These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.


BIOMARKERS

Molecular Biopsy of Human Tumors

- a resource for Precision Medicine *

79 related articles for article (PubMed ID: 22129018)

  • 1. Note: vibration reduction control of an atomic force microscope using an additional cantilever.
    Kim C; Jung J; Park K
    Rev Sci Instrum; 2011 Nov; 82(11):116102. PubMed ID: 22129018
    [TBL] [Abstract][Full Text] [Related]  

  • 2. Atomic force microscope cantilever spring constant evaluation for higher mode oscillations: a kinetostatic method.
    Tseytlin YM
    Rev Sci Instrum; 2008 Feb; 79(2 Pt 1):025102. PubMed ID: 18315324
    [TBL] [Abstract][Full Text] [Related]  

  • 3. Coupled lateral bending-torsional vibration sensitivity of atomic force microscope cantilever.
    Lee HL; Chang WJ
    Ultramicroscopy; 2008 Jul; 108(8):707-11. PubMed ID: 18054438
    [TBL] [Abstract][Full Text] [Related]  

  • 4. Atomic force microscope infrared spectroscopy on 15 nm scale polymer nanostructures.
    Felts JR; Cho H; Yu MF; Bergman LA; Vakakis AF; King WP
    Rev Sci Instrum; 2013 Feb; 84(2):023709. PubMed ID: 23464220
    [TBL] [Abstract][Full Text] [Related]  

  • 5. Fano-like resonance in an optically driven atomic force microscope cantilever.
    Kadri S; Fujiwara H; Sasaki K
    Opt Express; 2011 Jan; 19(3):2317-24. PubMed ID: 21369050
    [TBL] [Abstract][Full Text] [Related]  

  • 6. Reconstruction of a scanned topographic image distorted by the creep effect of a Z scanner in atomic force microscopy.
    Han C; Chung CC
    Rev Sci Instrum; 2011 May; 82(5):053709. PubMed ID: 21639509
    [TBL] [Abstract][Full Text] [Related]  

  • 7. Suppression of spurious vibration of cantilever in atomic force microscopy by enhancement of bending rigidity of cantilever chip substrate.
    Tsuji T; Kobari K; Ide S; Yamanaka K
    Rev Sci Instrum; 2007 Oct; 78(10):103703. PubMed ID: 17979424
    [TBL] [Abstract][Full Text] [Related]  

  • 8. Direct measurement of tapping force with a cantilever deflection force sensor.
    Su C; Huang L; Kjoller K
    Ultramicroscopy; 2004 Aug; 100(3-4):233-9. PubMed ID: 15231315
    [TBL] [Abstract][Full Text] [Related]  

  • 9. Note: anti-strong-disturbance signal processing method of vortex flowmeter with two sensors.
    Xu KJ; Luo QL; Fang M; Wang G; Liu SS; Kang YB; Shi L
    Rev Sci Instrum; 2011 Sep; 82(9):096105. PubMed ID: 21974632
    [TBL] [Abstract][Full Text] [Related]  

  • 10. Advanced tip design for liquid phase vibration mode atomic force microscopy.
    Muramatsu H; Yamamoto Y; Shigeno M; Shirakawabe Y; Inoue A; Kim WS; Kim SJ; Chang SM; Kim JM
    Anal Chim Acta; 2008 Mar; 611(2):233-8. PubMed ID: 18328326
    [TBL] [Abstract][Full Text] [Related]  

  • 11. Resonant control of an atomic force microscope micro-cantilever for active Q control.
    Fairbairn M; Moheimani SO
    Rev Sci Instrum; 2012 Aug; 83(8):083708. PubMed ID: 22938304
    [TBL] [Abstract][Full Text] [Related]  

  • 12. Magnetic force driven six degree-of-freedom active vibration isolation system using a phase compensated velocity sensor.
    Kim Y; Kim S; Park K
    Rev Sci Instrum; 2009 Apr; 80(4):045108. PubMed ID: 19405692
    [TBL] [Abstract][Full Text] [Related]  

  • 13. A new model for investigating the flexural vibration of an atomic force microscope cantilever.
    Abbasi M; Karami Mohammadi A
    Ultramicroscopy; 2010 Oct; 110(11):1374-9. PubMed ID: 20702041
    [TBL] [Abstract][Full Text] [Related]  

  • 14. Vibration amplitude of a tip-loaded quartz tuning fork during shear force microscopy scanning.
    Sandoz P; Friedt JM; Carry E
    Rev Sci Instrum; 2008 Aug; 79(8):086102. PubMed ID: 19044383
    [TBL] [Abstract][Full Text] [Related]  

  • 15. Topography imaging with a heated atomic force microscope cantilever in tapping mode.
    Park K; Lee J; Zhang ZM; King WP
    Rev Sci Instrum; 2007 Apr; 78(4):043709. PubMed ID: 17477672
    [TBL] [Abstract][Full Text] [Related]  

  • 16. Atomic-force-microscope-compatible near-field scanning microwave microscope with separated excitation and sensing probes.
    Lai K; Ji MB; Leindecker N; Kelly MA; Shen ZX
    Rev Sci Instrum; 2007 Jun; 78(6):063702. PubMed ID: 17614611
    [TBL] [Abstract][Full Text] [Related]  

  • 17. Calibration of lateral force measurements in atomic force microscopy with a piezoresistive force sensor.
    Xie H; Vitard J; Haliyo S; Régnier S; Boukallel M
    Rev Sci Instrum; 2008 Mar; 79(3):033708. PubMed ID: 18377016
    [TBL] [Abstract][Full Text] [Related]  

  • 18. Atomic force microscopy with inherent disturbance suppression for nanostructure imaging.
    Sparks AW; Manalis SR
    Nanotechnology; 2006 Mar; 17(6):1574-9. PubMed ID: 26558561
    [TBL] [Abstract][Full Text] [Related]  

  • 19. Study of sensitivity and noise in the piezoelectric self-sensing and self-actuating cantilever with an integrated Wheatstone bridge circuit.
    Shin C; Jeon I; Khim ZG; Hong JW; Nam H
    Rev Sci Instrum; 2010 Mar; 81(3):035109. PubMed ID: 20370215
    [TBL] [Abstract][Full Text] [Related]  

  • 20. Feedback based simultaneous correction of imaging artifacts due to geometrical and mechanical cross-talk and tip-sample stick in atomic force microscopy.
    Shegaonkar AC; Salapaka SM
    Rev Sci Instrum; 2007 Oct; 78(10):103706. PubMed ID: 17979427
    [TBL] [Abstract][Full Text] [Related]  

    [Next]    [New Search]
    of 4.