These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.


BIOMARKERS

Molecular Biopsy of Human Tumors

- a resource for Precision Medicine *

105 related articles for article (PubMed ID: 24253080)

  • 1. Applicability study of the structure-factor phase method for determining the polarity of binary semiconductors.
    Cao J; Guo C; Zou H
    Acta Crystallogr B Struct Sci Cryst Eng Mater; 2013 Dec; 69(Pt 6):556-62. PubMed ID: 24253080
    [TBL] [Abstract][Full Text] [Related]  

  • 2. Polarity determination of III-V compound semiconductors by large-angle convergent beam electron diffraction.
    Jäger Ch; Spiecker E; Morniroli JP; Jäger W
    Ultramicroscopy; 2002 Aug; 92(3-4):273-83. PubMed ID: 12213029
    [TBL] [Abstract][Full Text] [Related]  

  • 3. Characterization of the Absolute Crystal Polarity across Twin Boundaries in Gallium Phosphide Using Convergent-Beam Electron Diffraction.
    Cohen D; McKernan S; Carter CB
    Microsc Microanal; 1999 May; 5(3):173-186. PubMed ID: 10383990
    [TBL] [Abstract][Full Text] [Related]  

  • 4. Determination of crystal polarity from bend contours in transmission electron microscope images.
    Spiecker E
    Ultramicroscopy; 2002 Aug; 92(3-4):111-32. PubMed ID: 12213013
    [TBL] [Abstract][Full Text] [Related]  

  • 5. Use of quantitative convergent-beam electron diffraction in materials science.
    Holmestad R; Birkeland CR; Marthinsen K; Høier R; Zuo JM
    Microsc Res Tech; 1999 Jul; 46(2):130-45. PubMed ID: 10423558
    [TBL] [Abstract][Full Text] [Related]  

  • 6. Proceedings of the Second Workshop on Theory meets Industry (Erwin-Schrödinger-Institute (ESI), Vienna, Austria, 12-14 June 2007).
    Hafner J
    J Phys Condens Matter; 2008 Feb; 20(6):060301. PubMed ID: 21693862
    [TBL] [Abstract][Full Text] [Related]  

  • 7. Electron microscopy determination of crystallographic polarity of aluminum nitride thin films.
    Kuwano N; Kaur J; Rahmah S
    Micron; 2019 Jan; 116():80-83. PubMed ID: 30321742
    [TBL] [Abstract][Full Text] [Related]  

  • 8. Orientation imaging microscopy with optimized convergence angle using CBED patterns in TEMs.
    Kumar V
    IEEE Trans Image Process; 2013 Jul; 22(7):2637-45. PubMed ID: 23549890
    [TBL] [Abstract][Full Text] [Related]  

  • 9. Position averaged convergent beam electron diffraction: theory and applications.
    Lebeau JM; Findlay SD; Allen LJ; Stemmer S
    Ultramicroscopy; 2010 Jan; 110(2):118-25. PubMed ID: 19939565
    [TBL] [Abstract][Full Text] [Related]  

  • 10. Refinement of the 200 structure factor for GaAs using parallel and convergent beam electron nanodiffraction data.
    Müller K; Schowalter M; Jansen J; Tsuda K; Titantah J; Lamoen D; Rosenauer A
    Ultramicroscopy; 2009 Jun; 109(7):802-14. PubMed ID: 19386419
    [TBL] [Abstract][Full Text] [Related]  

  • 11. Chiral determination: direct interpretation of convergent-beam electron diffraction patterns using the series expansion of Cowley and Moodie.
    Johnson AW
    Acta Crystallogr B; 2007 Aug; 63(Pt 4):511-20. PubMed ID: 17641419
    [TBL] [Abstract][Full Text] [Related]  

  • 12. On the peculiarities of CBED pattern formation revealed by multislice simulation.
    Chuvilin A; Kaiser U
    Ultramicroscopy; 2005 Aug; 104(1):73-82. PubMed ID: 15935917
    [TBL] [Abstract][Full Text] [Related]  

  • 13. Determination of the electrostatic potential and electron density of silicon using convergent-beam electron diffraction.
    Ogata Y; Tsuda K; Tanaka M
    Acta Crystallogr A; 2008 Sep; 64(Pt 5):587-97. PubMed ID: 18708722
    [TBL] [Abstract][Full Text] [Related]  

  • 14. Charge density determination in icosahedral AlPdMn quasicrystal using quantitative convergent beam electron diffraction.
    Yu F; Zou H; Wang J; Wang R
    Micron; 2004; 35(6):411-8. PubMed ID: 15120124
    [TBL] [Abstract][Full Text] [Related]  

  • 15. Comparison of convergent beam electron diffraction and annular bright field atomic imaging for GaN polarity determination.
    Roshko A; Brubaker MD; Blanchard PT; Bertness KA; Harvey TE; Geiss RH; Levin I
    J Mater Res; 2017; 32():. PubMed ID: 31274956
    [TBL] [Abstract][Full Text] [Related]  

  • 16. Three-beam convergent-beam electron diffraction for measuring crystallographic phases.
    Guo Y; Nakashima PNH; Etheridge J
    IUCrJ; 2018 Nov; 5(Pt 6):753-764. PubMed ID: 30443359
    [TBL] [Abstract][Full Text] [Related]  

  • 17. Convergent-beam electron diffraction.
    Tanaka M; Tsuda K
    J Electron Microsc (Tokyo); 2011; 60 Suppl 1():S245-67. PubMed ID: 21844594
    [TBL] [Abstract][Full Text] [Related]  

  • 18. Kinematic and dynamical CBED for solving thin organic films at low temperature; experimental tests with anthracene.
    Wu JS; Spence JC
    Acta Crystallogr A; 2002 Nov; 58(Pt 6):580-9. PubMed ID: 12388877
    [TBL] [Abstract][Full Text] [Related]  

  • 19. Method for determination of the displacement field in patterned nanostructures by TEM/CBED analysis of split high-order Laue zone line profiles.
    Spessot A; Frabboni S; Balboni R; Armigliato A
    J Microsc; 2007 May; 226(Pt 2):140-55. PubMed ID: 17444943
    [TBL] [Abstract][Full Text] [Related]  

  • 20. Determination of mean free path for energy loss and surface oxide film thickness using convergent beam electron diffraction and thickness mapping: a case study using Si and P91 steel.
    Mitchell DR
    J Microsc; 2006 Nov; 224(Pt 2):187-96. PubMed ID: 17204066
    [TBL] [Abstract][Full Text] [Related]  

    [Next]    [New Search]
    of 6.