These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.
115 related articles for article (PubMed ID: 23114330)
1. Grating-based at-wavelength metrology of hard x-ray reflective optics. Berujon S; Ziegler E Opt Lett; 2012 Nov; 37(21):4464-6. PubMed ID: 23114330 [TBL] [Abstract][Full Text] [Related]
2. At-wavelength metrology of hard X-ray mirror using near field speckle. Berujon S; Wang H; Alcock S; Sawhney K Opt Express; 2014 Mar; 22(6):6438-46. PubMed ID: 24663992 [TBL] [Abstract][Full Text] [Related]
3. Ptychographic characterization of the wavefield in the focus of reflective hard X-ray optics. Kewish CM; Thibault P; Dierolf M; Bunk O; Menzel A; Vila-Comamala J; Jefimovs K; Pfeiffer F Ultramicroscopy; 2010 Mar; 110(4):325-9. PubMed ID: 20116927 [TBL] [Abstract][Full Text] [Related]
4. Wavefront metrology measurements at SACLA by means of X-ray grating interferometry. Kayser Y; Rutishauser S; Katayama T; Ohashi H; Kameshima T; Flechsig U; Yabashi M; David C Opt Express; 2014 Apr; 22(8):9004-15. PubMed ID: 24787789 [TBL] [Abstract][Full Text] [Related]
5. X-ray grating interferometer for in situ and at-wavelength wavefront metrology. Kayser Y; David C; Flechsig U; Krempasky J; Schlott V; Abela R J Synchrotron Radiat; 2017 Jan; 24(Pt 1):150-162. PubMed ID: 28009554 [TBL] [Abstract][Full Text] [Related]
6. Optics metrology and at-wavelength wavefront characterization by a microfocus X-ray grating interferometer. Zhao S; Yang Y; Shen Y; Cheng G; Wang Y; Wang Q; Zhang L; Wang K Opt Express; 2021 Jul; 29(14):22704-22713. PubMed ID: 34266028 [TBL] [Abstract][Full Text] [Related]
7. Hard X-ray nanofocusing using adaptive focusing optics based on piezoelectric deformable mirrors. Goto T; Nakamori H; Kimura T; Sano Y; Kohmura Y; Tamasaku K; Yabashi M; Ishikawa T; Yamauchi K; Matsuyama S Rev Sci Instrum; 2015 Apr; 86(4):043102. PubMed ID: 25933836 [TBL] [Abstract][Full Text] [Related]
8. Reconstruction of an astigmatic hard X-ray beam and alignment of K-B mirrors from ptychographic coherent diffraction data. Kewish CM; Guizar-Sicairos M; Liu C; Qian J; Shi B; Benson C; Khounsary AM; Vila-Comamala J; Bunk O; Fienup JR; Macrander AT; Assoufid L Opt Express; 2010 Oct; 18(22):23420-7. PubMed ID: 21164684 [TBL] [Abstract][Full Text] [Related]
9. A Shack-Hartmann measuring head for the two-dimensional characterization of X-ray mirrors. Floriot J; Levecq X; Bucourt S; Thomasset M; Polack F; Idir M; Mercère P; Moreno T; Brochet S J Synchrotron Radiat; 2008 Mar; 15(Pt 2):134-9. PubMed ID: 18296778 [TBL] [Abstract][Full Text] [Related]
10. X-ray wavefront characterization using a rotating shearing interferometer technique. Wang H; Sawhney K; Berujon S; Ziegler E; Rutishauser S; David C Opt Express; 2011 Aug; 19(17):16550-9. PubMed ID: 21935019 [TBL] [Abstract][Full Text] [Related]
11. Speckle-based at-wavelength metrology of X-ray mirrors with super accuracy. Kashyap Y; Wang H; Sawhney K Rev Sci Instrum; 2016 May; 87(5):052001. PubMed ID: 27250381 [TBL] [Abstract][Full Text] [Related]
12. At-wavelength metrology of an X-ray mirror using a downstream wavefront modulator. Zhou T; Hu L; Wang H J Synchrotron Radiat; 2024 May; 31(Pt 3):432-437. PubMed ID: 38587895 [TBL] [Abstract][Full Text] [Related]
13. Development of ion beam figuring system with electrostatic deflection for ultraprecise X-ray reflective optics. Yamada J; Matsuyama S; Sano Y; Yamauchi K Rev Sci Instrum; 2015 Sep; 86(9):093103. PubMed ID: 26429425 [TBL] [Abstract][Full Text] [Related]
14. Absolute metrology method of the x-ray mirror with speckle scanning technique. Xue L; Li Z; Zhou T; Dong X; Luo H; Wang H; Sawhney K; Wang J Appl Opt; 2019 Nov; 58(31):8658-8664. PubMed ID: 31873357 [TBL] [Abstract][Full Text] [Related]