These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.


BIOMARKERS

Molecular Biopsy of Human Tumors

- a resource for Precision Medicine *

159 related articles for article (PubMed ID: 22188906)

  • 1. Aberrations of the cathode objective lens up to fifth order.
    Tromp RM; Wan W; Schramm SM
    Ultramicroscopy; 2012 Aug; 119():33-9. PubMed ID: 22188906
    [TBL] [Abstract][Full Text] [Related]  

  • 2. A new aberration-corrected, energy-filtered LEEM/PEEM instrument. I. Principles and design.
    Tromp RM; Hannon JB; Ellis AW; Wan W; Berghaus A; Schaff O
    Ultramicroscopy; 2010 Jun; 110(7):852-61. PubMed ID: 20395048
    [TBL] [Abstract][Full Text] [Related]  

  • 3. Measuring and correcting aberrations of a cathode objective lens.
    Tromp RM
    Ultramicroscopy; 2011 Mar; 111(4):273-81. PubMed ID: 21353153
    [TBL] [Abstract][Full Text] [Related]  

  • 4. A Contrast Transfer Function approach for image calculations in standard and aberration-corrected LEEM and PEEM.
    Schramm SM; Pang AB; Altman MS; Tromp RM
    Ultramicroscopy; 2012 Apr; 115():88-108. PubMed ID: 22209472
    [TBL] [Abstract][Full Text] [Related]  

  • 5. A new aberration-corrected, energy-filtered LEEM/PEEM instrument II. Operation and results.
    Tromp RM; Hannon JB; Wan W; Berghaus A; Schaff O
    Ultramicroscopy; 2013 Apr; 127():25-39. PubMed ID: 22925736
    [TBL] [Abstract][Full Text] [Related]  

  • 6. On the importance of fifth-order spherical aberration for a fully corrected electron microscope.
    Chang LY; Kirkland AI; Titchmarsh JM
    Ultramicroscopy; 2006 Mar; 106(4-5):301-6. PubMed ID: 16309838
    [TBL] [Abstract][Full Text] [Related]  

  • 7. Catadioptric aberration correction in cathode lens microscopy.
    Tromp RM
    Ultramicroscopy; 2015 Apr; 151():191-198. PubMed ID: 25458190
    [TBL] [Abstract][Full Text] [Related]  

  • 8. Characterization of the cathode objective lens by Real-Space Microspot Low Energy Electron Diffraction.
    Tromp RM
    Ultramicroscopy; 2013 Jul; 130():2-6. PubMed ID: 23510571
    [TBL] [Abstract][Full Text] [Related]  

  • 9. Chicago aberration correction work.
    Beck VD
    Ultramicroscopy; 2012 Dec; 123():22-7. PubMed ID: 22795625
    [TBL] [Abstract][Full Text] [Related]  

  • 10. Progress toward an aberration-corrected low energy electron microscope for DNA sequencing and surface analysis.
    Mankos M; Shadman K; N'diaye AT; Schmid AK; Persson HH; Davis RW
    J Vac Sci Technol B Nanotechnol Microelectron; 2012 Nov; 30(6):6F402. PubMed ID: 23847748
    [TBL] [Abstract][Full Text] [Related]  

  • 11. Measuring chromatic aberration in LEEM/PEEM.
    Tromp RM
    Ultramicroscopy; 2019 Apr; 199():46-49. PubMed ID: 30772717
    [TBL] [Abstract][Full Text] [Related]  

  • 12. Aberration-corrected STEM/TEM imaging at 15kV.
    Sasaki T; Sawada H; Hosokawa F; Sato Y; Suenaga K
    Ultramicroscopy; 2014 Oct; 145():50-5. PubMed ID: 24842229
    [TBL] [Abstract][Full Text] [Related]  

  • 13. Current and future aberration correctors for the improvement of resolution in electron microscopy.
    Haider M; Hartel P; Müller H; Uhlemann S; Zach J
    Philos Trans A Math Phys Eng Sci; 2009 Sep; 367(1903):3665-82. PubMed ID: 19687059
    [TBL] [Abstract][Full Text] [Related]  

  • 14. The objective lens of the electron microscope with correction of spherical and axial chromatic aberrations.
    Bimurzaev SB; Aldiyarov NU; Yakushev EM
    Microscopy (Oxf); 2017 Oct; 66(5):356-365. PubMed ID: 29016920
    [TBL] [Abstract][Full Text] [Related]  

  • 15. Aberrations in asymmetrical electron lenses.
    Fitzgerald JP; Word RC; Könenkamp R
    Ultramicroscopy; 2012 Aug; 119():40-4. PubMed ID: 22206603
    [TBL] [Abstract][Full Text] [Related]  

  • 16. Fourier optics of image formation in LEEM.
    Pang AB; Müller T; Altman MS; Bauer E
    J Phys Condens Matter; 2009 Aug; 21(31):314006. PubMed ID: 21828567
    [TBL] [Abstract][Full Text] [Related]  

  • 17. Selected-area diffraction and spectroscopy in LEEM and PEEM.
    Tromp RM
    Ultramicroscopy; 2012 Sep; 120():73-7. PubMed ID: 22842113
    [TBL] [Abstract][Full Text] [Related]  

  • 18. Future trends in aberration-corrected electron microscopy.
    Rose HH
    Philos Trans A Math Phys Eng Sci; 2009 Sep; 367(1903):3809-23. PubMed ID: 19687067
    [TBL] [Abstract][Full Text] [Related]  

  • 19. Tuning fifth-order aberrations in a quadrupole-octupole corrector.
    Lupini AR; Pennycook SJ
    Microsc Microanal; 2012 Aug; 18(4):699-704. PubMed ID: 22846922
    [TBL] [Abstract][Full Text] [Related]  

  • 20. Design of an aberration corrected low-voltage SEM.
    van Aken RH; Maas DJ; Hagen CW; Barth JE; Kruit P
    Ultramicroscopy; 2010 Oct; 110(11):1411-9. PubMed ID: 20728276
    [TBL] [Abstract][Full Text] [Related]  

    [Next]    [New Search]
    of 8.