These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.


BIOMARKERS

Molecular Biopsy of Human Tumors

- a resource for Precision Medicine *

175 related articles for article (PubMed ID: 25594151)

  • 1. Angle dependence of argon gas cluster sputtering yields for organic materials.
    Seah MP; Spencer SJ; Shard AG
    J Phys Chem B; 2015 Feb; 119(7):3297-303. PubMed ID: 25594151
    [TBL] [Abstract][Full Text] [Related]  

  • 2. Depth resolution at organic interfaces sputtered by argon gas cluster ions: the effect of energy, angle and cluster size.
    Seah MP; Spencer SJ; Havelund R; Gilmore IS; Shard AG
    Analyst; 2015 Oct; 140(19):6508-16. PubMed ID: 26325511
    [TBL] [Abstract][Full Text] [Related]  

  • 3. Depth resolution, angle dependence, and the sputtering yield of Irganox 1010 by coronene primary ions.
    Seah MP; Spencer SJ; Shard AG
    J Phys Chem B; 2013 Oct; 117(39):11885-92. PubMed ID: 24010582
    [TBL] [Abstract][Full Text] [Related]  

  • 4. Enhancing ion yields in time-of-flight-secondary ion mass spectrometry: a comparative study of argon and water cluster primary beams.
    Sheraz née Rabbani S; Razo IB; Kohn T; Lockyer NP; Vickerman JC
    Anal Chem; 2015 Feb; 87(4):2367-74. PubMed ID: 25588151
    [TBL] [Abstract][Full Text] [Related]  

  • 5. Argon cluster ion beams for organic depth profiling: results from a VAMAS interlaboratory study.
    Shard AG; Havelund R; Seah MP; Spencer SJ; Gilmore IS; Winograd N; Mao D; Miyayama T; Niehuis E; Rading D; Moellers R
    Anal Chem; 2012 Sep; 84(18):7865-73. PubMed ID: 22897795
    [TBL] [Abstract][Full Text] [Related]  

  • 6. Sputtering Yields for Mixtures of Organic Materials Using Argon Gas Cluster Ions.
    Seah MP; Havelund R; Shard AG; Gilmore IS
    J Phys Chem B; 2015 Oct; 119(42):13433-9. PubMed ID: 26421437
    [TBL] [Abstract][Full Text] [Related]  

  • 7. Soft-sputtering of insulin films in argon-cluster secondary ion mass spectrometry.
    Oshima S; Kashihara I; Moritani K; Inui N; Mochiji K
    Rapid Commun Mass Spectrom; 2011 Apr; 25(8):1070-4. PubMed ID: 21452384
    [TBL] [Abstract][Full Text] [Related]  

  • 8. Improving secondary ion mass spectrometry C60(n+) sputter depth profiling of challenging polymers with nitric oxide gas dosing.
    Havelund R; Licciardello A; Bailey J; Tuccitto N; Sapuppo D; Gilmore IS; Sharp JS; Lee JL; Mouhib T; Delcorte A
    Anal Chem; 2013 May; 85(10):5064-70. PubMed ID: 23590425
    [TBL] [Abstract][Full Text] [Related]  

  • 9. Precise and fast secondary ion mass spectrometry depth profiling of polymer materials with large Ar cluster ion beams.
    Ninomiya S; Ichiki K; Yamada H; Nakata Y; Seki T; Aoki T; Matsuo J
    Rapid Commun Mass Spectrom; 2009 Jun; 23(11):1601-6. PubMed ID: 19399762
    [TBL] [Abstract][Full Text] [Related]  

  • 10. Organic depth profiling of a nanostructured delta layer reference material using large argon cluster ions.
    Lee JL; Ninomiya S; Matsuo J; Gilmore IS; Seah MP; Shard AG
    Anal Chem; 2010 Jan; 82(1):98-105. PubMed ID: 19957960
    [TBL] [Abstract][Full Text] [Related]  

