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4. Wafer-Level Electrically Detected Magnetic Resonance: Magnetic Resonance in a Probing Station. McCrory DJ; Anders MA; Ryan JT; Shrestha PR; Cheung KP; Lenahan PM; Campbell JP IEEE Trans Device Mater Reliab; 2018; 18():. PubMed ID: 30983909 [TBL] [Abstract][Full Text] [Related]
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