These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.
173 related articles for article (PubMed ID: 24767093)
1. Successful application of Low Voltage Electron Microscopy to practical materials problems. Bell DC; Mankin M; Day RW; Erdman N Ultramicroscopy; 2014 Oct; 145():56-65. PubMed ID: 24767093 [TBL] [Abstract][Full Text] [Related]
3. Choice of operating voltage for a transmission electron microscope. Egerton RF Ultramicroscopy; 2014 Oct; 145():85-93. PubMed ID: 24679438 [TBL] [Abstract][Full Text] [Related]
4. Electron microscopy of organic-inorganic interfaces: advantages of low voltage. Drummy LF Ultramicroscopy; 2014 Oct; 145():74-9. PubMed ID: 24912848 [TBL] [Abstract][Full Text] [Related]
5. Atomic and nanoscale imaging of a cellulose nanofiber and Pd nanoparticles composite using lower-voltage high-resolution TEM. Ohwada M; Mizukoshi Y; Shimokawa T; Hayashi N; Hayasaka Y; Konno TJ Microscopy (Oxf); 2017 Oct; 66(5):348-355. PubMed ID: 29016921 [TBL] [Abstract][Full Text] [Related]
6. Sub-angstrom low-voltage performance of a monochromated, aberration-corrected transmission electron microscope. Bell DC; Russo CJ; Benner G Microsc Microanal; 2010 Aug; 16(4):386-92. PubMed ID: 20598206 [TBL] [Abstract][Full Text] [Related]
7. Mechanisms of radiation damage in beam-sensitive specimens, for TEM accelerating voltages between 10 and 300 kV. Egerton RF Microsc Res Tech; 2012 Nov; 75(11):1550-6. PubMed ID: 22807142 [TBL] [Abstract][Full Text] [Related]
8. Optimal accelerating voltage for HRTEM imaging of zeolite. Yoshida K; Sasaki Y Microscopy (Oxf); 2013 Jun; 62(3):369-75. PubMed ID: 23243098 [TBL] [Abstract][Full Text] [Related]
9. Lattice imaging at an accelerating voltage of 30kV using an in-lens type cold field-emission scanning electron microscope. Konno M; Ogashiwa T; Sunaoshi T; Orai Y; Sato M Ultramicroscopy; 2014 Oct; 145():28-35. PubMed ID: 24290787 [TBL] [Abstract][Full Text] [Related]
10. Impact excitation and electron-hole multiplication in graphene and carbon nanotubes. Gabor NM Acc Chem Res; 2013 Jun; 46(6):1348-57. PubMed ID: 23369453 [TBL] [Abstract][Full Text] [Related]
11. Atomic-Resolution STEM Imaging of Graphene at Low Voltage of 30 kV with Resolution Enhancement by Using Large Convergence Angle. Sawada H; Sasaki T; Hosokawa F; Suenaga K Phys Rev Lett; 2015 Apr; 114(16):166102. PubMed ID: 25955058 [TBL] [Abstract][Full Text] [Related]
12. Future trends in aberration-corrected electron microscopy. Rose HH Philos Trans A Math Phys Eng Sci; 2009 Sep; 367(1903):3809-23. PubMed ID: 19687067 [TBL] [Abstract][Full Text] [Related]
13. Imaging and analysis of nanowires. Bell DC; Wu Y; Barrelet CJ; Gradecak S; Xiang J; Timko BP; Lieber CM Microsc Res Tech; 2004 Aug; 64(5-6):373-89. PubMed ID: 15549698 [TBL] [Abstract][Full Text] [Related]
14. Performance of low-voltage STEM/TEM with delta corrector and cold field emission gun. Sasaki T; Sawada H; Hosokawa F; Kohno Y; Tomita T; Kaneyama T; Kondo Y; Kimoto K; Sato Y; Suenaga K J Electron Microsc (Tokyo); 2010 Aug; 59 Suppl 1():S7-13. PubMed ID: 20581425 [TBL] [Abstract][Full Text] [Related]
15. Low-voltage electron microscopy of polymer and organic molecular thin films. Drummy LF; Yang J; Martin DC Ultramicroscopy; 2004 Jun; 99(4):247-56. PubMed ID: 15149719 [TBL] [Abstract][Full Text] [Related]
16. Low-voltage and high-voltage TEM observations on MWCNTs of rat in vivo. Sakaguchi N; Watari F; Yokoyama A; Nodasaka Y; Ichinose H Biomed Mater Eng; 2009; 19(2-3):93-9. PubMed ID: 19581702 [TBL] [Abstract][Full Text] [Related]
18. Transmission electron microscopy at 20 kV for imaging and spectroscopy. Kaiser U; Biskupek J; Meyer JC; Leschner J; Lechner L; Rose H; Stöger-Pollach M; Khlobystov AN; Hartel P; Müller H; Haider M; Eyhusen S; Benner G Ultramicroscopy; 2011 Jul; 111(8):1239-46. PubMed ID: 21801697 [TBL] [Abstract][Full Text] [Related]
19. Backscattered electron imaging for high resolution surface scanning electron microscopy with a new type YAG-detector. Walther P; Autrata R; Chen Y; Pawley JB Scanning Microsc; 1991 Jun; 5(2):301-9; discussion 310. PubMed ID: 1947922 [TBL] [Abstract][Full Text] [Related]
20. Electron irradiation-induced destruction of carbon nanotubes in electron microscopes. Mølhave K; Gudnason SB; Pedersen AT; Clausen CH; Horsewell A; Bøggild P Ultramicroscopy; 2007 Dec; 108(1):52-7. PubMed ID: 17445986 [TBL] [Abstract][Full Text] [Related] [Next] [New Search]