These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.
261 related articles for article (PubMed ID: 22215571)
1. Strongly reduced fragmentation and soft emission processes in sputtered ion formation from amino acid films under large Ar(n)+ (n ≤ 2200) cluster ion bombardment. Gnaser H; Ichiki K; Matsuo J Rapid Commun Mass Spectrom; 2012 Jan; 26(1):1-8. PubMed ID: 22215571 [TBL] [Abstract][Full Text] [Related]
2. Peptide dissociation patterns in secondary ion mass spectrometry under large argon cluster ion bombardment. Gnaser H; Fujii M; Nakagawa S; Seki T; Aoki T; Matsuo J Rapid Commun Mass Spectrom; 2013 Jul; 27(13):1490-6. PubMed ID: 23722683 [TBL] [Abstract][Full Text] [Related]
3. Soft-sputtering of insulin films in argon-cluster secondary ion mass spectrometry. Oshima S; Kashihara I; Moritani K; Inui N; Mochiji K Rapid Commun Mass Spectrom; 2011 Apr; 25(8):1070-4. PubMed ID: 21452384 [TBL] [Abstract][Full Text] [Related]
4. TOF-SIMS with argon gas cluster ion beams: a comparison with C60+. Rabbani S; Barber AM; Fletcher JS; Lockyer NP; Vickerman JC Anal Chem; 2011 May; 83(10):3793-800. PubMed ID: 21462969 [TBL] [Abstract][Full Text] [Related]
5. Precise and fast secondary ion mass spectrometry depth profiling of polymer materials with large Ar cluster ion beams. Ninomiya S; Ichiki K; Yamada H; Nakata Y; Seki T; Aoki T; Matsuo J Rapid Commun Mass Spectrom; 2009 Jun; 23(11):1601-6. PubMed ID: 19399762 [TBL] [Abstract][Full Text] [Related]
6. Study on the detection limits of a new argon gas cluster ion beam secondary ion mass spectrometry apparatus using lipid compound samples. Fujii M; Nakagawa S; Matsuda K; Man N; Seki T; Aoki T; Matsuo J Rapid Commun Mass Spectrom; 2014 Apr; 28(8):917-20. PubMed ID: 24623696 [TBL] [Abstract][Full Text] [Related]
7. Peptide fragmentation caused by Ar cluster ions depending on primary ion energy. Aoyagi S; Kawashima T; Yokoyama Y Rapid Commun Mass Spectrom; 2015 Sep; 29(18):1687-95. PubMed ID: 26467120 [TBL] [Abstract][Full Text] [Related]
8. Enhancing ion yields in time-of-flight-secondary ion mass spectrometry: a comparative study of argon and water cluster primary beams. Sheraz née Rabbani S; Razo IB; Kohn T; Lockyer NP; Vickerman JC Anal Chem; 2015 Feb; 87(4):2367-74. PubMed ID: 25588151 [TBL] [Abstract][Full Text] [Related]
9. Orthogonal time-of-flight secondary ion mass spectrometric analysis of peptides using large gold clusters as primary ions. Tempez A; Schultz JA; Della-Negra S; Depauw J; Jacquet D; Novikov A; Lebeyec Y; Pautrat M; Caroff M; Ugarov M; Bensaoula H; Gonin M; Fuhrer K; Woods A Rapid Commun Mass Spectrom; 2004; 18(4):371-6. PubMed ID: 14966842 [TBL] [Abstract][Full Text] [Related]
10. Molecular depth profiling of multilayer structures of organic semiconductor materials by secondary ion mass spectrometry with large argon cluster ion beams. Ninomiya S; Ichiki K; Yamada H; Nakata Y; Seki T; Aoki T; Matsuo J Rapid Commun Mass Spectrom; 2009 Oct; 23(20):3264-8. PubMed ID: 19757450 [TBL] [Abstract][Full Text] [Related]
11. Organic depth profiling of a nanostructured delta layer reference material using large argon cluster ions. Lee JL; Ninomiya S; Matsuo J; Gilmore IS; Seah MP; Shard AG Anal Chem; 2010 Jan; 82(1):98-105. PubMed ID: 19957960 [TBL] [Abstract][Full Text] [Related]
12. Is proton cationization promoted by polyatomic primary ion bombardment during time-of-flight secondary ion mass spectrometry analysis of frozen aqueous solutions? Conlan XA; Lockyer NP; Vickerman JC Rapid Commun Mass Spectrom; 2006; 20(8):1327-34. PubMed ID: 16555365 [TBL] [Abstract][Full Text] [Related]
13. Enhanced surface sensitivity in secondary ion mass spectrometric analysis of organic thin films using size-selected Ar gas-cluster ion projectiles. Tanaka M; Moritani K; Hirota T; Toyoda N; Yamada I; Inui N; Mochiji K Rapid Commun Mass Spectrom; 2010 May; 24(10):1405-10. PubMed ID: 20411579 [TBL] [Abstract][Full Text] [Related]
15. Matrix-free detection of intact ions from proteins in argon-cluster secondary ion mass spectrometry. Mochiji K; Hashinokuchi M; Moritani K; Toyoda N Rapid Commun Mass Spectrom; 2009 Mar; 23(5):648-52. PubMed ID: 19173223 [TBL] [Abstract][Full Text] [Related]
16. Parallel detection, quantification, and depth profiling of peptides with dynamic-secondary ion mass spectrometry (D-SIMS) ionized by C60(+)-Ar(+) co-sputtering. Chang CJ; Chang HY; You YW; Liao HY; Kuo YT; Kao WL; Yen GJ; Tsai MH; Shyue JJ Anal Chim Acta; 2012 Mar; 718():64-9. PubMed ID: 22305899 [TBL] [Abstract][Full Text] [Related]
17. Carbon-13 labeled polymers: an alternative tracer for depth profiling of polymer films and multilayers using secondary ion mass spectrometry. Harton SE; Stevie FA; Zhu Z; Ade H Anal Chem; 2006 May; 78(10):3452-60. PubMed ID: 16689549 [TBL] [Abstract][Full Text] [Related]
18. Ionization of large homogeneous and heterogeneous clusters generated in acetylene-Ar expansions: cluster ion polymerization. Kočišek J; Lengyel J; Fárník M J Chem Phys; 2013 Mar; 138(12):124306. PubMed ID: 23556722 [TBL] [Abstract][Full Text] [Related]
19. Sputtering of C(60) fullerenes physisorbed on Ar, Xe, H(2)O, O(2), and C(8)F(18) matrix films studied with time-of-flight secondary ion mass spectrometry. Souda R J Phys Chem A; 2007 Jan; 111(2):201-5. PubMed ID: 17214454 [TBL] [Abstract][Full Text] [Related]
20. Dissociation study of tellurium cluster ions, Te(n)(+) (n = 25-85) using secondary ion mass spectrometry. Ito H; Matsuo T; Sato T; Ichiharai T; Katakuse I J Mass Spectrom; 2000 Feb; 35(2):168-71. PubMed ID: 10679977 [TBL] [Abstract][Full Text] [Related] [Next] [New Search]