  • 11. Hybrid Perovskites Depth Profiling with Variable-Size Argon Clusters and Monatomic Ions Beams.
    Noël C; Pescetelli S; Agresti A; Franquet A; Spampinato V; Felten A; di Carlo A; Houssiau L; Busby Y
    Materials (Basel); 2019 Mar; 12(5):. PubMed ID: 30832309
    [TBL] [Abstract][Full Text] [Related]  

  • 12. Study on the detection limits of a new argon gas cluster ion beam secondary ion mass spectrometry apparatus using lipid compound samples.
    Fujii M; Nakagawa S; Matsuda K; Man N; Seki T; Aoki T; Matsuo J
    Rapid Commun Mass Spectrom; 2014 Apr; 28(8):917-20. PubMed ID: 24623696
    [TBL] [Abstract][Full Text] [Related]  

  • 13. Argon cluster ion source evaluation on lipid standards and rat brain tissue samples.
    Bich C; Havelund R; Moellers R; Touboul D; Kollmer F; Niehuis E; Gilmore IS; Brunelle A
    Anal Chem; 2013 Aug; 85(16):7745-52. PubMed ID: 23875833
    [TBL] [Abstract][Full Text] [Related]  

  • 14. Systematic Temperature Effects in the Argon Cluster Ion Sputter Depth Profiling of Organic Materials Using Secondary Ion Mass Spectrometry.
    Seah MP; Havelund R; Gilmore IS
    J Am Soc Mass Spectrom; 2016 Aug; 27(8):1411-8. PubMed ID: 27106601
    [TBL] [Abstract][Full Text] [Related]  

  • 15. Enhanced surface sensitivity in secondary ion mass spectrometric analysis of organic thin films using size-selected Ar gas-cluster ion projectiles.
    Tanaka M; Moritani K; Hirota T; Toyoda N; Yamada I; Inui N; Mochiji K
    Rapid Commun Mass Spectrom; 2010 May; 24(10):1405-10. PubMed ID: 20411579
    [TBL] [Abstract][Full Text] [Related]  

  • 16. TOF-SIMS with argon gas cluster ion beams: a comparison with C60+.
    Rabbani S; Barber AM; Fletcher JS; Lockyer NP; Vickerman JC
    Anal Chem; 2011 May; 83(10):3793-800. PubMed ID: 21462969
    [TBL] [Abstract][Full Text] [Related]  

  • 17. Peptide dissociation patterns in secondary ion mass spectrometry under large argon cluster ion bombardment.
    Gnaser H; Fujii M; Nakagawa S; Seki T; Aoki T; Matsuo J
    Rapid Commun Mass Spectrom; 2013 Jul; 27(13):1490-6. PubMed ID: 23722683
    [TBL] [Abstract][Full Text] [Related]  

  • 18. Sputtering of silicon nanopowders by an argon cluster ion beam.
    Zeng X; Pelenovich V; Wang Z; Zuo W; Belykh S; Tolstogouzov A; Fu D; Xiao X
    Beilstein J Nanotechnol; 2019; 10():135-143. PubMed ID: 30680286
    [TBL] [Abstract][Full Text] [Related]  

  • 19. Argon Cluster Sputtering Source for ToF-SIMS Depth Profiling of Insulating Materials: High Sputter Rate and Accurate Interfacial Information.
    Wang Z; Liu B; Zhao EW; Jin K; Du Y; Neeway JJ; Ryan JV; Hu D; Zhang KH; Hong M; Le Guernic S; Thevuthasan S; Wang F; Zhu Z
    J Am Soc Mass Spectrom; 2015 Aug; 26(8):1283-90. PubMed ID: 25953490
    [TBL] [Abstract][Full Text] [Related]  

  • 20. Enhanced Ion Yields Using High Energy Water Cluster Beams for Secondary Ion Mass Spectrometry Analysis and Imaging.
    Sheraz S; Tian H; Vickerman JC; Blenkinsopp P; Winograd N; Cumpson P
    Anal Chem; 2019 Jul; 91(14):9058-9068. PubMed ID: 31136149
    [TBL] [Abstract][Full Text] [Related]  

    [Next]    [New Search]
    of 9.