142 related articles for article (PubMed ID: 25132297)
1. Low-temperature plasma for compositional depth profiling of crosslinking organic multilayers: comparison with C60 and giant argon gas cluster sources.
Muramoto S; Rading D; Bush B; Gillen G; Castner DG
Rapid Commun Mass Spectrom; 2014 Sep; 28(18):1971-8. PubMed ID: 25132297
[TBL] [Abstract][Full Text] [Related]
2. Low Temperature Plasma for the Preparation of Crater Walls for Compositional Depth Profiling of Thin Inorganic Multilayers.
Muramoto S; Bennett J
Surf Interface Anal; 2017 Jun; 49(6):515-521. PubMed ID: 28584389
[TBL] [Abstract][Full Text] [Related]
3. Improving secondary ion mass spectrometry C60(n+) sputter depth profiling of challenging polymers with nitric oxide gas dosing.
Havelund R; Licciardello A; Bailey J; Tuccitto N; Sapuppo D; Gilmore IS; Sharp JS; Lee JL; Mouhib T; Delcorte A
Anal Chem; 2013 May; 85(10):5064-70. PubMed ID: 23590425
[TBL] [Abstract][Full Text] [Related]
4. Comparison of fullerene and large argon clusters for the molecular depth profiling of amino acid multilayers.
Wehbe N; Mouhib T; Delcorte A; Bertrand P; Moellers R; Niehuis E; Houssiau L
Anal Bioanal Chem; 2014 Jan; 406(1):201-11. PubMed ID: 24253407
[TBL] [Abstract][Full Text] [Related]
5. TOF-SIMS with argon gas cluster ion beams: a comparison with C60+.
Rabbani S; Barber AM; Fletcher JS; Lockyer NP; Vickerman JC
Anal Chem; 2011 May; 83(10):3793-800. PubMed ID: 21462969
[TBL] [Abstract][Full Text] [Related]
6. Organic depth profiling of a nanostructured delta layer reference material using large argon cluster ions.
Lee JL; Ninomiya S; Matsuo J; Gilmore IS; Seah MP; Shard AG
Anal Chem; 2010 Jan; 82(1):98-105. PubMed ID: 19957960
[TBL] [Abstract][Full Text] [Related]
7. Argon cluster ion beams for organic depth profiling: results from a VAMAS interlaboratory study.
Shard AG; Havelund R; Seah MP; Spencer SJ; Gilmore IS; Winograd N; Mao D; Miyayama T; Niehuis E; Rading D; Moellers R
Anal Chem; 2012 Sep; 84(18):7865-73. PubMed ID: 22897795
[TBL] [Abstract][Full Text] [Related]
8. Dual beam organic depth profiling using large argon cluster ion beams.
Holzweber M; Shard AG; Jungnickel H; Luch A; Unger W
Surf Interface Anal; 2014; 46(10-11):936-939. PubMed ID: 25892830
[TBL] [Abstract][Full Text] [Related]
9. Molecular depth profiling of buried lipid bilayers using C(60)-secondary ion mass spectrometry.
Lu C; Wucher A; Winograd N
Anal Chem; 2011 Jan; 83(1):351-8. PubMed ID: 21121691
[TBL] [Abstract][Full Text] [Related]
10. Hybrid Perovskites Depth Profiling with Variable-Size Argon Clusters and Monatomic Ions Beams.
Noël C; Pescetelli S; Agresti A; Franquet A; Spampinato V; Felten A; di Carlo A; Houssiau L; Busby Y
Materials (Basel); 2019 Mar; 12(5):. PubMed ID: 30832309
[TBL] [Abstract][Full Text] [Related]
11. Photometric flow injection determination of phosphate on a PDMS microchip using an optical detection system assembled with an organic light emitting diode and an organic photodiode.
Liu R; Ishimatsu R; Yahiro M; Adachi C; Nakano K; Imato T
Talanta; 2015 Jan; 132():96-105. PubMed ID: 25476284
[TBL] [Abstract][Full Text] [Related]
12. 3D ToF-SIMS imaging of polymer multilayer films using argon cluster sputter depth profiling.
Bailey J; Havelund R; Shard AG; Gilmore IS; Alexander MR; Sharp JS; Scurr DJ
ACS Appl Mater Interfaces; 2015 Feb; 7(4):2654-9. PubMed ID: 25562665
[TBL] [Abstract][Full Text] [Related]
13. Depth resolution at organic interfaces sputtered by argon gas cluster ions: the effect of energy, angle and cluster size.
Seah MP; Spencer SJ; Havelund R; Gilmore IS; Shard AG
Analyst; 2015 Oct; 140(19):6508-16. PubMed ID: 26325511
[TBL] [Abstract][Full Text] [Related]
14. Molecular depth profiling of multilayer structures of organic semiconductor materials by secondary ion mass spectrometry with large argon cluster ion beams.
Ninomiya S; Ichiki K; Yamada H; Nakata Y; Seki T; Aoki T; Matsuo J
Rapid Commun Mass Spectrom; 2009 Oct; 23(20):3264-8. PubMed ID: 19757450
[TBL] [Abstract][Full Text] [Related]
15. Nitric oxide assisted C60 secondary ion mass spectrometry for molecular depth profiling of polyelectrolyte multilayers.
Zappalà G; Motta V; Tuccitto N; Vitale S; Torrisi A; Licciardello A
Rapid Commun Mass Spectrom; 2015 Dec; 29(23):2204-10. PubMed ID: 26522311
[TBL] [Abstract][Full Text] [Related]
16. Sampling Depths, Depth Shifts, and Depth Resolutions for Bi(n)(+) Ion Analysis in Argon Gas Cluster Depth Profiles.
Havelund R; Seah MP; Gilmore IS
J Phys Chem B; 2016 Mar; 120(9):2604-11. PubMed ID: 26883085
[TBL] [Abstract][Full Text] [Related]
17. Argon Cluster Sputtering Source for ToF-SIMS Depth Profiling of Insulating Materials: High Sputter Rate and Accurate Interfacial Information.
Wang Z; Liu B; Zhao EW; Jin K; Du Y; Neeway JJ; Ryan JV; Hu D; Zhang KH; Hong M; Le Guernic S; Thevuthasan S; Wang F; Zhu Z
J Am Soc Mass Spectrom; 2015 Aug; 26(8):1283-90. PubMed ID: 25953490
[TBL] [Abstract][Full Text] [Related]
18. ToF-SIMS Depth Profiling of PS-b-PMMA Block Copolymers Using Ar
Terlier T; Zappalà G; Marie C; Leonard D; Barnes JP; Licciardello A
Anal Chem; 2017 Jul; 89(13):6984-6991. PubMed ID: 28617583
[TBL] [Abstract][Full Text] [Related]
19. Analysis of structural distribution of nitrogen-incorporated species at the interface of silicon oxide films on silicon using time-of-flight secondary ion mass spectrometry and poisson approximation.
Chiba K
Anal Chem; 2008 Aug; 80(16):6286-92. PubMed ID: 18642880
[TBL] [Abstract][Full Text] [Related]
20. Quantitative molecular depth profiling of organic delta-layers by C60 ion sputtering and SIMS.
Shard AG; Green FM; Brewer PJ; Seah MP; Gilmore IS
J Phys Chem B; 2008 Mar; 112(9):2596-605. PubMed ID: 18254619
[TBL] [Abstract][Full Text] [Related]
[Next] [New Search]
