215 related articles for article (PubMed ID: 24018163)
1. Assessing the precision of strain measurements using electron backscatter diffraction--part 1: detector assessment.
Britton TB; Jiang J; Clough R; Tarleton E; Kirkland AI; Wilkinson AJ
Ultramicroscopy; 2013 Dec; 135():126-35. PubMed ID: 24018163
[TBL] [Abstract][Full Text] [Related]
2. A 3D Hough transform for indexing EBSD and Kossel patterns.
Maurice C; Fortunier R
J Microsc; 2008 Jun; 230(Pt 3):520-9. PubMed ID: 18503678
[TBL] [Abstract][Full Text] [Related]
3. A method for accurate localisation of EBSD pattern centres.
Maurice C; Dzieciol K; Fortunier R
Ultramicroscopy; 2011 Jan; 111(2):140-8. PubMed ID: 21185458
[TBL] [Abstract][Full Text] [Related]
4. Bragg's Law diffraction simulations for electron backscatter diffraction analysis.
Kacher J; Landon C; Adams BL; Fullwood D
Ultramicroscopy; 2009 Aug; 109(9):1148-56. PubMed ID: 19520512
[TBL] [Abstract][Full Text] [Related]
5. Assessing the precision of strain measurements using electron backscatter diffraction--part 2: experimental demonstration.
Britton TB; Jiang J; Clough R; Tarleton E; Kirkland AI; Wilkinson AJ
Ultramicroscopy; 2013 Dec; 135():136-41. PubMed ID: 24034981
[TBL] [Abstract][Full Text] [Related]
6. High-resolution elastic strain measurement from electron backscatter diffraction patterns: new levels of sensitivity.
Wilkinson AJ; Meaden G; Dingley DJ
Ultramicroscopy; 2006 Mar; 106(4-5):307-13. PubMed ID: 16324788
[TBL] [Abstract][Full Text] [Related]
7. Pattern matching analysis of electron backscatter diffraction patterns for pattern centre, crystal orientation and absolute elastic strain determination - accuracy and precision assessment.
Tanaka T; Wilkinson AJ
Ultramicroscopy; 2019 Jul; 202():87-99. PubMed ID: 31005023
[TBL] [Abstract][Full Text] [Related]
8. Limits of simulation based high resolution EBSD.
Alkorta J
Ultramicroscopy; 2013 Aug; 131():33-8. PubMed ID: 23676453
[TBL] [Abstract][Full Text] [Related]
9. Factors affecting the accuracy of high resolution electron backscatter diffraction when using simulated patterns.
Britton TB; Maurice C; Fortunier R; Driver JH; Day AP; Meaden G; Dingley DJ; Mingard K; Wilkinson AJ
Ultramicroscopy; 2010 Nov; 110(12):1443-53. PubMed ID: 20888125
[TBL] [Abstract][Full Text] [Related]
10. Performance of Dynamically Simulated Reference Patterns for Cross-Correlation Electron Backscatter Diffraction.
Jackson BE; Christensen JJ; Singh S; De Graef M; Fullwood DT; Homer ER; Wagoner RH
Microsc Microanal; 2016 Aug; 22(4):789-802. PubMed ID: 27509538
[TBL] [Abstract][Full Text] [Related]
11. Validity of the line-pair bar-pattern method in the measurement of the modulation transfer function (MTF) in megavoltage imaging.
Gopal A; Samant SS
Med Phys; 2008 Jan; 35(1):270-9. PubMed ID: 18293582
[TBL] [Abstract][Full Text] [Related]
12. High resolution electron backscatter diffraction measurements of elastic strain variations in the presence of larger lattice rotations.
Britton TB; Wilkinson AJ
Ultramicroscopy; 2012 Mar; 114():82-95. PubMed ID: 22366635
[TBL] [Abstract][Full Text] [Related]
13. Dynamical electron backscatter diffraction patterns. Part I: pattern simulations.
Callahan PG; De Graef M
Microsc Microanal; 2013 Oct; 19(5):1255-65. PubMed ID: 23800378
[TBL] [Abstract][Full Text] [Related]
14. Assessing strain mapping by electron backscatter diffraction and confocal Raman microscopy using wedge-indented Si.
Friedman LH; Vaudin MD; Stranick SJ; Stan G; Gerbig YB; Osborn W; Cook RF
Ultramicroscopy; 2016 Apr; 163():75-86. PubMed ID: 26939030
[TBL] [Abstract][Full Text] [Related]
15. Surface extraction from multi-material components for metrology using dual energy CT.
Heinzl C; Kastner J; Gröller E
IEEE Trans Vis Comput Graph; 2007; 13(6):1520-7. PubMed ID: 17968105
[TBL] [Abstract][Full Text] [Related]
16. Influence of Noise-Generating Factors on Cross-Correlation Electron Backscatter Diffraction (EBSD) Measurement of Geometrically Necessary Dislocations (GNDs).
Hansen LT; Jackson BE; Fullwood DT; Wright SI; De Graef M; Homer ER; Wagoner RH
Microsc Microanal; 2017 Jun; 23(3):460-471. PubMed ID: 28262082
[TBL] [Abstract][Full Text] [Related]
17. Electron imaging with an EBSD detector.
Wright SI; Nowell MM; de Kloe R; Camus P; Rampton T
Ultramicroscopy; 2015 Jan; 148():132-145. PubMed ID: 25461590
[TBL] [Abstract][Full Text] [Related]
18. Dark-field imaging based on post-processed electron backscatter diffraction patterns of bulk crystalline materials in a scanning electron microscope.
Brodusch N; Demers H; Gauvin R
Ultramicroscopy; 2015 Jan; 148():123-131. PubMed ID: 25461589
[TBL] [Abstract][Full Text] [Related]
19. Comparison of edge analysis techniques for the determination of the MTF of digital radiographic systems.
Samei E; Buhr E; Granfors P; Vandenbroucke D; Wang X
Phys Med Biol; 2005 Aug; 50(15):3613-25. PubMed ID: 16030386
[TBL] [Abstract][Full Text] [Related]
20. Accuracy assessment of elastic strain measurement by EBSD.
Villert S; Maurice C; Wyon C; Fortunier R
J Microsc; 2009 Feb; 233(2):290-301. PubMed ID: 19220695
[TBL] [Abstract][Full Text] [Related]
[Next] [New Search]