150 related articles for article (PubMed ID: 25128756)
1. Enhanced contrast separation in scanning electron microscopes via a suspended-thin sample approach.
Ji Y; Wang L; Guo Z; Wei B; Zhao J; Wang X; Zhang Y; Sui M; Han X
Ultramicroscopy; 2014 Nov; 146():83-90. PubMed ID: 25128756
[TBL] [Abstract][Full Text] [Related]
2. Scanning electron microscopy imaging of dislocations in bulk materials, using electron channeling contrast.
Crimp MA
Microsc Res Tech; 2006 May; 69(5):374-81. PubMed ID: 16646010
[TBL] [Abstract][Full Text] [Related]
3. Diffraction effects and inelastic electron transport in angle-resolved microscopic imaging applications.
Winkelmann A; Nolze G; Vespucci S; Naresh-Kumar G; Trager-Cowan C; Vilalta-Clemente A; Wilkinson AJ; Vos M
J Microsc; 2017 Sep; 267(3):330-346. PubMed ID: 28474742
[TBL] [Abstract][Full Text] [Related]
4. Backscattered electron imaging for high resolution surface scanning electron microscopy with a new type YAG-detector.
Walther P; Autrata R; Chen Y; Pawley JB
Scanning Microsc; 1991 Jun; 5(2):301-9; discussion 310. PubMed ID: 1947922
[TBL] [Abstract][Full Text] [Related]
5. Electron beam broadening in electron-transparent samples at low electron energies.
Hugenschmidt M; Müller E; Gerthsen D
J Microsc; 2019 Jun; 274(3):150-157. PubMed ID: 31001840
[TBL] [Abstract][Full Text] [Related]
6. Principles of depth-resolved Kikuchi pattern simulation for electron backscatter diffraction.
Winkelmann A
J Microsc; 2010 Jul; 239(1):32-45. PubMed ID: 20579267
[TBL] [Abstract][Full Text] [Related]
7. On Low Voltage Scanning Electron Microscopy and Chemical Microanalysis.
Boyes ED
Microsc Microanal; 2000 Jul; 6(4):307-316. PubMed ID: 10898813
[TBL] [Abstract][Full Text] [Related]
8. Inelastic Scattering in Electron Backscatter Diffraction and Electron Channeling Contrast Imaging.
Mendis BG; Barthel J; Findlay SD; Allen LJ
Microsc Microanal; 2020 Dec; 26(6):1147-1157. PubMed ID: 33190677
[TBL] [Abstract][Full Text] [Related]
9. Quantitative analysis of angle-selective backscattering electron image of iron oxide and steel.
Aoyama T; Nagoshi M; Sato K
Microscopy (Oxf); 2015 Oct; 64(5):319-25. PubMed ID: 26048983
[TBL] [Abstract][Full Text] [Related]
10. FIB-SEM cathodoluminescence tomography: practical and theoretical considerations.
De Winter DA; Lebbink MN; Wiggers De Vries DF; Post JA; Drury MR
J Microsc; 2011 Sep; 243(3):315-26. PubMed ID: 21692799
[TBL] [Abstract][Full Text] [Related]
11. Ionic liquid-based observation technique for nonconductive materials in the scanning electron microscope: Application to the characterization of a rare earth ore.
Brodusch N; Waters K; Demers H; Gauvin R
Microsc Res Tech; 2014 Mar; 77(3):225-35. PubMed ID: 24390705
[TBL] [Abstract][Full Text] [Related]
12. Analysis of Kikuchi band contrast reversal in electron backscatter diffraction patterns of silicon.
Winkelmann A; Nolze G
Ultramicroscopy; 2010 Feb; 110(3):190-4. PubMed ID: 20005045
[TBL] [Abstract][Full Text] [Related]
13. On the Progress of Scanning Transmission Electron Microscopy (STEM) Imaging in a Scanning Electron Microscope.
Sun C; Müller E; Meffert M; Gerthsen D
Microsc Microanal; 2018 Apr; 24(2):99-106. PubMed ID: 29589573
[TBL] [Abstract][Full Text] [Related]
14. Composition quantification of electron-transparent samples by backscattered electron imaging in scanning electron microscopy.
Müller E; Gerthsen D
Ultramicroscopy; 2017 Feb; 173():71-75. PubMed ID: 27940341
[TBL] [Abstract][Full Text] [Related]
15. Backscattered electron SEM imaging of cells and determination of the information depth.
Seiter J; Müller E; Blank H; Gehrke H; Marko D; Gerthsen D
J Microsc; 2014 May; 254(2):75-83. PubMed ID: 24650037
[TBL] [Abstract][Full Text] [Related]
16. Analyzing indirect secondary electron contrast of unstained bacteriophage T4 based on SEM images and Monte Carlo simulations.
Ogura T
Biochem Biophys Res Commun; 2009 Mar; 380(2):254-9. PubMed ID: 19166816
[TBL] [Abstract][Full Text] [Related]
17. The role of localized recoil in the formation of Kikuchi patterns.
Winkelmann A; Vos M
Ultramicroscopy; 2013 Feb; 125():66-71. PubMed ID: 23291360
[TBL] [Abstract][Full Text] [Related]
18. Experimental evaluation of environmental scanning electron microscopes at high chamber pressure.
Fitzek H; Schroettner H; Wagner J; Hofer F; Rattenberger J
J Microsc; 2015 Nov; 260(2):133-9. PubMed ID: 26173072
[TBL] [Abstract][Full Text] [Related]
19. 4D scanning ultrafast electron microscopy: visualization of materials surface dynamics.
Mohammed OF; Yang DS; Pal SK; Zewail AH
J Am Chem Soc; 2011 May; 133(20):7708-11. PubMed ID: 21539369
[TBL] [Abstract][Full Text] [Related]
20. New insights into subsurface imaging of carbon nanotubes in polymer composites via scanning electron microscopy.
Zhao M; Ming B; Kim JW; Gibbons LJ; Gu X; Nguyen T; Park C; Lillehei PT; Villarrubia JS; Vladár AE; Alexander Liddle J
Nanotechnology; 2015 Feb; 26(8):085703. PubMed ID: 25649345
[TBL] [Abstract][Full Text] [Related]
[Next] [New Search]
