484 related articles for article (PubMed ID: 24576405)
1. Orientation precision of electron backscatter diffraction measurements near grain boundaries.
Wright SI; Nowell MM; de Kloe R; Chan L
Microsc Microanal; 2014 Jun; 20(3):852-63. PubMed ID: 24576405
[TBL] [Abstract][Full Text] [Related]
2. Evaluating Deformation-Induced Grain Orientation Change in a Polycrystal During In Situ Tensile Deformation using EBSD.
Buchheit TE; Carroll JD; Clark BG; Boyce BL
Microsc Microanal; 2015 Aug; 21(4):969-84. PubMed ID: 26189352
[TBL] [Abstract][Full Text] [Related]
3. Study of recovery and first recrystallisation kinetics in CGO Fe3%Si steels using misorientation-derived parameters (EBSD).
Cruz-Gandarilla F; Bolmaro RE; Mendoza-León HF; Salcedo-Garrido AM; Cabañas-Moreno JG
J Microsc; 2019 Sep; 275(3):133-148. PubMed ID: 31271444
[TBL] [Abstract][Full Text] [Related]
4. Visualization of grain subdivision by analysing the misorientations within a grain using electron backscatter diffraction.
Van Boxel S; Seefeldt M; Verlinden B; Van Houtte P
J Microsc; 2005 May; 218(Pt 2):104-14. PubMed ID: 15857372
[TBL] [Abstract][Full Text] [Related]
5. First combined electron backscatter diffraction and transmission electron microscopy study of grain boundary structure of deformed quartzite.
Shigematsu N; Prior DJ; Wheeler J
J Microsc; 2006 Dec; 224(Pt 3):306-21. PubMed ID: 17210063
[TBL] [Abstract][Full Text] [Related]
6. Misorientation/local plastic strain manifestations in chemical etching color.
Zhang X; Matsuura K; Ohno M
Micron; 2014 Apr; 59():28-32. PubMed ID: 24530362
[TBL] [Abstract][Full Text] [Related]
7. In situ determination of misorientation angle of grain boundary by field ion microscopy analysis.
Takahashi J; Kawakami K; Kobayashi Y
Ultramicroscopy; 2014 May; 140():20-5. PubMed ID: 24607606
[TBL] [Abstract][Full Text] [Related]
8. The characterization of low-angle boundaries by EBSD.
Bate PS; Knutsen RD; Brough I; Humphreys FJ
J Microsc; 2005 Oct; 220(Pt 1):36-46. PubMed ID: 16269062
[TBL] [Abstract][Full Text] [Related]
9. Orientation effects on indexing of electron backscatter diffraction patterns.
Nowell MM; Wright SI
Ultramicroscopy; 2005 Apr; 103(1):41-58. PubMed ID: 15777599
[TBL] [Abstract][Full Text] [Related]
10. The interpretation of indexing of high Sigma CSL grain boundaries from ceramics.
Shih SJ; Park MB; Cockayne DJ
J Microsc; 2007 Sep; 227(Pt 3):309-14. PubMed ID: 17760628
[TBL] [Abstract][Full Text] [Related]
11. EBSD and TEM investigation of the hot deformation substructure characteristics of a type 316L austenitic stainless steel.
Cizek P; Whiteman JA; Rainforth WM; Beynon JH
J Microsc; 2004 Mar; 213(3):285-95. PubMed ID: 15009696
[TBL] [Abstract][Full Text] [Related]
12. Dependence of the electron beam energy and types of surface to determine EBSD indexing reliability in yttria-stabilized zirconia.
Saraf LV
Microsc Microanal; 2012 Apr; 18(2):371-8. PubMed ID: 22336075
[TBL] [Abstract][Full Text] [Related]
13. Evolution of local misorientations in the γ/γ'-microstructure of single crystal superalloys during creep studied with the rotation vector baseline (RVB) EBSD method.
Gamanov S; Dlouhy A; Bürger D; Eggeler G; Thome P
Microsc Res Tech; 2024 Mar; 87(3):516-533. PubMed ID: 37937744
[TBL] [Abstract][Full Text] [Related]
14. The use of combined cathodoluminescence and EBSD analysis: a case study investigating grain boundary migration mechanisms in quartz.
Piazolo S; Prior DJ; Holness MD
J Microsc; 2005 Feb; 217(Pt 2):152-61. PubMed ID: 15683412
[TBL] [Abstract][Full Text] [Related]
15. An automated method of quantifying ferrite microstructures using electron backscatter diffraction (EBSD) data.
Shrestha SL; Breen AJ; Trimby P; Proust G; Ringer SP; Cairney JM
Ultramicroscopy; 2014 Feb; 137():40-7. PubMed ID: 24291695
[TBL] [Abstract][Full Text] [Related]
16. Low angle boundary migration of shot-peened pure nickel investigated by electron channeling contrast imaging and electron backscatter diffraction.
Oh JS; Cha HW; Kim TH; Shin K; Yang CW
Microsc Res Tech; 2019 Jun; 82(6):849-855. PubMed ID: 30689247
[TBL] [Abstract][Full Text] [Related]
17. Problems in determining the misorientation axes, for small angular misorientations, using electron backscatter diffraction in the SEM.
Prior DJ
J Microsc; 1999 Sep; 195(3):217-225. PubMed ID: 10460687
[TBL] [Abstract][Full Text] [Related]
18. The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements.
Tong V; Jiang J; Wilkinson AJ; Britton TB
Ultramicroscopy; 2015 Aug; 155():62-73. PubMed ID: 25957534
[TBL] [Abstract][Full Text] [Related]
19. Misorientation distributions in hot deformed NaCl using electron backscattered diffraction.
Pennock GM; Drury MR; Trimby PW; Spiers CJ
J Microsc; 2002 Mar; 205(Pt 3):285-94. PubMed ID: 11996193
[TBL] [Abstract][Full Text] [Related]
20. A Dictionary Approach to Electron Backscatter Diffraction Indexing.
Chen YH; Park SU; Wei D; Newstadt G; Jackson MA; Simmons JP; De Graef M; Hero AO
Microsc Microanal; 2015 Jun; 21(3):739-52. PubMed ID: 26055190
[TBL] [Abstract][Full Text] [Related]
[Next] [New Search]
