These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.


BIOMARKERS

Molecular Biopsy of Human Tumors

- a resource for Precision Medicine *

102 related articles for article (PubMed ID: 22344069)

  • 1. Determination of layer thickness and optical constants of thin films by using a modified pattern search method.
    Miloua R; Kebbab Z; Chiker F; Sahraoui K; Khadraoui M; Benramdane N
    Opt Lett; 2012 Feb; 37(4):449-51. PubMed ID: 22344069
    [TBL] [Abstract][Full Text] [Related]  

  • 2. Determination of the fundamental absorption and optical bandgap of dielectric thin films from single optical transmittance measurements.
    Tejada A; Montañez L; Torres C; Llontop P; Flores L; De Zela F; Winnacker A; Guerra JA
    Appl Opt; 2019 Dec; 58(35):9585-9594. PubMed ID: 31873557
    [TBL] [Abstract][Full Text] [Related]  

  • 3. Simultaneous determination of the optical constants and thickness of very thin films by using soft-x-ray reflectance measurements.
    Cao J; Yanagihara M; Yamamoto M; Goto Y; Namioka T
    Appl Opt; 1994 Apr; 33(10):2013-7. PubMed ID: 20885537
    [TBL] [Abstract][Full Text] [Related]  

  • 4. [Determination of optical parameters in thin films by transmittance spectra].
    Wang K; Jia HZ; Xia GZ
    Guang Pu Xue Yu Guang Pu Fen Xi; 2008 Nov; 28(11):2713-6. PubMed ID: 19271525
    [TBL] [Abstract][Full Text] [Related]  

  • 5. Determination of the optical constants (n, k) of thin dielectric films.
    Khawaja EE; Bouamrane F
    Appl Opt; 1993 Mar; 32(7):1168-72. PubMed ID: 20820248
    [TBL] [Abstract][Full Text] [Related]  

  • 6. Method for the determination of optical constants of thin films: dependence on experimental uncertainties.
    Del Pozo JM; Díaz L
    Appl Opt; 1992 Aug; 31(22):4474-81. PubMed ID: 20725444
    [TBL] [Abstract][Full Text] [Related]  

  • 7. Optical measurement of the refractive index, layer thickness, and volume changes of thin films.
    Holtslag AH; Scholte PM
    Appl Opt; 1989 Dec; 28(23):5095-104. PubMed ID: 20556006
    [TBL] [Abstract][Full Text] [Related]  

  • 8. Determination of optical constants of absorbing materials using transmission and reflection of thin films on partially metallized substrates: analysis of the new (T,R(m)) technique.
    Hjortsberg A
    Appl Opt; 1981 Apr; 20(7):1254-63. PubMed ID: 20309294
    [TBL] [Abstract][Full Text] [Related]  

  • 9. Determination of optical parameters and thickness of weakly absorbing thin films from reflectance and transmittance spectra.
    Kutavichus VP; Filippov VV; Huzouski VH
    Appl Opt; 2006 Jul; 45(19):4547-53. PubMed ID: 16799663
    [TBL] [Abstract][Full Text] [Related]  

  • 10. Determination of spatial distributions of thickness and optical constants of thin films by a new optical technique.
    Mishima T; Kao KC
    Appl Opt; 1981 Nov; 20(21):3719-22. PubMed ID: 20372251
    [TBL] [Abstract][Full Text] [Related]  

  • 11. Improvement of phase stability and accurate determination of optical constants of SnO thin films by using Al2O3 capping layer.
    Liang LY; Liu ZM; Cao HT; Shi YY; Sun XL; Yu Z; Chen AH; Zhang HZ; Fang YQ
    ACS Appl Mater Interfaces; 2010 Jun; 2(6):1565-8. PubMed ID: 20496870
    [TBL] [Abstract][Full Text] [Related]  

  • 12. Jump method for optical thin film design.
    Li L; Wang QH; Li DH; Peng HR
    Opt Express; 2009 Sep; 17(19):16920-6. PubMed ID: 19770909
    [TBL] [Abstract][Full Text] [Related]  

  • 13. Exploitation of multiple incidences spectrometric measurements for thin film reverse engineering.
    Gao L; Lemarchand F; Lequime M
    Opt Express; 2012 Jul; 20(14):15734-51. PubMed ID: 22772265
    [TBL] [Abstract][Full Text] [Related]  

  • 14. Thickness dispersion of surface plasmon of Ag nano-thin films: determination by ellipsometry iterated with transmittance method.
    Gong J; Dai R; Wang Z; Zhang Z
    Sci Rep; 2015 Mar; 5():9279. PubMed ID: 25797217
    [TBL] [Abstract][Full Text] [Related]  

  • 15. Automatic determination of the optical constants of inhomogeneous thin films.
    Borgogno JP; Lazarides B; Pelletier E
    Appl Opt; 1982 Nov; 21(22):4020-9. PubMed ID: 20401002
    [TBL] [Abstract][Full Text] [Related]  

  • 16. General approach to reliable characterization of thin metal films.
    Amotchkina TV; Janicki V; Sancho-Parramon J; Tikhonravov AV; Trubetskov MK; Zorc H
    Appl Opt; 2011 Apr; 50(10):1453-64. PubMed ID: 21460914
    [TBL] [Abstract][Full Text] [Related]  

  • 17. Optical methods for thickness measurements on thin metal films.
    Pokrowsky P
    Appl Opt; 1991 Aug; 30(22):3228-32. PubMed ID: 20706379
    [TBL] [Abstract][Full Text] [Related]  

  • 18. Optimization of interference filters with genetic algorithms applied to silver-based heat mirrors.
    Eisenhammer T; Lazarov M; Leutbecher M; Schöffel U; Sizmann R
    Appl Opt; 1993 Nov; 32(31):6310-5. PubMed ID: 20856467
    [TBL] [Abstract][Full Text] [Related]  

  • 19. Optical constants for thin films of C, diamond, Al, Si, and CVD SIC from 24 A to 1216 A.
    Windt DL; Cash WC; Scott M; Arendt P; Newnam B; Fisher RF; Swartzlander AB; Takacs PZ; Pinneo JM
    Appl Opt; 1988 Jan; 27(2):279-95. PubMed ID: 20523588
    [TBL] [Abstract][Full Text] [Related]  

  • 20. New approach to optical analysis of absorbing thin solid films.
    Demichelis F; Kaniadakis G; Tagliaferro A; Tresso E
    Appl Opt; 1987 May; 26(9):1737-40. PubMed ID: 20454398
    [TBL] [Abstract][Full Text] [Related]  

    [Next]    [New Search]
    of 6.