These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.


BIOMARKERS

Molecular Biopsy of Human Tumors

- a resource for Precision Medicine *

512 related articles for article (PubMed ID: 23298538)

  • 21. Determination of atomic vacancies in InAs/GaSb strained-layer superlattices by atomic strain.
    Kim H; Meng Y; Kwon JH; Rouviére JL; Zuo JM
    IUCrJ; 2018 Jan; 5(Pt 1):67-72. PubMed ID: 29354272
    [TBL] [Abstract][Full Text] [Related]  

  • 22. Effect of chromatic aberration on atomic-resolved spherical aberration corrected STEM images.
    Kuramochi K; Yamazaki T; Kotaka Y; Ohtsuka M; Hashimoto I; Watanabe K
    Ultramicroscopy; 2009 Dec; 110(1):36-42. PubMed ID: 19818560
    [TBL] [Abstract][Full Text] [Related]  

  • 23. Composition mapping in InGaN by scanning transmission electron microscopy.
    Rosenauer A; Mehrtens T; Müller K; Gries K; Schowalter M; Satyam PV; Bley S; Tessarek C; Hommel D; Sebald K; Seyfried M; Gutowski J; Avramescu A; Engl K; Lutgen S
    Ultramicroscopy; 2011 Jul; 111(8):1316-27. PubMed ID: 21864772
    [TBL] [Abstract][Full Text] [Related]  

  • 24. Atomic-Resolution Spectrum Imaging of Semiconductor Nanowires.
    Zamani RR; Hage FS; Lehmann S; Ramasse QM; Dick KA
    Nano Lett; 2018 Mar; 18(3):1557-1563. PubMed ID: 29116807
    [TBL] [Abstract][Full Text] [Related]  

  • 25. Atomic resolution imaging using the real-space distribution of electrons scattered by a crystalline material.
    Lazar S; Etheridge J; Dwyer C; Freitag B; Botton GA
    Acta Crystallogr A; 2011 Sep; 67(Pt 5):487-90. PubMed ID: 21844654
    [TBL] [Abstract][Full Text] [Related]  

  • 26. Surface channeling in aberration-corrected scanning transmission electron microscopy of nanostructures.
    Liu J; Allard LF
    Microsc Microanal; 2010 Aug; 16(4):425-33. PubMed ID: 20598201
    [TBL] [Abstract][Full Text] [Related]  

  • 27. Antimony-mediated control of misfit dislocations and strain at the highly lattice mismatched GaSb/GaAs interface.
    Wang Y; Ruterana P; Chen J; Kret S; El Kazzi S; Genevois C; Desplanque L; Wallart X
    ACS Appl Mater Interfaces; 2013 Oct; 5(19):9760-4. PubMed ID: 24024581
    [TBL] [Abstract][Full Text] [Related]  

  • 28. 3D reconstruction of atomic structures from high angle annular dark field (HAADF) STEM images and its application on zeolite silicalite-1.
    Willhammar T; Mayoral A; Zou X
    Dalton Trans; 2014 Oct; 43(37):14158-63. PubMed ID: 25137058
    [TBL] [Abstract][Full Text] [Related]  

  • 29. Influence of static atomic displacements on composition quantification of AlGaN/GaN heterostructures from HAADF-STEM images.
    Schowalter M; Stoffers I; Krause FF; Mehrtens T; Müller K; Fandrich M; Aschenbrenner T; Hommel D; Rosenauer A
    Microsc Microanal; 2014 Oct; 20(5):1463-70. PubMed ID: 25010567
    [TBL] [Abstract][Full Text] [Related]  

  • 30. A Study of Defects in InAs/GaSb Type-II Superlattices Using High-Resolution Reciprocal Space Mapping.
    Sankowska I; Jasik A; Czuba K; Ratajczak J; Kozłowski P; Wzorek M
    Materials (Basel); 2021 Aug; 14(17):. PubMed ID: 34501029
    [TBL] [Abstract][Full Text] [Related]  

