These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.


BIOMARKERS

Molecular Biopsy of Human Tumors

- a resource for Precision Medicine *

341 related articles for article (PubMed ID: 24289403)

  • 1. Accurate spring constant calibration for very stiff atomic force microscopy cantilevers.
    Grutzik SJ; Gates RS; Gerbig YB; Smith DT; Cook RF; Zehnder AT
    Rev Sci Instrum; 2013 Nov; 84(11):113706. PubMed ID: 24289403
    [TBL] [Abstract][Full Text] [Related]  

  • 2. Accurate measurement of Atomic Force Microscope cantilever deflection excluding tip-surface contact with application to force calibration.
    Slattery AD; Blanch AJ; Quinton JS; Gibson CT
    Ultramicroscopy; 2013 Aug; 131():46-55. PubMed ID: 23685172
    [TBL] [Abstract][Full Text] [Related]  

  • 3. Calibration of atomic force microscope cantilevers using standard and inverted static methods assisted by FIB-milled spatial markers.
    Slattery AD; Blanch AJ; Quinton JS; Gibson CT
    Nanotechnology; 2013 Jan; 24(1):015710. PubMed ID: 23220746
    [TBL] [Abstract][Full Text] [Related]  

  • 4. Influence of Poisson's ratio variation on lateral spring constant of atomic force microscopy cantilevers.
    Yeh MK; Tai NH; Chen BY
    Ultramicroscopy; 2008 Sep; 108(10):1025-9. PubMed ID: 18547729
    [TBL] [Abstract][Full Text] [Related]  

  • 5. Precise atomic force microscope cantilever spring constant calibration using a reference cantilever array.
    Gates RS; Reitsma MG
    Rev Sci Instrum; 2007 Aug; 78(8):086101. PubMed ID: 17764361
    [TBL] [Abstract][Full Text] [Related]  

  • 6. Atomic force microscope cantilever calibration using a focused ion beam.
    Slattery AD; Quinton JS; Gibson CT
    Nanotechnology; 2012 Jul; 23(28):285704. PubMed ID: 22728463
    [TBL] [Abstract][Full Text] [Related]  

  • 7. Spring constant calibration of atomic force microscopy cantilevers with a piezosensor transfer standard.
    Langlois ED; Shaw GA; Kramar JA; Pratt JR; Hurley DC
    Rev Sci Instrum; 2007 Sep; 78(9):093705. PubMed ID: 17902953
    [TBL] [Abstract][Full Text] [Related]  

  • 8. Calibration of the spring constant of cantilevers of arbitrary shape using the phase signal in an atomic force microscope.
    Rawlings C; Durkan C
    Nanotechnology; 2012 Dec; 23(48):485708. PubMed ID: 23137943
    [TBL] [Abstract][Full Text] [Related]  

  • 9. Atomic Force Microscope Cantilever Flexural Stiffness Calibration: Toward a Standard Traceable Method.
    Gates RS; Reitsma MG; Kramar JA; Pratt JR
    J Res Natl Inst Stand Technol; 2011; 116(4):703-27. PubMed ID: 26989594
    [TBL] [Abstract][Full Text] [Related]  

  • 10. Accurate analytical measurements in the atomic force microscope: a microfabricated spring constant standard potentially traceable to the SI.
    Cumpson PJ; Hedley J
    Nanotechnology; 2003 Dec; 14(12):1279-88. PubMed ID: 21444981
    [TBL] [Abstract][Full Text] [Related]  

  • 11. Study of thermal and acoustic noise interferences in low stiffness atomic force microscope cantilevers and characterization of their dynamic properties.
    Boudaoud M; Haddab Y; Le Gorrec Y; Lutz P
    Rev Sci Instrum; 2012 Jan; 83(1):013704. PubMed ID: 22299959
    [TBL] [Abstract][Full Text] [Related]  

  • 12. Calibration of AFM cantilever stiffness: a microfabricated array of reflective springs.
    Cumpson PJ; Zhdan P; Hedley J
    Ultramicroscopy; 2004 Aug; 100(3-4):241-51. PubMed ID: 15231316
    [TBL] [Abstract][Full Text] [Related]  

  • 13. Characterizing the free and surface-coupled vibrations of heated-tip atomic force microscope cantilevers.
    Killgore JP; Tung RC; Hurley DC
    Nanotechnology; 2014 Aug; 25(34):345701. PubMed ID: 25098183
    [TBL] [Abstract][Full Text] [Related]  

  • 14. Effects of anisotropic material property on the spring constant and the resonant frequency of atomic force microscope cantilever.
    Yeh MK; Tai NH; Chen BY
    Rev Sci Instrum; 2009 Apr; 80(4):043705. PubMed ID: 19405664
    [TBL] [Abstract][Full Text] [Related]  

  • 15. Accuracy of the spring constant of atomic force microscopy cantilevers by finite element method.
    Chen BY; Yeh MK; Tai NH
    Anal Chem; 2007 Feb; 79(4):1333-8. PubMed ID: 17297931
    [TBL] [Abstract][Full Text] [Related]  

  • 16. Spring constant calibration techniques for next-generation fast-scanning atomic force microscope cantilevers.
    Slattery AD; Blanch AJ; Ejov V; Quinton JS; Gibson CT
    Nanotechnology; 2014 Aug; 25(33):335705. PubMed ID: 25074581
    [TBL] [Abstract][Full Text] [Related]  

  • 17. Calibration of atomic force microscope cantilevers using piezolevers.
    Aksu SB; Turner JA
    Rev Sci Instrum; 2007 Apr; 78(4):043704. PubMed ID: 17477667
    [TBL] [Abstract][Full Text] [Related]  

  • 18. Wide cantilever stiffness range cavity optomechanical sensors for atomic force microscopy.
    Liu Y; Miao H; Aksyuk V; Srinivasan K
    Opt Express; 2012 Jul; 20(16):18268-80. PubMed ID: 23038376
    [TBL] [Abstract][Full Text] [Related]  

  • 19. Accurate and precise calibration of AFM cantilever spring constants using laser Doppler vibrometry.
    Gates RS; Pratt JR
    Nanotechnology; 2012 Sep; 23(37):375702. PubMed ID: 22922668
    [TBL] [Abstract][Full Text] [Related]  

  • 20. Interlaboratory round robin on cantilever calibration for AFM force spectroscopy.
    te Riet J; Katan AJ; Rankl C; Stahl SW; van Buul AM; Phang IY; Gomez-Casado A; Schön P; Gerritsen JW; Cambi A; Rowan AE; Vancso GJ; Jonkheijm P; Huskens J; Oosterkamp TH; Gaub H; Hinterdorfer P; Figdor CG; Speller S
    Ultramicroscopy; 2011 Dec; 111(12):1659-69. PubMed ID: 22094372
    [TBL] [Abstract][Full Text] [Related]  

    [Next]    [New Search]
    of 18.