These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.


BIOMARKERS

Molecular Biopsy of Human Tumors

- a resource for Precision Medicine *

279 related articles for article (PubMed ID: 25556928)

  • 1. Vibrational shape tracking of atomic force microscopy cantilevers for improved sensitivity and accuracy of nanomechanical measurements.
    Wagner R; Killgore JP; Tung RC; Raman A; Hurley DC
    Nanotechnology; 2015 Jan; 26(4):045701. PubMed ID: 25556928
    [TBL] [Abstract][Full Text] [Related]  

  • 2. Characterizing the free and surface-coupled vibrations of heated-tip atomic force microscope cantilevers.
    Killgore JP; Tung RC; Hurley DC
    Nanotechnology; 2014 Aug; 25(34):345701. PubMed ID: 25098183
    [TBL] [Abstract][Full Text] [Related]  

  • 3. Dual resonance excitation system for the contact mode of atomic force microscopy.
    Kopycinska-Müller M; Striegler A; Schlegel R; Kuzeyeva N; Köhler B; Wolter KJ
    Rev Sci Instrum; 2012 Apr; 83(4):043703. PubMed ID: 22559535
    [TBL] [Abstract][Full Text] [Related]  

  • 4. Functionalized AFM probes for force spectroscopy: eigenmode shapes and stiffness calibration through thermal noise measurements.
    Laurent J; Steinberger A; Bellon L
    Nanotechnology; 2013 Jun; 24(22):225504. PubMed ID: 23644764
    [TBL] [Abstract][Full Text] [Related]  

  • 5. Multi-eigenmode control for high material contrast in bimodal and higher harmonic atomic force microscopy.
    Schuh A; Bozchalooi IS; Rangelow IW; Youcef-Toumi K
    Nanotechnology; 2015 Jun; 26(23):235706. PubMed ID: 25994333
    [TBL] [Abstract][Full Text] [Related]  

  • 6. Sensitivity of flexural vibration mode of the rectangular atomic force microscope micro cantilevers in liquid to the surface stiffness variations.
    Farokh Payam A
    Ultramicroscopy; 2013 Dec; 135():84-8. PubMed ID: 23942312
    [TBL] [Abstract][Full Text] [Related]  

  • 7. Modular apparatus for electrostatic actuation of common atomic force microscope cantilevers.
    Long CJ; Cannara RJ
    Rev Sci Instrum; 2015 Jul; 86(7):073703. PubMed ID: 26233392
    [TBL] [Abstract][Full Text] [Related]  

  • 8. Low-force AFM nanomechanics with higher-eigenmode contact resonance spectroscopy.
    Killgore JP; Hurley DC
    Nanotechnology; 2012 Feb; 23(5):055702. PubMed ID: 22236758
    [TBL] [Abstract][Full Text] [Related]  

  • 9. Contact mechanics and tip shape in AFM-based nanomechanical measurements.
    Kopycinska-Müller M; Geiss RH; Hurley DC
    Ultramicroscopy; 2006 Apr; 106(6):466-74. PubMed ID: 16448755
    [TBL] [Abstract][Full Text] [Related]  

  • 10. Prototype cantilevers for quantitative lateral force microscopy.
    Reitsma MG; Gates RS; Friedman LH; Cook RF
    Rev Sci Instrum; 2011 Sep; 82(9):093706. PubMed ID: 21974593
    [TBL] [Abstract][Full Text] [Related]  

  • 11. Accurate measurement of Atomic Force Microscope cantilever deflection excluding tip-surface contact with application to force calibration.
    Slattery AD; Blanch AJ; Quinton JS; Gibson CT
    Ultramicroscopy; 2013 Aug; 131():46-55. PubMed ID: 23685172
    [TBL] [Abstract][Full Text] [Related]  

  • 12. Multifunctional cantilevers for simultaneous enhancement of contact resonance and harmonic atomic force microscopy.
    Wang W; Zhang K; Zhang W; Hou Y; Chen Y
    Nanotechnology; 2021 Apr; 32(29):. PubMed ID: 33784663
    [TBL] [Abstract][Full Text] [Related]  

  • 13. Intermittent contact resonance atomic force microscopy.
    Stan G; Gates RS
    Nanotechnology; 2014 Jun; 25(24):245702. PubMed ID: 24858092
    [TBL] [Abstract][Full Text] [Related]  

  • 14. Accurate spring constant calibration for very stiff atomic force microscopy cantilevers.
    Grutzik SJ; Gates RS; Gerbig YB; Smith DT; Cook RF; Zehnder AT
    Rev Sci Instrum; 2013 Nov; 84(11):113706. PubMed ID: 24289403
    [TBL] [Abstract][Full Text] [Related]  

  • 15. Design of V-shaped cantilevers for enhanced multifrequency AFM measurements.
    Damircheli M; Eslami B
    Beilstein J Nanotechnol; 2020; 11():1525-1541. PubMed ID: 33094086
    [TBL] [Abstract][Full Text] [Related]  

  • 16. Influence of Poisson's ratio variation on lateral spring constant of atomic force microscopy cantilevers.
    Yeh MK; Tai NH; Chen BY
    Ultramicroscopy; 2008 Sep; 108(10):1025-9. PubMed ID: 18547729
    [TBL] [Abstract][Full Text] [Related]  

  • 17. Quantification of surface displacements and electromechanical phenomena via dynamic atomic force microscopy.
    Balke N; Jesse S; Yu P; Ben Carmichael ; Kalinin SV; Tselev A
    Nanotechnology; 2016 Oct; 27(42):425707. PubMed ID: 27631885
    [TBL] [Abstract][Full Text] [Related]  

  • 18. Micromechanical contact stiffness devices and application for calibrating contact resonance atomic force microscopy.
    Rosenberger MR; Chen S; Prater CB; King WP
    Nanotechnology; 2017 Jan; 28(4):044003. PubMed ID: 28000611
    [TBL] [Abstract][Full Text] [Related]  

  • 19. Effects of anisotropic material property on the spring constant and the resonant frequency of atomic force microscope cantilever.
    Yeh MK; Tai NH; Chen BY
    Rev Sci Instrum; 2009 Apr; 80(4):043705. PubMed ID: 19405664
    [TBL] [Abstract][Full Text] [Related]  

  • 20. Atomic-resolution imaging in liquid by frequency modulation atomic force microscopy using small cantilevers with megahertz-order resonance frequencies.
    Fukuma T; Onishi K; Kobayashi N; Matsuki A; Asakawa H
    Nanotechnology; 2012 Apr; 23(13):135706. PubMed ID: 22421199
    [TBL] [Abstract][Full Text] [Related]  

    [Next]    [New Search]
    of 14.