140 related articles for article (PubMed ID: 23262597)
1. Application of white-light scanning interferometer on transparent thin-film measurement.
Li MC; Wan DS; Lee CC
Appl Opt; 2012 Dec; 51(36):8579-86. PubMed ID: 23262597
[TBL] [Abstract][Full Text] [Related]
2. Sensitivity analysis of thin-film thickness measurement by vertical scanning white-light interferometry.
Dong JT; Lu RS
Appl Opt; 2012 Aug; 51(23):5668-75. PubMed ID: 22885580
[TBL] [Abstract][Full Text] [Related]
3. Surface and thickness measurement of a transparent film using wavelength scanning interferometry.
Gao F; Muhamedsalih H; Jiang X
Opt Express; 2012 Sep; 20(19):21450-6. PubMed ID: 23037266
[TBL] [Abstract][Full Text] [Related]
4. Simultaneous film thickness and refractive index measurement using a constrained fitting method in a white light spectral interferometer.
Yuan L; Guo T; Tang D; Liu H; Guo X
Opt Express; 2022 Jan; 30(1):349-363. PubMed ID: 35201213
[TBL] [Abstract][Full Text] [Related]
5. Sub-sampling low coherence scanning interferometry and its application: refractive index measurements of a silicon wafer.
Joo KN
Appl Opt; 2013 Dec; 52(36):8644-9. PubMed ID: 24513929
[TBL] [Abstract][Full Text] [Related]
6. Absolute refractive index measurement method over a broad wavelength region based on white-light interferometry.
Kim SH; Lee SH; Lim JI; Kim KH
Appl Opt; 2010 Feb; 49(5):910-4. PubMed ID: 20154761
[TBL] [Abstract][Full Text] [Related]
7. Simultaneous measurement of group and phase refractive indices and physical thickness of transparent plates with low coherence Fabry-Perot interferometry.
Bang DJ; Kim Y; Kim Y; Kim MJ; Kim KH
Appl Opt; 2018 Jun; 57(16):4428-4433. PubMed ID: 29877389
[TBL] [Abstract][Full Text] [Related]
8. Group delay dispersion measurement of a dispersive mirror by spectral interferometry: comparison of different signal processing algorithms.
Luo Z; Zhang S; Shen WD; Xia C; Ma Q; Liu X; Zhang Y
Appl Opt; 2011 Mar; 50(9):C239-45. PubMed ID: 21460945
[TBL] [Abstract][Full Text] [Related]
9. Thin-film thickness profile and its refractive index measurements by dispersive white-light interferometry.
Ghim YS; Kim SW
Opt Express; 2006 Nov; 14(24):11885-91. PubMed ID: 19529611
[TBL] [Abstract][Full Text] [Related]
10. Direct measurement of refractive-index dispersion of transparent media by white-light interferometry.
Galli M; Marabelli F; Guizzetti G
Appl Opt; 2003 Jul; 42(19):3910-4. PubMed ID: 12868830
[TBL] [Abstract][Full Text] [Related]
11. Geometrical optics in thin film light guides.
Ulrich R; Martin RJ
Appl Opt; 1971 Sep; 10(9):2077-85. PubMed ID: 20111273
[TBL] [Abstract][Full Text] [Related]
12. Measuring the refractive index and thickness of thin transparent films: method.
Daneu V; Sanchez A
Appl Opt; 1974 Jan; 13(1):122-8. PubMed ID: 20125932
[TBL] [Abstract][Full Text] [Related]
13. Spectrometer-based refractive index and dispersion measurement using low-coherence interferometry with confocal scanning.
Francis D; Ford HD; Tatam RP
Opt Express; 2018 Feb; 26(3):3604-3617. PubMed ID: 29401888
[TBL] [Abstract][Full Text] [Related]
14. Thickness and refractive index dispersion measurement in a thin film using the Haidinger interferometer.
de Oliveira EA; Frejlich J
Appl Opt; 1989 Apr; 28(7):1382-6. PubMed ID: 20548668
[TBL] [Abstract][Full Text] [Related]
15. Separation algorithm for a 2D refractive index distribution and thickness profile of a phase object by laser diode-based multiwavelength interferometry.
Lee K; Ryu SY; Kwak YK; Kim S; Lee YW
Rev Sci Instrum; 2009 May; 80(5):053114. PubMed ID: 19485499
[TBL] [Abstract][Full Text] [Related]
16. Fizeau interferometry for measuring refractive index and thickness of nearly transparent films.
Buckman AB; Kuo C
Appl Opt; 1978 Nov; 17(22):3636-40. PubMed ID: 20204044
[TBL] [Abstract][Full Text] [Related]
17. Utilization of frequency information in a linear wavenumber-scanning interferometer for profile measurement of a thin film.
Sasaki O; Hirakubo S; Choi S; Suzuki T
Appl Opt; 2012 May; 51(13):2429-35. PubMed ID: 22614422
[TBL] [Abstract][Full Text] [Related]
18. Determination of the optical constants of an inhomogeneous transparent LaF(3) thin film on a transparent substrate by spectroscopic ellipsometry.
Chindaudom P; Vedam K
Opt Lett; 1992 Apr; 17(7):538-40. PubMed ID: 19794551
[TBL] [Abstract][Full Text] [Related]
19. Dispersive white-light spectral interferometry with absolute phase retrieval to measure thin film.
Hlubina P; Ciprian D; Lunácek J; Lesnák M
Opt Express; 2006 Aug; 14(17):7678-85. PubMed ID: 19529136
[TBL] [Abstract][Full Text] [Related]
20. Scanning white-light interferometer for measurement of the thickness of a transparent oil film on water.
Sun C; Yu L; Sun Y; Yu Q
Appl Opt; 2005 Sep; 44(25):5202-5. PubMed ID: 16149343
[TBL] [Abstract][Full Text] [Related]
[Next] [New Search]