These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.
2. 3D imaging of cells and tissues by focused ion beam/scanning electron microscopy (FIB/SEM). Drobne D Methods Mol Biol; 2013; 950():275-92. PubMed ID: 23086881 [TBL] [Abstract][Full Text] [Related]
3. Internal composition of atmospheric dust particles from focused ion-beam scanning electron microscopy. Conny JM Environ Sci Technol; 2013 Aug; 47(15):8575-81. PubMed ID: 23763344 [TBL] [Abstract][Full Text] [Related]
4. Sample preparation toward seamless 3D imaging technique from micrometer to nanometer scale. Miyake A; Matsuno J; Toh S Microscopy (Oxf); 2014 Nov; 63 Suppl 1():i24-i25. PubMed ID: 25359821 [TBL] [Abstract][Full Text] [Related]
5. Focused ion beam scanning electron microscopy in biology. Kizilyaprak C; Daraspe J; Humbel BM J Microsc; 2014 Jun; 254(3):109-14. PubMed ID: 24707797 [TBL] [Abstract][Full Text] [Related]
6. Cross-sectional sample preparation by focused ion beam: a review of ion-sample interaction. Ishitani T; Yaguchi T Microsc Res Tech; 1996 Nov; 35(4):320-33. PubMed ID: 8987026 [TBL] [Abstract][Full Text] [Related]
8. Comparison of different preparation methods of biological samples for FIB milling and SEM investigation. Leser V; Drobne D; Pipan Z; Milani M; Tatti F J Microsc; 2009 Feb; 233(2):309-19. PubMed ID: 19220697 [TBL] [Abstract][Full Text] [Related]
9. Sample preparation of energy materials for X-ray nanotomography with micromanipulation. Chen-Wiegart YC; Camino FE; Wang J Chemphyschem; 2014 Jun; 15(8):1587-91. PubMed ID: 24668921 [TBL] [Abstract][Full Text] [Related]
10. Investigation of cell-substrate interactions by focused ion beam preparation and scanning electron microscopy. Friedmann A; Hoess A; Cismak A; Heilmann A Acta Biomater; 2011 Jun; 7(6):2499-507. PubMed ID: 21345385 [TBL] [Abstract][Full Text] [Related]
11. FIB-SEM cathodoluminescence tomography: practical and theoretical considerations. De Winter DA; Lebbink MN; Wiggers De Vries DF; Post JA; Drury MR J Microsc; 2011 Sep; 243(3):315-26. PubMed ID: 21692799 [TBL] [Abstract][Full Text] [Related]
12. Applications of the FIB lift-out technique for TEM specimen preparation. Giannuzzi LA; Drown JL; Brown SR; Irwin RB; Stevie FA Microsc Res Tech; 1998 May; 41(4):285-90. PubMed ID: 9633946 [TBL] [Abstract][Full Text] [Related]
13. On radiation damage in FIB-prepared softwood samples measured by scanning X-ray diffraction. Storm S; Ogurreck M; Laipple D; Krywka C; Burghammer M; Di Cola E; Müller M J Synchrotron Radiat; 2015 Mar; 22(2):267-72. PubMed ID: 25723928 [TBL] [Abstract][Full Text] [Related]
15. Subsurface examination of a foliar biofilm using scanning electron- and focused-ion-beam microscopy. Wallace PK; Arey B; Mahaffee WF Micron; 2011 Aug; 42(6):579-85. PubMed ID: 21482121 [TBL] [Abstract][Full Text] [Related]
16. Deep sub micrometer imaging of defects in copper pillars by X-ray tomography in a SEM. Laloum D; Lorut F; Bertheau J; Audoit G; Bleuet P Micron; 2014 Mar; 58():1-8. PubMed ID: 24316374 [TBL] [Abstract][Full Text] [Related]
17. FIB preparation and SEM investigations for three-dimensional analysis of cell cultures on microneedle arrays. Friedmann A; Cismak A; Tautorat C; Koester PJ; Baumann W; Held J; Gaspar J; Ruther P; Paul O; Heilmann A Scanning; 2012; 34(4):221-9. PubMed ID: 22076793 [TBL] [Abstract][Full Text] [Related]
18. A site-specific focused-ion-beam lift-out method for cryo Transmission Electron Microscopy. Rubino S; Akhtar S; Melin P; Searle A; Spellward P; Leifer K J Struct Biol; 2012 Dec; 180(3):572-6. PubMed ID: 23000702 [TBL] [Abstract][Full Text] [Related]
19. Two-dimensional and 3-dimensional analysis of bone/dental implant interfaces with the use of focused ion beam and electron microscopy. Giannuzzi LA; Phifer D; Giannuzzi NJ; Capuano MJ J Oral Maxillofac Surg; 2007 Apr; 65(4):737-47. PubMed ID: 17368372 [TBL] [Abstract][Full Text] [Related]
20. Site-specific specimen preparation by focused ion beam milling for transmission electron microscopy of metal matrix composites. Gasser P; Klotz UE; Khalid FA; Beffort O Microsc Microanal; 2004 Apr; 10(2):311-6. PubMed ID: 15306057 [TBL] [Abstract][Full Text] [Related] [Next] [New Search]