These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.


BIOMARKERS

Molecular Biopsy of Human Tumors

- a resource for Precision Medicine *

237 related articles for article (PubMed ID: 23578863)

  • 1. Phase-contrast imaging in aberration-corrected scanning transmission electron microscopy.
    Krumeich F; Müller E; Wepf RA
    Micron; 2013 Jun; 49():1-14. PubMed ID: 23578863
    [TBL] [Abstract][Full Text] [Related]  

  • 2. Characterization of LiBC by phase-contrast scanning transmission electron microscopy.
    Krumeich F; Wörle M; Reibisch P; Nesper R
    Micron; 2014 Aug; 63():64-8. PubMed ID: 24238940
    [TBL] [Abstract][Full Text] [Related]  

  • 3. The tuning of a Zernike phase plate with defocus and variable spherical aberration and its use in HRTEM imaging.
    Lentzen M
    Ultramicroscopy; 2004 Jun; 99(4):211-20. PubMed ID: 15149715
    [TBL] [Abstract][Full Text] [Related]  

  • 4. Performance and image analysis of the aberration-corrected Hitachi HD-2700C STEM.
    Inada H; Wu L; Wall J; Su D; Zhu Y
    J Electron Microsc (Tokyo); 2009 Jun; 58(3):111-22. PubMed ID: 19254916
    [TBL] [Abstract][Full Text] [Related]  

  • 5. Scanning transmission electron microscopy methods for the analysis of nanoparticles.
    Ponce A; Mejía-Rosales S; José-Yacamán M
    Methods Mol Biol; 2012; 906():453-71. PubMed ID: 22791456
    [TBL] [Abstract][Full Text] [Related]  

  • 6. Shadow images for in-line holography in a STEM instrument.
    Wang SY; Cowley JM
    Microsc Res Tech; 1995 Feb; 30(2):181-92. PubMed ID: 7711329
    [TBL] [Abstract][Full Text] [Related]  

  • 7. Bright-field scanning confocal electron microscopy using a double aberration-corrected transmission electron microscope.
    Wang P; Behan G; Kirkland AI; Nellist PD; Cosgriff EC; D'Alfonso AJ; Morgan AJ; Allen LJ; Hashimoto A; Takeguchi M; Mitsuishi K; Shimojo M
    Ultramicroscopy; 2011 Jun; 111(7):877-86. PubMed ID: 21093152
    [TBL] [Abstract][Full Text] [Related]  

  • 8. Local sample thickness determination via scanning transmission electron microscopy defocus series.
    Beyer A; Straubinger R; Belz J; Volz K
    J Microsc; 2016 May; 262(2):171-7. PubMed ID: 26224521
    [TBL] [Abstract][Full Text] [Related]  

  • 9. Impact of dynamical scattering on quantitative contrast for aberration-corrected transmission electron microscope images.
    Wen C; Smith DJ
    Micron; 2016 Oct; 89():77-86. PubMed ID: 27522350
    [TBL] [Abstract][Full Text] [Related]  

  • 10. Critical conditions for atomic resolution imaging of molecular crystals by aberration-corrected HRTEM.
    Yoshida K; Biskupek J; Kurata H; Kaiser U
    Ultramicroscopy; 2015 Dec; 159 Pt 1():73-80. PubMed ID: 26334288
    [TBL] [Abstract][Full Text] [Related]  

  • 11. Imaging of light and heavy atomic columns by spherical aberration corrected middle-angle bright-field STEM.
    Ohtsuka M; Yamazaki T; Kotaka Y; Hashimoto I; Watanabe K
    Ultramicroscopy; 2012 Sep; 120():48-55. PubMed ID: 22796559
    [TBL] [Abstract][Full Text] [Related]  

  • 12. Nanohalos: a manifestation of electron channelling in gold nanoparticles.
    Ruben G; Wang P; D'Alfonso AJ; Nellist PD; Allen LJ
    Ultramicroscopy; 2012 Sep; 120():10-5. PubMed ID: 22796554
    [TBL] [Abstract][Full Text] [Related]  

  • 13. Local crystal structure analysis with several picometer precision using scanning transmission electron microscopy.
    Kimoto K; Asaka T; Yu X; Nagai T; Matsui Y; Ishizuka K
    Ultramicroscopy; 2010 Jun; 110(7):778-82. PubMed ID: 20199847
    [TBL] [Abstract][Full Text] [Related]  

  • 14. Integrated contrast-transfer-function for aberration-corrected phase-contrast STEM.
    Seki T; Takanashi N; Abe E
    Ultramicroscopy; 2018 Nov; 194():193-198. PubMed ID: 30170253
    [TBL] [Abstract][Full Text] [Related]  

  • 15. Lattice imaging in low-angle and high-angle bright-field scanning transmission electron microscopy.
    Watanabe K; Kikuchi Y; Yamazaki T; Asano E; Nakanishi N; Kotaka Y; Okunishi E; Hashimoto I
    Acta Crystallogr A; 2004 Nov; 60(Pt 6):591-7. PubMed ID: 15507742
    [TBL] [Abstract][Full Text] [Related]  

  • 16. Extended depth of field for high-resolution scanning transmission electron microscopy.
    Hovden R; Xin HL; Muller DA
    Microsc Microanal; 2011 Feb; 17(1):75-80. PubMed ID: 21122192
    [TBL] [Abstract][Full Text] [Related]  

  • 17. Quantitative annular dark-field STEM images of a silicon crystal using a large-angle convergent electron probe with a 300-kV cold field-emission gun.
    Kim S; Oshima Y; Sawada H; Kaneyama T; Kondo Y; Takeguchi M; Nakayama Y; Tanishiro Y; Takayanagi K
    J Electron Microsc (Tokyo); 2011; 60(2):109-16. PubMed ID: 21247969
    [TBL] [Abstract][Full Text] [Related]  

  • 18. Image simulation for atomic resolution secondary electron image.
    Wu L; Egerton RF; Zhu Y
    Ultramicroscopy; 2012 Dec; 123():66-73. PubMed ID: 22940532
    [TBL] [Abstract][Full Text] [Related]  

  • 19. Study of atomic resolved plasmon-loss image by spherical aberration-corrected STEM-EELS method.
    Yamazaki T; Kotaka Y; Tsukada M; Kataoka Y
    Ultramicroscopy; 2010 Aug; 110(9):1161-5. PubMed ID: 20451326
    [TBL] [Abstract][Full Text] [Related]  

  • 20. Application of two-dimensional crystallography and image processing to atomic resolution Z-contrast images.
    Morgan DG; Ramasse QM; Browning ND
    J Electron Microsc (Tokyo); 2009 Jun; 58(3):223-44. PubMed ID: 19297343
    [TBL] [Abstract][Full Text] [Related]  

    [Next]    [New Search]
    of 12.