These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.


BIOMARKERS

Molecular Biopsy of Human Tumors

- a resource for Precision Medicine *

109 related articles for article (PubMed ID: 22380345)

  • 1. Rhenium ion beam for implantation into semiconductors.
    Kulevoy TV; Gerasimenko NN; Seleznev DN; Fedorov PA; Temirov AA; Alyoshin ME; Kraevsky SV; Smirnov DI; Yakushin PE; Khoroshilov VV
    Rev Sci Instrum; 2012 Feb; 83(2):02B913. PubMed ID: 22380345
    [TBL] [Abstract][Full Text] [Related]  

  • 2. ITEP MEVVA ion beam for rhenium silicide production.
    Kulevoy T; Gerasimenko N; Seleznev D; Kropachev G; Kozlov A; Kuibeda R; Yakushin P; Petrenko S; Medetov N; Zaporozhan O
    Rev Sci Instrum; 2010 Feb; 81(2):02B905. PubMed ID: 20192471
    [TBL] [Abstract][Full Text] [Related]  

  • 3. Upgraded vacuum arc ion source for metal ion implantation.
    Nikolaev AG; Oks EM; Savkin KP; Yushkov GY; Brown IG
    Rev Sci Instrum; 2012 Feb; 83(2):02A501. PubMed ID: 22380197
    [TBL] [Abstract][Full Text] [Related]  

  • 4. Carborane beam from ITEP Bernas ion source for semiconductor implanters.
    Seleznev D; Kropachev G; Kozlov A; Kuibeda R; Koshelev V; Kulevoy T; Hershcovitch A; Jonson B; Poole J; Alexeyenko O; Gurkova E; Oks E; Gushenets V; Polozov S; Masunov E
    Rev Sci Instrum; 2010 Feb; 81(2):02B901. PubMed ID: 20192467
    [TBL] [Abstract][Full Text] [Related]  

  • 5. Bernas ion source discharge simulation.
    Roudskoy I; Kulevoy TV; Petrenko SV; Kuibeda RP; Seleznev DN; Pershin VI; Hershcovitch A; Johnson BM; Gushenets VI; Oks EM; Poole HP
    Rev Sci Instrum; 2008 Feb; 79(2 Pt 2):02B313. PubMed ID: 18315179
    [TBL] [Abstract][Full Text] [Related]  

  • 6. Pseudo ribbon metal ion beam source.
    Stepanov IB; Ryabchikov AI; Sivin DO; Verigin DA
    Rev Sci Instrum; 2014 Feb; 85(2):02C104. PubMed ID: 24593634
    [TBL] [Abstract][Full Text] [Related]  

  • 7. Recent developments in nanofabrication using ion projection lithography.
    Tseng AA
    Small; 2005 Jun; 1(6):594-608. PubMed ID: 17193492
    [TBL] [Abstract][Full Text] [Related]  

  • 8. Generation of multicomponent ion beams by a vacuum arc ion source with compound cathode.
    Savkin KP; Yushkov YG; Nikolaev AG; Oks EM; Yushkov GY
    Rev Sci Instrum; 2010 Feb; 81(2):02A501. PubMed ID: 20192356
    [TBL] [Abstract][Full Text] [Related]  

  • 9. The effects of the focus ion beam milling process on the optical properties of semiconductor nanostructures.
    Bellini E; Taurino A; Catalano M; Lomascolo M; Passaseo A; Vasanelli L
    Nanotechnology; 2009 Jun; 20(25):255306. PubMed ID: 19487808
    [TBL] [Abstract][Full Text] [Related]  

  • 10. Status of ITEP decaborane ion source program.
    Kulevoy TV; Petrenko SV; Kuibeda RP; Seleznev DN; Koshelev VA; Kozlov AV; Stasevich YB; Sitnikov AL; Shamailov IM; Pershin VI; Hershcovitch A; Johnson BM; Gushenets VI; Oks EM; Poole HP; Masunov ES; Polozov SM
    Rev Sci Instrum; 2008 Feb; 79(2 Pt 2):02C501. PubMed ID: 18315244
    [TBL] [Abstract][Full Text] [Related]  

