These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.
141 related articles for article (PubMed ID: 23594606)
21. Defect-free erbium silicide formation using an ultrathin Ni interlayer. Choi J; Choi S; Kang YS; Na S; Lee HJ; Cho MH; Kim H ACS Appl Mater Interfaces; 2014 Aug; 6(16):14712-7. PubMed ID: 25093916 [TBL] [Abstract][Full Text] [Related]
22. Metal Silicidation in Conjunction with Dopant Segregation: A Promising Strategy for Fabricating High-Performance Silicon-Based Photoanodes. Li S; She G; Xu J; Zhang S; Zhang H; Mu L; Ge C; Jin K; Luo J; Shi W ACS Appl Mater Interfaces; 2020 Sep; 12(35):39092-39097. PubMed ID: 32805824 [TBL] [Abstract][Full Text] [Related]
23. Direct Transition from Ultrathin Orthorhombic Dinickel Silicides to Epitaxial Nickel Disilicide Revealed by In Situ Synthesis and Analysis. Wolf PM; Pitthan E; Zhang Z; Lavoie C; Tran TT; Primetzhofer D Small; 2022 Apr; 18(14):e2106093. PubMed ID: 35191181 [TBL] [Abstract][Full Text] [Related]
24. Real-Time TEM Observation of the Role of Defects on Nickel Silicide Propagation in Silicon Nanowires. Adegoke TE; Bekarevich R; Geaney H; Belochapkine S; Bangert U; Ryan KM ACS Nano; 2024 Apr; 18(14):10270-10278. PubMed ID: 38512077 [TBL] [Abstract][Full Text] [Related]
25. Energy-loss near-edge structure (ELNES) and first-principles calculation of electronic structure of nickel silicide systems. Kawasaki N; Sugiyama N; Otsuka Y; Hashimoto H; Tsujimoto M; Kurata H; Isoda S Ultramicroscopy; 2008 Apr; 108(5):399-406. PubMed ID: 17697750 [TBL] [Abstract][Full Text] [Related]
26. Enhanced Thermionic Emission and Low 1/f Noise in Exfoliated Graphene/GaN Schottky Barrier Diode. Kumar A; Kashid R; Ghosh A; Kumar V; Singh R ACS Appl Mater Interfaces; 2016 Mar; 8(12):8213-23. PubMed ID: 26963627 [TBL] [Abstract][Full Text] [Related]
27. Metal Sheet of Atomic Thickness Embedded in Silicon. Bondarenko LV; Tupchaya AY; Vekovshinin YE; Gruznev DV; Mihalyuk AN; Olyanich DA; Ivanov YP; Matetskiy AV; Zotov AV; Saranin AA ACS Nano; 2021 Dec; 15(12):19357-19363. PubMed ID: 34783543 [TBL] [Abstract][Full Text] [Related]
28. Oxygen distribution in nickel silicide films analyzed by time-of-flight secondary ion mass spectrometry. Kobayashi K; Watanabe H; Maekawa K; Kashihara K; Yamaguchi T; Asai K; Hirose Y Micron; 2010 Jul; 41(5):412-5. PubMed ID: 20347320 [TBL] [Abstract][Full Text] [Related]
29. Electrical characterization of two analogous Schottky contacts produced from N-substituted 1,8-naphthalimide. Karagöz E; Fiat Varol S; Sayın S; Merdan Z Phys Chem Chem Phys; 2018 Dec; 20(48):30502-30513. PubMed ID: 30511079 [TBL] [Abstract][Full Text] [Related]
30. Enhancing silicide formation in Ni/Si(111) by Ag-Si particles at the interface. Chang CH; Jiang PC; Chow YT; Hsiao HL; Su WB; Tsay JS Sci Rep; 2019 Jun; 9(1):8835. PubMed ID: 31222031 [TBL] [Abstract][Full Text] [Related]
31. Linear heterostructured Ni Sheehan M; Ramasse QM; Geaney H; Ryan KM Nanoscale; 2018 Oct; 10(40):19182-19187. PubMed ID: 30302485 [TBL] [Abstract][Full Text] [Related]
33. Optimal Nitrogen Incorporation in Nickel Silicide for Thermally Stable Contact Formation. Ji HM; Nguyen MC; Nguyen AH; Cheon J; Kim JH; Yu KM; Kim SW; Cho SY; Lee JH; Choi R J Nanosci Nanotechnol; 2019 Oct; 19(10):6468-6472. PubMed ID: 31026979 [TBL] [Abstract][Full Text] [Related]
34. Noise Improvement of a-Si Microbolometers by the Post-Metal Annealing Process. Oh J; Song HS; Park J; Lee JK Sensors (Basel); 2021 Oct; 21(20):. PubMed ID: 34695935 [TBL] [Abstract][Full Text] [Related]
35. Dielectric and optical properties of nanometric nickel silicides from valence electrons energy-loss spectroscopy experiments. Cheynet MC; Pantel R Micron; 2006; 37(5):377-84. PubMed ID: 16564176 [TBL] [Abstract][Full Text] [Related]
36. Comparison of Temperature Sensing Performance of 4H-SiC Schottky Barrier Diodes, Junction Barrier Schottky Diodes, and PiN Diodes. Min SJ; Schweitz MA; Nguyen NT; Koo SM J Nanosci Nanotechnol; 2021 Mar; 21(3):2001-2004. PubMed ID: 33404483 [TBL] [Abstract][Full Text] [Related]
37. Electric dipole effect in PdCoO Harada T; Ito S; Tsukazaki A Sci Adv; 2019 Oct; 5(10):eaax5733. PubMed ID: 31667346 [TBL] [Abstract][Full Text] [Related]
38. Observation of iron silicide formation by plan-view transmission electron microscopy. Igarashi S; Haraguchi M; Aihara J; Saito T; Yamaguchi K; Yamamoto H; Hojou K J Electron Microsc (Tokyo); 2004; 53(3):223-8. PubMed ID: 15332648 [TBL] [Abstract][Full Text] [Related]
39. Ni-silicide growth kinetics in Si and Si/SiO2 core/shell nanowires. Ogata K; Sutter E; Zhu X; Hofmann S Nanotechnology; 2011 Sep; 22(36):365305. PubMed ID: 21841219 [TBL] [Abstract][Full Text] [Related]
40. A computational investigation of nickel (silicides) as potential contact layers for silicon photovoltaic cells. Butler KT; Harding JH J Phys Condens Matter; 2013 Oct; 25(39):395003. PubMed ID: 23999021 [TBL] [Abstract][Full Text] [Related] [Previous] [Next] [New Search]