164 related articles for article (PubMed ID: 22188906)
1. Aberrations of the cathode objective lens up to fifth order.
Tromp RM; Wan W; Schramm SM
Ultramicroscopy; 2012 Aug; 119():33-9. PubMed ID: 22188906
[TBL] [Abstract][Full Text] [Related]
2. A new aberration-corrected, energy-filtered LEEM/PEEM instrument. I. Principles and design.
Tromp RM; Hannon JB; Ellis AW; Wan W; Berghaus A; Schaff O
Ultramicroscopy; 2010 Jun; 110(7):852-61. PubMed ID: 20395048
[TBL] [Abstract][Full Text] [Related]
3. Measuring and correcting aberrations of a cathode objective lens.
Tromp RM
Ultramicroscopy; 2011 Mar; 111(4):273-81. PubMed ID: 21353153
[TBL] [Abstract][Full Text] [Related]
4. A Contrast Transfer Function approach for image calculations in standard and aberration-corrected LEEM and PEEM.
Schramm SM; Pang AB; Altman MS; Tromp RM
Ultramicroscopy; 2012 Apr; 115():88-108. PubMed ID: 22209472
[TBL] [Abstract][Full Text] [Related]
5. A new aberration-corrected, energy-filtered LEEM/PEEM instrument II. Operation and results.
Tromp RM; Hannon JB; Wan W; Berghaus A; Schaff O
Ultramicroscopy; 2013 Apr; 127():25-39. PubMed ID: 22925736
[TBL] [Abstract][Full Text] [Related]
6. On the importance of fifth-order spherical aberration for a fully corrected electron microscope.
Chang LY; Kirkland AI; Titchmarsh JM
Ultramicroscopy; 2006 Mar; 106(4-5):301-6. PubMed ID: 16309838
[TBL] [Abstract][Full Text] [Related]
7. Catadioptric aberration correction in cathode lens microscopy.
Tromp RM
Ultramicroscopy; 2015 Apr; 151():191-198. PubMed ID: 25458190
[TBL] [Abstract][Full Text] [Related]
8. Characterization of the cathode objective lens by Real-Space Microspot Low Energy Electron Diffraction.
Tromp RM
Ultramicroscopy; 2013 Jul; 130():2-6. PubMed ID: 23510571
[TBL] [Abstract][Full Text] [Related]
9. Chicago aberration correction work.
Beck VD
Ultramicroscopy; 2012 Dec; 123():22-7. PubMed ID: 22795625
[TBL] [Abstract][Full Text] [Related]
10. Progress toward an aberration-corrected low energy electron microscope for DNA sequencing and surface analysis.
Mankos M; Shadman K; N'diaye AT; Schmid AK; Persson HH; Davis RW
J Vac Sci Technol B Nanotechnol Microelectron; 2012 Nov; 30(6):6F402. PubMed ID: 23847748
[TBL] [Abstract][Full Text] [Related]
11. Measuring chromatic aberration in LEEM/PEEM.
Tromp RM
Ultramicroscopy; 2019 Apr; 199():46-49. PubMed ID: 30772717
[TBL] [Abstract][Full Text] [Related]
12. Aberration-corrected STEM/TEM imaging at 15kV.
Sasaki T; Sawada H; Hosokawa F; Sato Y; Suenaga K
Ultramicroscopy; 2014 Oct; 145():50-5. PubMed ID: 24842229
[TBL] [Abstract][Full Text] [Related]
13. Current and future aberration correctors for the improvement of resolution in electron microscopy.
Haider M; Hartel P; Müller H; Uhlemann S; Zach J
Philos Trans A Math Phys Eng Sci; 2009 Sep; 367(1903):3665-82. PubMed ID: 19687059
[TBL] [Abstract][Full Text] [Related]
14. The objective lens of the electron microscope with correction of spherical and axial chromatic aberrations.
Bimurzaev SB; Aldiyarov NU; Yakushev EM
Microscopy (Oxf); 2017 Oct; 66(5):356-365. PubMed ID: 29016920
[TBL] [Abstract][Full Text] [Related]
15. Aberrations in asymmetrical electron lenses.
Fitzgerald JP; Word RC; Könenkamp R
Ultramicroscopy; 2012 Aug; 119():40-4. PubMed ID: 22206603
[TBL] [Abstract][Full Text] [Related]
16. Fourier optics of image formation in LEEM.
Pang AB; Müller T; Altman MS; Bauer E
J Phys Condens Matter; 2009 Aug; 21(31):314006. PubMed ID: 21828567
[TBL] [Abstract][Full Text] [Related]
17. Selected-area diffraction and spectroscopy in LEEM and PEEM.
Tromp RM
Ultramicroscopy; 2012 Sep; 120():73-7. PubMed ID: 22842113
[TBL] [Abstract][Full Text] [Related]
18. Future trends in aberration-corrected electron microscopy.
Rose HH
Philos Trans A Math Phys Eng Sci; 2009 Sep; 367(1903):3809-23. PubMed ID: 19687067
[TBL] [Abstract][Full Text] [Related]
19. Tuning fifth-order aberrations in a quadrupole-octupole corrector.
Lupini AR; Pennycook SJ
Microsc Microanal; 2012 Aug; 18(4):699-704. PubMed ID: 22846922
[TBL] [Abstract][Full Text] [Related]
20. Design of an aberration corrected low-voltage SEM.
van Aken RH; Maas DJ; Hagen CW; Barth JE; Kruit P
Ultramicroscopy; 2010 Oct; 110(11):1411-9. PubMed ID: 20728276
[TBL] [Abstract][Full Text] [Related]
[Next] [New Search]