377 related articles for article (PubMed ID: 23380005)
1. Grain boundary character distribution of nanocrystalline Cu thin films using stereological analysis of transmission electron microscope orientation maps.
Darbal AD; Ganesh KJ; Liu X; Lee SB; Ledonne J; Sun T; Yao B; Warren AP; Rohrer GS; Rollett AD; Ferreira PJ; Coffey KR; Barmak K
Microsc Microanal; 2013 Feb; 19(1):111-9. PubMed ID: 23380005
[TBL] [Abstract][Full Text] [Related]
2. Effect of downscaling nano-copper interconnects on the microstructure revealed by high resolution TEM-orientation-mapping.
Ganesh KJ; Darbal AD; Rajasekhara S; Rohrer GS; Barmak K; Ferreira PJ
Nanotechnology; 2012 Apr; 23(13):135702. PubMed ID: 22418052
[TBL] [Abstract][Full Text] [Related]
3. Advance in orientation microscopy: quantitative analysis of nanocrystalline structures.
Seyring M; Song X; Rettenmayr M
ACS Nano; 2011 Apr; 5(4):2580-6. PubMed ID: 21375327
[TBL] [Abstract][Full Text] [Related]
4. Orientation and phase mapping in the transmission electron microscope using precession-assisted diffraction spot recognition: state-of-the-art results.
Viladot D; Véron M; Gemmi M; Peiró F; Portillo J; Estradé S; Mendoza J; Llorca-Isern N; Nicolopoulos S
J Microsc; 2013 Oct; 252(1):23-34. PubMed ID: 23889078
[TBL] [Abstract][Full Text] [Related]
5. Height-resolved quantification of microstructure and texture in polycrystalline thin films using TEM orientation mapping.
Aebersold AB; Alexander DT; Hébert C
Ultramicroscopy; 2015 Dec; 159 Pt 1():112-23. PubMed ID: 26363209
[TBL] [Abstract][Full Text] [Related]
6. Crystallographic Orientation Analysis of Nanocrystalline Tungsten Thin Film Using TEM Precession Electron Diffraction and SEM Transmission Kikuchi Diffraction.
Jeong J; Jang WS; Kim KH; Kostka A; Gu G; Kim YM; Oh SH
Microsc Microanal; 2021 Apr; 27(2):237-249. PubMed ID: 33541465
[TBL] [Abstract][Full Text] [Related]
7. In situ TEM study of grain growth in nanocrystalline copper thin films.
Simões S; Calinas R; Vieira MT; Vieira MF; Ferreira PJ
Nanotechnology; 2010 Apr; 21(14):145701. PubMed ID: 20215662
[TBL] [Abstract][Full Text] [Related]
8. Three-dimensional EBSD study on the relationship between triple junctions and columnar grains in electrodeposited Co-Ni films.
Bastos A; Zaefferer S; Raabe D
J Microsc; 2008 Jun; 230(Pt 3):487-98. PubMed ID: 18503675
[TBL] [Abstract][Full Text] [Related]
9. Five-parameter grain boundary analysis of a grain boundary-engineered austenitic stainless steel.
Jones R; Randle V; Engelberg D; Marrow TJ
J Microsc; 2009 Mar; 233(3):417-22. PubMed ID: 19250462
[TBL] [Abstract][Full Text] [Related]
10. Using transmission Kikuchi diffraction to study intergranular stress corrosion cracking in type 316 stainless steels.
Meisnar M; Vilalta-Clemente A; Gholinia A; Moody M; Wilkinson AJ; Huin N; Lozano-Perez S
Micron; 2015 Aug; 75():1-10. PubMed ID: 25974882
[TBL] [Abstract][Full Text] [Related]
11. First combined electron backscatter diffraction and transmission electron microscopy study of grain boundary structure of deformed quartzite.
Shigematsu N; Prior DJ; Wheeler J
J Microsc; 2006 Dec; 224(Pt 3):306-21. PubMed ID: 17210063
[TBL] [Abstract][Full Text] [Related]
12. Nanometres-resolution Kikuchi patterns from materials science specimens with transmission electron forward scatter diffraction in the scanning electron microscope.
Brodusch N; Demers H; Gauvin R
J Microsc; 2013 Apr; 250(1):1-14. PubMed ID: 23346885
[TBL] [Abstract][Full Text] [Related]
13. A novel approach for site-specific atom probe specimen preparation by focused ion beam and transmission electron backscatter diffraction.
Babinsky K; De Kloe R; Clemens H; Primig S
Ultramicroscopy; 2014 Sep; 144():9-18. PubMed ID: 24815026
[TBL] [Abstract][Full Text] [Related]
14. Orientation precision of electron backscatter diffraction measurements near grain boundaries.
Wright SI; Nowell MM; de Kloe R; Chan L
Microsc Microanal; 2014 Jun; 20(3):852-63. PubMed ID: 24576405
[TBL] [Abstract][Full Text] [Related]
15. Orientation imaging microscopy with optimized convergence angle using CBED patterns in TEMs.
Kumar V
IEEE Trans Image Process; 2013 Jul; 22(7):2637-45. PubMed ID: 23549890
[TBL] [Abstract][Full Text] [Related]
16. 'Five-parameter' analysis of grain boundary networks by electron backscatter diffraction.
Randle V
J Microsc; 2006 May; 222(Pt 2):69-75. PubMed ID: 16774515
[TBL] [Abstract][Full Text] [Related]
17. Determining Projections of Grain Boundaries from Diffraction Data in Transmission Electron Microscope.
Kiss ÁK; Lábár JL
Microsc Microanal; 2016 Jun; 22(3):551-64. PubMed ID: 27074103
[TBL] [Abstract][Full Text] [Related]
18. Orientation mapping of nanostructured materials using transmission Kikuchi diffraction in the scanning electron microscope.
Trimby PW
Ultramicroscopy; 2012 Sep; 120():16-24. PubMed ID: 22796555
[TBL] [Abstract][Full Text] [Related]
19. Grain boundary character distributions in Ni-16Cr-9Fe using selected area channeling patterns: methodology and results.
Crawford DC; Was GS
J Electron Microsc Tech; 1991 Nov; 19(3):345-60. PubMed ID: 1795187
[TBL] [Abstract][Full Text] [Related]
20. The effect of nitrogen on the formation of nanocrystalline copper thin films.
Calinas R; Vieira MT; Ferreira PJ
J Nanosci Nanotechnol; 2009 Jun; 9(6):3921-6. PubMed ID: 19504942
[TBL] [Abstract][Full Text] [Related]
[Next] [New Search]
