time resolved band structure imaging.
    Krömker B; Escher M; Funnemann D; Hartung D; Engelhard H; Kirschner J
    Rev Sci Instrum; 2008 May; 79(5):053702. PubMed ID: 18513070
    [TBL] [Abstract][Full Text] [Related]  

  • 16. Imaging photoelectron photoion coincidence spectroscopy with velocity focusing electron optics.
    Bodi A; Johnson M; Gerber T; Gengeliczki Z; Sztáray B; Baer T
    Rev Sci Instrum; 2009 Mar; 80(3):034101. PubMed ID: 19334934
    [TBL] [Abstract][Full Text] [Related]  

  • 17. A new aberration-corrected, energy-filtered LEEM/PEEM instrument II. Operation and results.
    Tromp RM; Hannon JB; Wan W; Berghaus A; Schaff O
    Ultramicroscopy; 2013 Apr; 127():25-39. PubMed ID: 22925736
    [TBL] [Abstract][Full Text] [Related]  

  • 18. Operando x-ray photoelectron emission microscopy for studying forward and reverse biased silicon p-n junctions.
    Barrett N; Gottlob DM; Mathieu C; Lubin C; Passicousset J; Renault O; Martinez E
    Rev Sci Instrum; 2016 May; 87(5):053703. PubMed ID: 27250431
    [TBL] [Abstract][Full Text] [Related]  

  • 19. A threshold photoelectron-photoion coincidence spectrometer with double velocity imaging using synchrotron radiation.
    Tang X; Zhou X; Niu M; Liu S; Sun J; Shan X; Liu F; Sheng L
    Rev Sci Instrum; 2009 Nov; 80(11):113101. PubMed ID: 19947711
    [TBL] [Abstract][Full Text] [Related]  

  • 20. The electron spectro-microscopy beamline at National Synchrotron Light Source II: a wide photon energy range, micro-focusing beamline for photoelectron spectro-microscopies.
    Reininger R; Hulbert SL; Johnson PD; Sadowski JT; Starr DE; Chubar O; Valla T; Vescovo E
    Rev Sci Instrum; 2012 Feb; 83(2):023102. PubMed ID: 22380074
    [TBL] [Abstract][Full Text] [Related]  

    [Next]    [New Search]
    of 6.