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13. Carrier-Number-Fluctuation Induced Ultralow 1/f Noise Level in Top-Gated Graphene Field Effect Transistor. Peng S; Jin Z; Zhang D; Shi J; Mao D; Wang S; Yu G ACS Appl Mater Interfaces; 2017 Mar; 9(8):6661-6665. PubMed ID: 28176524 [TBL] [Abstract][Full Text] [Related]
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