634 related articles for article (PubMed ID: 22791456)
1. Scanning transmission electron microscopy methods for the analysis of nanoparticles.
Ponce A; Mejía-Rosales S; José-Yacamán M
Methods Mol Biol; 2012; 906():453-71. PubMed ID: 22791456
[TBL] [Abstract][Full Text] [Related]
2. Configuration of microbially synthesized Pd-Au nanoparticles studied by STEM-based techniques.
Tran DT; Jones IP; Preece JA; Johnston RL; Deplanche K; Macaskie LE
Nanotechnology; 2012 Feb; 23(5):055701. PubMed ID: 22236722
[TBL] [Abstract][Full Text] [Related]
3. Surface channeling in aberration-corrected scanning transmission electron microscopy of nanostructures.
Liu J; Allard LF
Microsc Microanal; 2010 Aug; 16(4):425-33. PubMed ID: 20598201
[TBL] [Abstract][Full Text] [Related]
4. Coalescence and sintering of Pt nanoparticles: in situ observation by aberration-corrected HAADF STEM.
Asoro MA; Kovar D; Shao-Horn Y; Allard LF; Ferreira PJ
Nanotechnology; 2010 Jan; 21(2):025701. PubMed ID: 19955618
[TBL] [Abstract][Full Text] [Related]
5. Application of low-energy scanning transmission electron microscopy for the study of Pt-nanoparticle uptake in human colon carcinoma cells.
Blank H; Schneider R; Gerthsen D; Gehrke H; Jarolim K; Marko D
Nanotoxicology; 2014 Jun; 8(4):433-46. PubMed ID: 23590554
[TBL] [Abstract][Full Text] [Related]
6. The Co-Au interface in bimetallic nanoparticles: a high resolution STEM study.
Mayoral A; Mejía-Rosales S; Mariscal MM; Pérez-Tijerina E; José-Yacamán M
Nanoscale; 2010 Dec; 2(12):2647-51. PubMed ID: 20944844
[TBL] [Abstract][Full Text] [Related]
7. Recent advances in electron tomography: TEM and HAADF-STEM tomography for materials science and semiconductor applications.
Kübel C; Voigt A; Schoenmakers R; Otten M; Su D; Lee TC; Carlsson A; Bradley J
Microsc Microanal; 2005 Oct; 11(5):378-400. PubMed ID: 17481320
[TBL] [Abstract][Full Text] [Related]
8. Stoichiometry of alloy nanoparticles from laser ablation of PtIr in acetone and their electrophoretic deposition on PtIr electrodes.
Jakobi J; Menéndez-Manjón A; Chakravadhanula VS; Kienle L; Wagener P; Barcikowski S
Nanotechnology; 2011 Apr; 22(14):145601. PubMed ID: 21346297
[TBL] [Abstract][Full Text] [Related]
9. 4D scanning transmission ultrafast electron microscopy: Single-particle imaging and spectroscopy.
Ortalan V; Zewail AH
J Am Chem Soc; 2011 Jul; 133(28):10732-5. PubMed ID: 21615171
[TBL] [Abstract][Full Text] [Related]
10. Composition mapping in InGaN by scanning transmission electron microscopy.
Rosenauer A; Mehrtens T; Müller K; Gries K; Schowalter M; Satyam PV; Bley S; Tessarek C; Hommel D; Sebald K; Seyfried M; Gutowski J; Avramescu A; Engl K; Lutgen S
Ultramicroscopy; 2011 Jul; 111(8):1316-27. PubMed ID: 21864772
[TBL] [Abstract][Full Text] [Related]
11. The use of STEM imaging to analyze thickness variations due to electromigration-induced mass transport in thin polycrystalline nanobridges.
Rudneva M; Kozlova T; Zandbergen HW
Ultramicroscopy; 2013 Nov; 134():155-9. PubMed ID: 23820593
[TBL] [Abstract][Full Text] [Related]
12. Probing structures of nanomaterials using advanced electron microscopy methods, including aberration-corrected electron microscopy at the Angstrom scale.
Gai PL; Yoshida K; Shute C; Jia X; Walsh M; Ward M; Dresselhaus MS; Weertman JR; Boyes ED
Microsc Res Tech; 2011 Jul; 74(7):664-70. PubMed ID: 20954265
[TBL] [Abstract][Full Text] [Related]
13. Probe integrated scattering cross sections in the analysis of atomic resolution HAADF STEM images.
E H; Macarthur KE; Pennycook TJ; Okunishi E; D'Alfonso AJ; Lugg NR; Allen LJ; Nellist PD
Ultramicroscopy; 2013 Oct; 133():109-19. PubMed ID: 23969066
[TBL] [Abstract][Full Text] [Related]
14. Quantification of sample thickness and in-concentration of InGaAs quantum wells by transmission measurements in a scanning electron microscope.
Volkenandt T; Müller E; Hu DZ; Schaadt DM; Gerthsen D
Microsc Microanal; 2010 Oct; 16(5):604-13. PubMed ID: 20633317
[TBL] [Abstract][Full Text] [Related]
15. Determination of the chemical composition of GaNAs using STEM HAADF imaging and STEM strain state analysis.
Grieb T; Müller K; Fritz R; Schowalter M; Neugebohrn N; Knaub N; Volz K; Rosenauer A
Ultramicroscopy; 2012 Jun; 117():15-23. PubMed ID: 22634136
[TBL] [Abstract][Full Text] [Related]
16. Scanning transmission electron microscopy and its application to the study of nanoparticles and nanoparticle systems.
Liu J
J Electron Microsc (Tokyo); 2005 Jun; 54(3):251-78. PubMed ID: 16123072
[TBL] [Abstract][Full Text] [Related]
17. Sinter-free phase conversion and scanning transmission electron microscopy of FePt nanoparticle monolayers.
Johnston-Peck AC; Scarel G; Wang J; Parsons GN; Tracy JB
Nanoscale; 2011 Oct; 3(10):4142-9. PubMed ID: 21869998
[TBL] [Abstract][Full Text] [Related]
18. The formation and utility of sub-angstrom to nanometer-sized electron probes in the aberration-corrected transmission electron microscope at the University of Illinois.
Wen J; Mabon J; Lei C; Burdin S; Sammann E; Petrov I; Shah AB; Chobpattana V; Zhang J; Ran K; Zuo JM; Mishina S; Aoki T
Microsc Microanal; 2010 Apr; 16(2):183-93. PubMed ID: 20187990
[TBL] [Abstract][Full Text] [Related]
19. Application of two-dimensional crystallography and image processing to atomic resolution Z-contrast images.
Morgan DG; Ramasse QM; Browning ND
J Electron Microsc (Tokyo); 2009 Jun; 58(3):223-44. PubMed ID: 19297343
[TBL] [Abstract][Full Text] [Related]
20. Wet STEM: a new development in environmental SEM for imaging nano-objects included in a liquid phase.
Bogner A; Thollet G; Basset D; Jouneau PH; Gauthier C
Ultramicroscopy; 2005 Oct; 104(3-4):290-301. PubMed ID: 15990230
[TBL] [Abstract][Full Text] [Related]
[Next] [New Search]