  • 31. Quantitative strain and compositional studies of InxGa1-xAs Epilayer in a GaAs-based pHEMT device structure by TEM techniques.
    Sridhara Rao DV; Sankarasubramanian R; Muraleedharan K; Mehrtens T; Rosenauer A; Banerjee D
    Microsc Microanal; 2014 Aug; 20(4):1262-70. PubMed ID: 24758870
    [TBL] [Abstract][Full Text] [Related]  

  • 32. Electron microscopy study of gold nanoparticles deposited on transition metal oxides.
    Akita T; Kohyama M; Haruta M
    Acc Chem Res; 2013 Aug; 46(8):1773-82. PubMed ID: 23777292
    [TBL] [Abstract][Full Text] [Related]  

  • 33. Multiple strains and polar states in PbZr
    Tang YL; Zhu YL; Wang YJ; Ma XL
    Ultramicroscopy; 2018 Oct; 193():84-89. PubMed ID: 29957330
    [TBL] [Abstract][Full Text] [Related]  

  • 34. Multi-heterojunction InAs/GaSb nano-ridges directly grown on (001) Si.
    Yan Z; Han Y; Lau KM
    Nanotechnology; 2020 Aug; 31(34):345707. PubMed ID: 32392551
    [TBL] [Abstract][Full Text] [Related]  

  • 35. 3D strain measurement in electronic devices using through-focal annular dark-field imaging.
    Kim S; Jung Y; Lee S; Jung Kim J; Byun G; Lee S; Lee H
    Ultramicroscopy; 2014 Nov; 146():1-5. PubMed ID: 24859824
    [TBL] [Abstract][Full Text] [Related]  

  • 36. Statistical distribution of single atoms and clusters of supported Au catalyst analyzed by global high-resolution HAADF-STEM observation with morphological image-processing operation.
    Yamamoto Y; Arai S; Esaki A; Ohyama J; Satsuma A; Tanaka N
    Microscopy (Oxf); 2014 Jun; 63(3):209-18. PubMed ID: 24489113
    [TBL] [Abstract][Full Text] [Related]  

  • 37. Nanometer-scale, quantitative composition mappings of InGaN layers from a combination of scanning transmission electron microscopy and energy dispersive x-ray spectroscopy.
    Pantzas K; Patriarche G; Troadec D; Gautier S; Moudakir T; Suresh S; Largeau L; Mauguin O; Voss PL; Ougazzaden A
    Nanotechnology; 2012 Nov; 23(45):455707. PubMed ID: 23089619
    [TBL] [Abstract][Full Text] [Related]  

  • 38. Monolithic integration of a 10 μm cut-off wavelength InAs/GaSb type-II superlattice diode on GaAs platform.
    Kwan DCM; Kesaria M; Jiménez JJ; Srivastava V; Delmas M; Liang BL; Morales FM; Huffaker DL
    Sci Rep; 2022 Jul; 12(1):11616. PubMed ID: 35804001
    [TBL] [Abstract][Full Text] [Related]  

  • 39. Structural Analysis of Highly Relaxed GaSb Grown on GaAs Substrates with Periodic Interfacial Array of 90° Misfit Dislocations.
    Jallipalli A; Balakrishnan G; Huang Sh; Rotter T; Nunna K; Liang B; Dawson L; Huffaker D
    Nanoscale Res Lett; 2009 Aug; 4(12):1458-62. PubMed ID: 20652143
    [TBL] [Abstract][Full Text] [Related]  

  • 40. Quantitative atomic resolution mapping using high-angle annular dark field scanning transmission electron microscopy.
    Van Aert S; Verbeeck J; Erni R; Bals S; Luysberg M; Van Dyck D; Van Tendeloo G
    Ultramicroscopy; 2009 Sep; 109(10):1236-44. PubMed ID: 19525069
    [TBL] [Abstract][Full Text] [Related]  

    [Previous]   [Next]    [New Search]
    of 26.