These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.


BIOMARKERS

Molecular Biopsy of Human Tumors

- a resource for Precision Medicine *

411 related articles for article (PubMed ID: 22559535)

  • 21. High-resolution noncontact atomic force microscopy.
    Pérez R; García R; Schwarz U
    Nanotechnology; 2009 Jul; 20(26):260201. PubMed ID: 19531843
    [TBL] [Abstract][Full Text] [Related]  

  • 22. Study of the sensitivity of the first four flexural modes of an AFM cantilever with a sidewall probe.
    Chang WJ; Lee HL; Chen TY
    Ultramicroscopy; 2008 Jun; 108(7):619-24. PubMed ID: 18037563
    [TBL] [Abstract][Full Text] [Related]  

  • 23. A method to quantitatively measure the elastic modulus of materials in nanometer scale using atomic force microscopy.
    Tang B; Ngan AH; Pethica JB
    Nanotechnology; 2008 Dec; 19(49):495713. PubMed ID: 21730693
    [TBL] [Abstract][Full Text] [Related]  

  • 24. On the tip calibration for accurate modulus measurement by contact resonance atomic force microscopy.
    Passeri D; Rossi M; Vlassak JJ
    Ultramicroscopy; 2013 May; 128():32-41. PubMed ID: 23500509
    [TBL] [Abstract][Full Text] [Related]  

  • 25. Influence of the tip mass on the tip-sample interactions in TM-AFM.
    Pishkenari HN; Meghdari A
    Ultramicroscopy; 2011 Jul; 111(8):1423-36. PubMed ID: 21864786
    [TBL] [Abstract][Full Text] [Related]  

  • 26. Mechanics of interaction and atomic-scale wear of amplitude modulation atomic force microscopy probes.
    Vahdat V; Grierson DS; Turner KT; Carpick RW
    ACS Nano; 2013 Apr; 7(4):3221-35. PubMed ID: 23506316
    [TBL] [Abstract][Full Text] [Related]  

  • 27. Nanoscale mapping of contact stiffness and damping by contact resonance atomic force microscopy.
    Stan G; King SW; Cook RF
    Nanotechnology; 2012 Jun; 23(21):215703. PubMed ID: 22551825
    [TBL] [Abstract][Full Text] [Related]  

  • 28. Control of tip-to-sample distance in atomic force microscopy: a dual-actuator tip-motion control scheme.
    Jeong Y; Jayanth GR; Menq CH
    Rev Sci Instrum; 2007 Sep; 78(9):093706. PubMed ID: 17902954
    [TBL] [Abstract][Full Text] [Related]  

  • 29. Applications of subsurface microscopy.
    Tetard L; Passian A; Farahi RH; Voy BH; Thundat T
    Methods Mol Biol; 2012; 926():331-43. PubMed ID: 22975973
    [TBL] [Abstract][Full Text] [Related]  

  • 30. A method to quantitatively evaluate the Hamaker constant using the jump-into-contact effect in atomic force microscopy.
    Das S; Sreeram PA; Raychaudhuri AK
    Nanotechnology; 2007 Jan; 18(3):035501. PubMed ID: 19636120
    [TBL] [Abstract][Full Text] [Related]  

  • 31. Elastic moduli of faceted aluminum nitride nanotubes measured by contact resonance atomic force microscopy.
    Stan G; Ciobanu CV; Thayer TP; Wang GT; Creighton JR; Purushotham KP; Bendersky LA; Cook RF
    Nanotechnology; 2009 Jan; 20(3):035706. PubMed ID: 19417308
    [TBL] [Abstract][Full Text] [Related]  

  • 32. Stochastic excitation for high-resolution atomic force acoustic microscopy imaging: a system theory approach.
    Cruz Valeriano E; Gervacio Arciniega JJ; Enriquez Flores CI; Meraz Dávila S; Moreno Palmerin J; Hernández Landaverde MA; Chipatecua Godoy YL; Gutiérrez Peralta AM; Ramírez Bon R; Yañez Limón JM
    Beilstein J Nanotechnol; 2020; 11():703-716. PubMed ID: 32461872
    [TBL] [Abstract][Full Text] [Related]  

  • 33. Evaluation of the contact resonance frequencies in atomic force microscopy as a method for surface characterisation (invited).
    Rabe U; Kopycinska M; Hirsekorn S; Arnold W
    Ultrasonics; 2002 May; 40(1-8):49-54. PubMed ID: 12159988
    [TBL] [Abstract][Full Text] [Related]  

  • 34. Phase imaging with intermodulation atomic force microscopy.
    Platz D; Tholén EA; Hutter C; von Bieren AC; Haviland DB
    Ultramicroscopy; 2010 May; 110(6):573-7. PubMed ID: 20227182
    [TBL] [Abstract][Full Text] [Related]  

  • 35. Characterization of surface stiffness and probe-sample dissipation using the band excitation method of atomic force microscopy: a numerical analysis.
    Kareem AU; Solares SD
    Nanotechnology; 2012 Jan; 23(1):015706. PubMed ID: 22155951
    [TBL] [Abstract][Full Text] [Related]  

  • 36. Effect of tip mass on frequency response and sensitivity of AFM cantilever in liquid.
    Farokh Payam A; Fathipour M
    Micron; 2015 Mar; 70():50-4. PubMed ID: 25562584
    [TBL] [Abstract][Full Text] [Related]  

  • 37. Prototype cantilevers for quantitative lateral force microscopy.
    Reitsma MG; Gates RS; Friedman LH; Cook RF
    Rev Sci Instrum; 2011 Sep; 82(9):093706. PubMed ID: 21974593
    [TBL] [Abstract][Full Text] [Related]  

  • 38. Energy dissipation and dynamic response of an amplitude-modulation atomic-force microscopy subjected to a tip-sample viscous force.
    Lin SM
    Ultramicroscopy; 2007; 107(2-3):245-53. PubMed ID: 16982149
    [TBL] [Abstract][Full Text] [Related]  

  • 39. Step response measurement of AFM cantilever for analysis of frequency-resolved viscoelasticity.
    Ogawa T; Kurachi S; Kageshima M; Naitoh Y; Li YJ; Sugawara Y
    Ultramicroscopy; 2010 May; 110(6):612-7. PubMed ID: 20189307
    [TBL] [Abstract][Full Text] [Related]  

  • 40. Feedback based simultaneous correction of imaging artifacts due to geometrical and mechanical cross-talk and tip-sample stick in atomic force microscopy.
    Shegaonkar AC; Salapaka SM
    Rev Sci Instrum; 2007 Oct; 78(10):103706. PubMed ID: 17979427
    [TBL] [Abstract][Full Text] [Related]  

    [Previous]   [Next]    [New Search]
    of 21.