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2. Refined tip preparation by electrochemical etching and ultrahigh vacuum treatment to obtain atomically sharp tips for scanning tunneling microscope and atomic force microscope. Hagedorn T; El Ouali M; Paul W; Oliver D; Miyahara Y; Grütter P Rev Sci Instrum; 2011 Nov; 82(11):113903. PubMed ID: 22128992 [TBL] [Abstract][Full Text] [Related]
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