These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.
42. Wide measurement range scanning heterodyne interferometer utilizing astigmatic position sensing scheme. Park Y; Kim KE; Kim SJ; Park JG; Joo YH; Shin BH; Lee SY; Cho K Opt Lett; 2011 Aug; 36(16):3112-4. PubMed ID: 21847177 [TBL] [Abstract][Full Text] [Related]
43. Scanning technique for obtaining linear fringe shift readout from a high resolution interferometer. Boxman RL; Sloan ML Appl Opt; 1978 Sep; 17(17):2794-7. PubMed ID: 20203868 [TBL] [Abstract][Full Text] [Related]
44. Actively stabilized optical fiber interferometry technique for online/in-process surface measurement. Wang K; Martin H; Jiang X Rev Sci Instrum; 2008 Feb; 79(2 Pt 1):023109. PubMed ID: 18315285 [TBL] [Abstract][Full Text] [Related]
45. Fast scanning method for one-dimensional surface profile measurement by detecting angular deflection of a laser beam. Shinozaki R; Sasaki O; Suzuki T Appl Opt; 2004 Jul; 43(21):4157-63. PubMed ID: 15291058 [TBL] [Abstract][Full Text] [Related]
46. Film thickness measurement based on nonlinear phase analysis using a Linnik microscopic white-light spectral interferometer. Guo T; Chen Z; Li M; Wu J; Fu X; Hu X Appl Opt; 2018 Apr; 57(12):2955-2961. PubMed ID: 29714327 [TBL] [Abstract][Full Text] [Related]
47. Thickness-profile measurement of transparent thin-film layers by white-light scanning interferometry. Kim SW; Kim GH Appl Opt; 1999 Oct; 38(28):5968-73. PubMed ID: 18324116 [TBL] [Abstract][Full Text] [Related]
48. Synthetic optical holography with nonlinear-phase reference. Deutsch B; Schnell M; Hillenbrand R; Carney PS Opt Express; 2014 Nov; 22(22):26621-34. PubMed ID: 25401812 [TBL] [Abstract][Full Text] [Related]
49. Sinusoidal phase modulating interferometer using the integrating-bucket method. Sasaki O; Okazaki H; Sakai M Appl Opt; 1987 Mar; 26(6):1089-93. PubMed ID: 20454274 [TBL] [Abstract][Full Text] [Related]
57. Steady-profile fingering flows in Marangoni driven thin films. Sur J; Witelski TP; Behringer RP Phys Rev Lett; 2004 Dec; 93(24):247803. PubMed ID: 15697861 [TBL] [Abstract][Full Text] [Related]
58. Exact surface profile measurement without subtracting dispersion phase through Fourier transform in a white-light scanning interferometer. Luo S; Sasaki O; Chen Z; Choi S; Pu J Appl Opt; 2018 Feb; 57(4):894-899. PubMed ID: 29400764 [TBL] [Abstract][Full Text] [Related]
59. Extension of the Swanepoel method for obtaining the refractive index of chalcogenide thin films accurately at an arbitrary wavenumber. Jin Y; Song B; Lin C; Zhang P; Dai S; Xu T; Nie Q Opt Express; 2017 Dec; 25(25):31273-31280. PubMed ID: 29245804 [TBL] [Abstract][Full Text] [Related]
60. Design of vibration compensation interferometer for Experimental Advanced Superconducting Tokamak. Yang Y; Li GS; Liu HQ; Jie YX; Ding WX; Brower DL; Zhu X; Wang ZX; Zeng L; Zou ZY; Wei XC; Lan T Rev Sci Instrum; 2014 Nov; 85(11):11D404. PubMed ID: 25430167 [TBL] [Abstract][Full Text] [Related] [Previous] [Next] [New Search]