These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.


BIOMARKERS

Molecular Biopsy of Human Tumors

- a resource for Precision Medicine *

205 related articles for article (PubMed ID: 22000156)

  • 1. Plan-view preparation of TEM specimens from thin films using adhesive tape.
    Czigány Z
    Microsc Microanal; 2011 Dec; 17(6):886-8. PubMed ID: 22000156
    [TBL] [Abstract][Full Text] [Related]  

  • 2. Automated grain mapping using wide angle convergent beam electron diffraction in transmission electron microscope for nanomaterials.
    Kumar V
    Microsc Microanal; 2011 Dec; 17(6):859-65. PubMed ID: 22067632
    [TBL] [Abstract][Full Text] [Related]  

  • 3. Back-etch method for plan view transmission electron microscopy sample preparation of optically opaque films.
    Yao B; Coffey KR
    J Electron Microsc (Tokyo); 2008 Apr; 57(2):47-52. PubMed ID: 18227137
    [TBL] [Abstract][Full Text] [Related]  

  • 4. Point defect clusters and dislocations in FIB irradiated nanocrystalline aluminum films: an electron tomography and aberration-corrected high-resolution ADF-STEM study.
    Idrissi H; Turner S; Mitsuhara M; Wang B; Hata S; Coulombier M; Raskin JP; Pardoen T; Van Tendeloo G; Schryvers D
    Microsc Microanal; 2011 Dec; 17(6):983-90. PubMed ID: 22030303
    [TBL] [Abstract][Full Text] [Related]  

  • 5. In situ deformation of thin films on substrates.
    Legros M; Cabié M; Gianola DS
    Microsc Res Tech; 2009 Mar; 72(3):270-83. PubMed ID: 19189313
    [TBL] [Abstract][Full Text] [Related]  

  • 6. Imaging of fullerene-like structures in CNx thin films by electron microscopy; sample preparation artefacts due to ion-beam milling.
    Czigány Z; Neidhardt J; Brunell IF; Hultman L
    Ultramicroscopy; 2003 Apr; 94(3-4):163-73. PubMed ID: 12524186
    [TBL] [Abstract][Full Text] [Related]  

  • 7. Novel method for the plan-view TEM preparation of thin samples on brittle substrates by mechanical and ion beam thinning.
    Sáfrán G; Grenet T
    Microsc Res Tech; 2002 Feb; 56(4):308-14. PubMed ID: 11877808
    [TBL] [Abstract][Full Text] [Related]  

  • 8. TEM foil preparation of sub-micrometre sized individual grains by focused ion beam technique.
    Holzapfel C; Soldera F; Vollmer C; Hoppe P; Mücklich F
    J Microsc; 2009 Jul; 235(1):59-66. PubMed ID: 19566627
    [TBL] [Abstract][Full Text] [Related]  

  • 9. Imaging thin films of nanoporous low-k dielectrics: comparison between ultramicrotomy and focused ion beam preparations for transmission electron microscopy.
    Thompson LE; Rice PM; Delenia E; Lee VY; Brock PJ; Magbitang TP; Dubois G; Volksen W; Miller RD; Kim HC
    Microsc Microanal; 2006 Apr; 12(2):156-9. PubMed ID: 17481352
    [TBL] [Abstract][Full Text] [Related]  

  • 10. Preparation of combinatorial arrays of polymer thin films for transmission electron microscopy analysis.
    Roskov KE; Epps TH; Berry BC; Hudson SD; Tureau MS; Fasolka MJ
    J Comb Chem; 2008; 10(6):966-73. PubMed ID: 18937515
    [TBL] [Abstract][Full Text] [Related]  

  • 11. High contrast hollow-cone dark field transmission electron microscopy for nanocrystalline grain size quantification.
    Yao B; Sun T; Warren A; Heinrich H; Barmak K; Coffey KR
    Micron; 2010 Apr; 41(3):177-82. PubMed ID: 20018512
    [TBL] [Abstract][Full Text] [Related]  

  • 12. A high-throughput approach for cross-sectional transmission electron microscopy sample preparation of thin films.
    Yao B; Coffey KR
    J Electron Microsc (Tokyo); 2008 Dec; 57(6):189-94. PubMed ID: 18984643
    [TBL] [Abstract][Full Text] [Related]  

  • 13. TEM based high resolution and low-dose scanning electron nanodiffraction technique for nanostructure imaging and analysis.
    Kim KH; Xing H; Zuo JM; Zhang P; Wang H
    Micron; 2015 Apr; 71():39-45. PubMed ID: 25666056
    [TBL] [Abstract][Full Text] [Related]  

  • 14. Sample preparation for atomic-resolution STEM at low voltages by FIB.
    Schaffer M; Schaffer B; Ramasse Q
    Ultramicroscopy; 2012 Mar; 114():62-71. PubMed ID: 22356790
    [TBL] [Abstract][Full Text] [Related]  

  • 15. Fast and simple specimen preparation for TEM studies of oxide films deposited on silicon wafers.
    Teodorescu VS; Blanchin MG
    Microsc Microanal; 2009 Feb; 15(1):15-9. PubMed ID: 19144253
    [TBL] [Abstract][Full Text] [Related]  

  • 16. Plan view TEM sample preparation for non-continuous and delaminating thin films.
    Weaver L
    Microsc Res Tech; 1997 Mar; 36(5):378-9. PubMed ID: 9140938
    [TBL] [Abstract][Full Text] [Related]  

  • 17. Technique for preparation and characterization in cross-section of oral titanium implant surfaces using focused ion beam and transmission electron microscopy.
    Jarmar T; Palmquist A; Brånemark R; Hermansson L; Engqvist H; Thomsen P
    J Biomed Mater Res A; 2008 Dec; 87(4):1003-9. PubMed ID: 18257067
    [TBL] [Abstract][Full Text] [Related]  

  • 18. Electrochemical preparation and structural characterization of Co thin films and their anomalous IR properties.
    Chen QS; Sun SG; Yan JW; Li JT; Zhou ZY
    Langmuir; 2006 Dec; 22(25):10575-83. PubMed ID: 17129032
    [TBL] [Abstract][Full Text] [Related]  

  • 19. In situ TEM observation of magnetic materials.
    Tanase M; Petford-Long AK
    Microsc Res Tech; 2009 Mar; 72(3):187-96. PubMed ID: 19165741
    [TBL] [Abstract][Full Text] [Related]  

  • 20. Structural evolution of nanocrystalline silicon thin films synthesized in high-density, low-temperature reactive plasmas.
    Cheng Q; Xu S; Ostrikov KK
    Nanotechnology; 2009 May; 20(21):215606. PubMed ID: 19423937
    [TBL] [Abstract][Full Text] [Related]  

    [Next]    [New Search]
    of 11.