  • 11. Performance of an inverted ion source.
    Salvadori MC; Teixeira FS; Sgubin LG; Araujo WW; Spirin RE; Oks EM; Brown IG
    Rev Sci Instrum; 2013 Feb; 84(2):023506. PubMed ID: 23464210
    [TBL] [Abstract][Full Text] [Related]  

  • 12. An ultra-low energy (30-200 eV) ion-atomic beam source for ion-beam-assisted deposition in ultrahigh vacuum.
    Mach J; Samoril T; Voborný S; Kolíbal M; Zlámal J; Spousta J; Dittrichová L; Sikola T
    Rev Sci Instrum; 2011 Aug; 82(8):083302. PubMed ID: 21895238
    [TBL] [Abstract][Full Text] [Related]  

  • 13. The vacuum arc ion source for indium and tin ions implantation into phase change memory thin films.
    Seleznev D; Kozlov A; Kulevoy T; Sitnikov A; Lazarenko P; Vorobyov Y; Smayev M; Yakubov A; Sherchenkov A; Kozyukhin S
    Rev Sci Instrum; 2019 Dec; 90(12):123313. PubMed ID: 31893855
    [TBL] [Abstract][Full Text] [Related]  

  • 14. Development of the ion source for cluster implantation.
    Kulevoy TV; Seleznev DN; Kozlov AV; Kuibeda RP; Kropachev GN; Alexeyenko OV; Dugin SN; Oks EM; Gushenets VI; Hershcovitch A; Jonson B; Poole HJ
    Rev Sci Instrum; 2014 Feb; 85(2):02A501. PubMed ID: 24593424
    [TBL] [Abstract][Full Text] [Related]  

  • 15. Surface modification of ferritic steels using MEVVA and duoplasmatron ion sources.
    Kulevoy TV; Chalyhk BB; Fedin PA; Sitnikov AL; Kozlov AV; Kuibeda RP; Andrianov SL; Orlov NN; Kravchuk KS; Rogozhkin SV; Useinov AS; Oks EM; Bogachev AA; Nikitin AA; Iskandarov NA; Golubev AA
    Rev Sci Instrum; 2016 Feb; 87(2):02C102. PubMed ID: 26932112
    [TBL] [Abstract][Full Text] [Related]  

  • 16. Material sensitive scanning probe microscopy of subsurface semiconductor nanostructures via beam exit Ar ion polishing.
    Kolosov OV; Grishin I; Jones R
    Nanotechnology; 2011 May; 22(18):185702. PubMed ID: 21415470
    [TBL] [Abstract][Full Text] [Related]  

  • 17. Experimental development on the 18 mA, H- multi-cusp ion source at China Institute of Atomic Energy.
    Zhang T; Jia X; Qin J; Lv Y; Zheng X
    Rev Sci Instrum; 2012 Feb; 83(2):02A726. PubMed ID: 22380235
    [TBL] [Abstract][Full Text] [Related]  

  • 18. Characteristics of liquid cluster ion beam for surface treatment.
    Ryuto H; Ozaki R; Kubo Y; Takeuchi M; Takaoka GH
    Rev Sci Instrum; 2010 Feb; 81(2):02B902. PubMed ID: 20192468
    [TBL] [Abstract][Full Text] [Related]  

  • 19. Vertical growth of Ge nanowires from biotemplated Au nanoparticle catalysts.
    Sierra-Sastre Y; Choi S; Picraux ST; Batt CA
    J Am Chem Soc; 2008 Aug; 130(32):10488-9. PubMed ID: 18642821
    [TBL] [Abstract][Full Text] [Related]  

  • 20. Development of a MeV proton beam irradiation system.
    Park BS; Cho YS; Hong IS
    Rev Sci Instrum; 2008 Feb; 79(2 Pt 2):02C718. PubMed ID: 18315271
    [TBL] [Abstract][Full Text] [Related]  

    [Next]    [New Search]
    of 6.