These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.


BIOMARKERS

Molecular Biopsy of Human Tumors

- a resource for Precision Medicine *

134 related articles for article (PubMed ID: 25365463)

  • 1. A novel dog-bone oscillating AFM probe with thermal actuation and piezoresistive detection.
    Xiong Z; Mairiaux E; Walter B; Faucher M; Buchaillot L; Legrand B
    Sensors (Basel); 2014 Oct; 14(11):20667-86. PubMed ID: 25365463
    [TBL] [Abstract][Full Text] [Related]  

  • 2. Actuation of atomic force microscopy microcantilevers using contact acoustic nonlinearities.
    Torello D; Degertekin FL
    Rev Sci Instrum; 2013 Nov; 84(11):113705. PubMed ID: 24289402
    [TBL] [Abstract][Full Text] [Related]  

  • 3. High bandwidth piezoresistive force probes with integrated thermal actuation.
    Doll JC; Pruitt BL
    J Micromech Microeng; 2012 Sep; 22(9):. PubMed ID: 23175616
    [TBL] [Abstract][Full Text] [Related]  

  • 4. Non-optical tip-sample distance control method for scanning near-field optical microscopy using a piezoresistive micro cantilever.
    Muramatsu H; Egawa A; Homma K; Kim JM; Takahashi H; Shirakawabe Y; Shimizu N
    J Microsc; 2001 Apr; 202(Pt 1):154-61. PubMed ID: 11298886
    [TBL] [Abstract][Full Text] [Related]  

  • 5. Development of a detachable high speed miniature scanning probe microscope for large area substrates inspection.
    Sadeghian H; Herfst R; Winters J; Crowcombe W; Kramer G; van den Dool T; van Es MH
    Rev Sci Instrum; 2015 Nov; 86(11):113706. PubMed ID: 26628143
    [TBL] [Abstract][Full Text] [Related]  

  • 6. Modular apparatus for electrostatic actuation of common atomic force microscope cantilevers.
    Long CJ; Cannara RJ
    Rev Sci Instrum; 2015 Jul; 86(7):073703. PubMed ID: 26233392
    [TBL] [Abstract][Full Text] [Related]  

  • 7. Note: Seesaw actuation of atomic force microscope probes for improved imaging bandwidth and displacement range.
    Torun H; Torello D; Degertekin FL
    Rev Sci Instrum; 2011 Aug; 82(8):086104. PubMed ID: 21895282
    [TBL] [Abstract][Full Text] [Related]  

  • 8. Multi-MHz micro-electro-mechanical sensors for atomic force microscopy.
    Legrand B; Salvetat JP; Walter B; Faucher M; Théron D; Aimé JP
    Ultramicroscopy; 2017 Apr; 175():46-57. PubMed ID: 28110263
    [TBL] [Abstract][Full Text] [Related]  

  • 9. A MEMS nanoindenter with an integrated AFM cantilever gripper for nanomechanical characterization of compliant materials.
    Li Z; Gao S; Brand U; Hiller K; Wolff H
    Nanotechnology; 2020 Jul; 31(30):305502. PubMed ID: 32289758
    [TBL] [Abstract][Full Text] [Related]  

  • 10. Low-voltage and high-performance buzzer-scanner based streamlined atomic force microscope system.
    Wang WM; Huang KY; Huang HF; Hwang IS; Hwu ET
    Nanotechnology; 2013 Nov; 24(45):455503. PubMed ID: 24141269
    [TBL] [Abstract][Full Text] [Related]  

  • 11. Characterization of MEMS piezoresistive pressure sensors using AFM.
    Patil SK; Celik-Butler Z; Butler DP
    Ultramicroscopy; 2010 Aug; 110(9):1154-60. PubMed ID: 20452125
    [TBL] [Abstract][Full Text] [Related]  

  • 12. MEMS-based fast scanning probe microscopes.
    Tabak FC; Disseldorp EC; Wortel GH; Katan AJ; Hesselberth MB; Oosterkamp TH; Frenken JW; van Spengen WM
    Ultramicroscopy; 2010 May; 110(6):599-604. PubMed ID: 20334976
    [TBL] [Abstract][Full Text] [Related]  

  • 13. Sensitivity Improvement to Active Piezoresistive AFM Probes Using Focused Ion Beam Processing.
    Kunicki P; Angelov T; Ivanov T; Gotszalk T; Rangelow I
    Sensors (Basel); 2019 Oct; 19(20):. PubMed ID: 31614863
    [TBL] [Abstract][Full Text] [Related]  

  • 14. Lights Out! Nano-Scale Topography Imaging of Sample Surface in Opaque Liquid Environments with Coated Active Cantilever Probes.
    Xia F; Yang C; Wang Y; Youcef-Toumi K; Reuter C; Ivanov T; Holz M; Rangelow IW
    Nanomaterials (Basel); 2019 Jul; 9(7):. PubMed ID: 31337145
    [TBL] [Abstract][Full Text] [Related]  

  • 15. A quadruple-scanning-probe force microscope for electrical property measurements of microscopic materials.
    Higuchi S; Kubo O; Kuramochi H; Aono M; Nakayama T
    Nanotechnology; 2011 Jul; 22(28):285205. PubMed ID: 21659691
    [TBL] [Abstract][Full Text] [Related]  

  • 16. High-resolution measurement of atomic force microscope cantilever resonance frequency.
    Xu B; Saygin V; Brown KA; Andersson SB
    Rev Sci Instrum; 2020 Dec; 91(12):123705. PubMed ID: 33379947
    [TBL] [Abstract][Full Text] [Related]  

  • 17. Digitally tunable, wide-band amplitude, phase, and frequency detection for atomic-resolution scanning force microscopy.
    Khan Z; Leung C; Tahir BA; Hoogenboom BW
    Rev Sci Instrum; 2010 Jul; 81(7):073704. PubMed ID: 20687728
    [TBL] [Abstract][Full Text] [Related]  

  • 18. Design and control of multi-actuated atomic force microscope for large-range and high-speed imaging.
    Soltani Bozchalooi I; Careaga Houck A; AlGhamdi JM; Youcef-Toumi K
    Ultramicroscopy; 2016 Jan; 160():213-224. PubMed ID: 26547505
    [TBL] [Abstract][Full Text] [Related]  

  • 19. Improving tapping mode atomic force microscopy with piezoelectric cantilevers.
    Rogers B; Manning L; Sulchek T; Adams JD
    Ultramicroscopy; 2004 Aug; 100(3-4):267-76. PubMed ID: 15231319
    [TBL] [Abstract][Full Text] [Related]  

  • 20. Multifunctional atomic force microscope cantilevers with Lorentz force actuation and self-heating capability.
    Somnath S; Liu JO; Bakir M; Prater CB; King WP
    Nanotechnology; 2014 Oct; 25(39):395501. PubMed ID: 25189800
    [TBL] [Abstract][Full Text] [Related]  

    [Next]    [New Search]
    of 7.