These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.


BIOMARKERS

Molecular Biopsy of Human Tumors

- a resource for Precision Medicine *

103 related articles for article (PubMed ID: 24295799)

  • 1. Height drift correction in non-raster atomic force microscopy.
    Meyer TR; Ziegler D; Brune C; Chen A; Farnham R; Huynh N; Chang JM; Bertozzi AL; Ashby PD
    Ultramicroscopy; 2014 Feb; 137():48-54. PubMed ID: 24295799
    [TBL] [Abstract][Full Text] [Related]  

  • 2. A continuous sampling pattern design algorithm for atomic force microscopy images.
    Luo Y; Andersson SB
    Ultramicroscopy; 2019 Jan; 196():167-179. PubMed ID: 30412842
    [TBL] [Abstract][Full Text] [Related]  

  • 3. Reconstruction of a scanned topographic image distorted by the creep effect of a Z scanner in atomic force microscopy.
    Han C; Chung CC
    Rev Sci Instrum; 2011 May; 82(5):053709. PubMed ID: 21639509
    [TBL] [Abstract][Full Text] [Related]  

  • 4. Correction of distortion due to thermal drift in scanning probe microscopy.
    Salmons BS; Katz DR; Trawick ML
    Ultramicroscopy; 2010 Mar; 110(4):339-49. PubMed ID: 20149540
    [TBL] [Abstract][Full Text] [Related]  

  • 5.
    Dickbreder T; Sabath F; Höltkemeier L; Bechstein R; Kühnle A
    Beilstein J Nanotechnol; 2023; 14():1225-1237. PubMed ID: 38170148
    [TBL] [Abstract][Full Text] [Related]  

  • 6. Software for drift compensation, particle tracking and particle analysis of high-speed atomic force microscopy image series.
    Husain M; Boudier T; Paul-Gilloteaux P; Casuso I; Scheuring S
    J Mol Recognit; 2012 May; 25(5):292-8. PubMed ID: 22528191
    [TBL] [Abstract][Full Text] [Related]  

  • 7. Revolving scanning transmission electron microscopy: correcting sample drift distortion without prior knowledge.
    Sang X; LeBeau JM
    Ultramicroscopy; 2014 Mar; 138():28-35. PubMed ID: 24444498
    [TBL] [Abstract][Full Text] [Related]  

  • 8. Correcting nonlinear drift distortion of scanning probe and scanning transmission electron microscopies from image pairs with orthogonal scan directions.
    Ophus C; Ciston J; Nelson CT
    Ultramicroscopy; 2016 Mar; 162():1-9. PubMed ID: 26716724
    [TBL] [Abstract][Full Text] [Related]  

  • 9. High-stroke silicon-on-insulator MEMS nanopositioner: control design for non-raster scan atomic force microscopy.
    Maroufi M; Fowler AG; Bazaei A; Moheimani SO
    Rev Sci Instrum; 2015 Feb; 86(2):023705. PubMed ID: 25725850
    [TBL] [Abstract][Full Text] [Related]  

  • 10. Evaluation of different rectangular scan strategies for STEM imaging.
    Velazco A; Nord M; Béché A; Verbeeck J
    Ultramicroscopy; 2020 Aug; 215():113021. PubMed ID: 32485392
    [TBL] [Abstract][Full Text] [Related]  

  • 11. Three-axis correction of distortion due to positional drift in scanning probe microscopy.
    Follin ND; Taylor KD; Musalo CJ; Trawick ML
    Rev Sci Instrum; 2012 Aug; 83(8):083711. PubMed ID: 22938307
    [TBL] [Abstract][Full Text] [Related]  

  • 12. High-speed cycloid-scan atomic force microscopy.
    Yong YK; Moheimani SO; Petersen IR
    Nanotechnology; 2010 Sep; 21(36):365503. PubMed ID: 20705972
    [TBL] [Abstract][Full Text] [Related]  

  • 13. High-speed Lissajous-scan atomic force microscopy: scan pattern planning and control design issues.
    Bazaei A; Yong YK; Moheimani SO
    Rev Sci Instrum; 2012 Jun; 83(6):063701. PubMed ID: 22755628
    [TBL] [Abstract][Full Text] [Related]  

  • 14. Drift-free atomic force microscopy measurements of cell height and mechanical properties.
    Spagnoli C; Beyder A; Besch SR; Sachs F
    Rev Sci Instrum; 2007 Mar; 78(3):036111. PubMed ID: 17411236
    [TBL] [Abstract][Full Text] [Related]  

  • 15. Limitations on accurate shape determination using amplitude modulation atomic force microscopy.
    Eves BJ; Green RG
    Ultramicroscopy; 2012 Apr; 115():14-20. PubMed ID: 22459113
    [TBL] [Abstract][Full Text] [Related]  

  • 16. Flexible drift-compensation system for precise 3D force mapping in severe drift environments.
    Rahe P; Schütte J; Schniederberend W; Reichling M; Abe M; Sugimoto Y; Kühnle A
    Rev Sci Instrum; 2011 Jun; 82(6):063704. PubMed ID: 21721699
    [TBL] [Abstract][Full Text] [Related]  

  • 17. Real-time scanning charged-particle microscope image composition with correction of drift.
    Cizmar P; Vladár AE; Postek MT
    Microsc Microanal; 2011 Apr; 17(2):302-8. PubMed ID: 21122194
    [TBL] [Abstract][Full Text] [Related]  

  • 18. Fast spiral-scan atomic force microscopy.
    Mahmood IA; Moheimani SO
    Nanotechnology; 2009 Sep; 20(36):365503. PubMed ID: 19687553
    [TBL] [Abstract][Full Text] [Related]  

  • 19. Precision controlled atomic resolution scanning transmission electron microscopy using spiral scan pathways.
    Sang X; Lupini AR; Ding J; Kalinin SV; Jesse S; Unocic RR
    Sci Rep; 2017 Mar; 7():43585. PubMed ID: 28272404
    [TBL] [Abstract][Full Text] [Related]  

  • 20. Assessing the structure and function of single biomolecules with scanning transmission electron and atomic force microscopes.
    Müller SA; Müller DJ; Engel A
    Micron; 2011 Feb; 42(2):186-95. PubMed ID: 21087869
    [TBL] [Abstract][Full Text] [Related]  

    [Next]    [New Search]
    of 6.