These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.


BIOMARKERS

Molecular Biopsy of Human Tumors

- a resource for Precision Medicine *

133 related articles for article (PubMed ID: 24347744)

  • 1. Retrospective sputter depth profiling using 3D mass spectral imaging.
    Zheng L; Wucher A; Winograd N
    Surf Interface Anal; 2011 Feb; 43(1-2):. PubMed ID: 24347744
    [TBL] [Abstract][Full Text] [Related]  

  • 2. 3D ToF-SIMS imaging of polymer multilayer films using argon cluster sputter depth profiling.
    Bailey J; Havelund R; Shard AG; Gilmore IS; Alexander MR; Sharp JS; Scurr DJ
    ACS Appl Mater Interfaces; 2015 Feb; 7(4):2654-9. PubMed ID: 25562665
    [TBL] [Abstract][Full Text] [Related]  

  • 3. Molecular depth profiling of multilayer polymer films using time-of-flight secondary ion mass spectrometry.
    Wagner MS
    Anal Chem; 2005 Feb; 77(3):911-22. PubMed ID: 15679361
    [TBL] [Abstract][Full Text] [Related]  

  • 4. Fundamental studies of molecular depth profiling and 3D imaging using Langmuir-Blodgett films as a model.
    Zheng L; Wucher A; Winograd N
    Appl Surf Sci; 2008 Dec; 255(4):816-818. PubMed ID: 19551160
    [TBL] [Abstract][Full Text] [Related]  

  • 5. Depth profiling of metal overlayers on organic substrates with cluster SIMS.
    Shen K; Mao D; Garrison BJ; Wucher A; Winograd N
    Anal Chem; 2013 Nov; 85(21):10565-72. PubMed ID: 24070427
    [TBL] [Abstract][Full Text] [Related]  

  • 6. Large O
    Holzer S; Krivec S; Kayser S; Zakel J; Hutter H
    Anal Chem; 2017 Feb; 89(4):2377-2382. PubMed ID: 28192950
    [TBL] [Abstract][Full Text] [Related]  

  • 7. Deep depth profiling using gas cluster secondary ion mass spectrometry: Micrometer topography development and effects on depth resolution.
    Muramoto S; Graham D
    Surf Interface Anal; 2021 Sep; 53(9):814-823. PubMed ID: 35478693
    [TBL] [Abstract][Full Text] [Related]  

  • 8. Fundamental studies of molecular depth profiling using organic delta layers as model systems.
    Lu C; Wucher A; Winograd N
    Surf Interface Anal; 2011 Jan; 43(1-2):. PubMed ID: 24347743
    [TBL] [Abstract][Full Text] [Related]  

  • 9. Depth profiling cross-linked poly(methyl methacrylate) films: a time-of-flight secondary ion mass spectrometry approach.
    Naderi-Gohar S; Huang KM; Wu Y; Lau WM; Nie HY
    Rapid Commun Mass Spectrom; 2017 Feb; 31(4):381-388. PubMed ID: 27933719
    [TBL] [Abstract][Full Text] [Related]  

  • 10. Three-dimensional depth profiling of molecular structures.
    Wucher A; Cheng J; Zheng L; Winograd N
    Anal Bioanal Chem; 2009 Apr; 393(8):1835-42. PubMed ID: 19153718
    [TBL] [Abstract][Full Text] [Related]  

  • 11. Depth resolution during C60+ profiling of multilayer molecular films.
    Zheng L; Wucher A; Winograd N
    Anal Chem; 2008 Oct; 80(19):7363-71. PubMed ID: 18778034
    [TBL] [Abstract][Full Text] [Related]  

  • 12. Molecular sputter depth profiling using carbon cluster beams.
    Wucher A; Winograd N
    Anal Bioanal Chem; 2010 Jan; 396(1):105-14. PubMed ID: 19649771
    [TBL] [Abstract][Full Text] [Related]  

  • 13. Dual beam organic depth profiling using large argon cluster ion beams.
    Holzweber M; Shard AG; Jungnickel H; Luch A; Unger W
    Surf Interface Anal; 2014; 46(10-11):936-939. PubMed ID: 25892830
    [TBL] [Abstract][Full Text] [Related]  

  • 14. Nitric oxide assisted C60 secondary ion mass spectrometry for molecular depth profiling of polyelectrolyte multilayers.
    Zappalà G; Motta V; Tuccitto N; Vitale S; Torrisi A; Licciardello A
    Rapid Commun Mass Spectrom; 2015 Dec; 29(23):2204-10. PubMed ID: 26522311
    [TBL] [Abstract][Full Text] [Related]  

  • 15. ToF-SIMS Depth Profiling of PS-b-PMMA Block Copolymers Using Ar
    Terlier T; Zappalà G; Marie C; Leonard D; Barnes JP; Licciardello A
    Anal Chem; 2017 Jul; 89(13):6984-6991. PubMed ID: 28617583
    [TBL] [Abstract][Full Text] [Related]  

  • 16. Dealing with image shifting in 3D ToF-SIMS depth profiles.
    Graham DJ; Gamble LJ
    Biointerphases; 2018 Sep; 13(6):06E402. PubMed ID: 30185054
    [TBL] [Abstract][Full Text] [Related]  

  • 17. Improving secondary ion mass spectrometry C60(n+) sputter depth profiling of challenging polymers with nitric oxide gas dosing.
    Havelund R; Licciardello A; Bailey J; Tuccitto N; Sapuppo D; Gilmore IS; Sharp JS; Lee JL; Mouhib T; Delcorte A
    Anal Chem; 2013 May; 85(10):5064-70. PubMed ID: 23590425
    [TBL] [Abstract][Full Text] [Related]  

  • 18. Molecular depth profiling of buried lipid bilayers using C(60)-secondary ion mass spectrometry.
    Lu C; Wucher A; Winograd N
    Anal Chem; 2011 Jan; 83(1):351-8. PubMed ID: 21121691
    [TBL] [Abstract][Full Text] [Related]  

  • 19. Chemically alternating Langmuir-Blodgett thin films as a model for molecular depth profiling by mass spectrometry.
    Zheng L; Wucher A; Winograd N
    J Am Soc Mass Spectrom; 2008 Jan; 19(1):96-102. PubMed ID: 18293488
    [TBL] [Abstract][Full Text] [Related]  

  • 20. Depth profiling of Langmuir-Blodgett films with a buckminsterfullerene probe.
    Sostarecz AG; McQuaw CM; Wucher A; Winograd N
    Anal Chem; 2004 Nov; 76(22):6651-8. PubMed ID: 15538789
    [TBL] [Abstract][Full Text] [Related]  

    [Next]    [New Search]
    of 7.