These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.
109 related articles for article (PubMed ID: 25647357)
1. Accurate and precise measurement of oxygen isotopic fractions and diffusion profiles by selective attenuation of secondary ions (SASI). Téllez H; Druce J; Hong JE; Ishihara T; Kilner JA Anal Chem; 2015 Mar; 87(5):2907-15. PubMed ID: 25647357 [TBL] [Abstract][Full Text] [Related]
2. Isotope ratio determination in boron analysis. Sah RN; Brown PH Biol Trace Elem Res; 1998; 66(1-3):39-53. PubMed ID: 10050906 [TBL] [Abstract][Full Text] [Related]
3. Carbon-13 labeled polymers: an alternative tracer for depth profiling of polymer films and multilayers using secondary ion mass spectrometry. Harton SE; Stevie FA; Zhu Z; Ade H Anal Chem; 2006 May; 78(10):3452-60. PubMed ID: 16689549 [TBL] [Abstract][Full Text] [Related]
4. Determination of proton- and oxide ion tracer diffusion in lanthanum tungstate (La/W = 5.6) by means of ToF-SIMS. Hancke R; Fearn S; Kilner JA; Haugsrud R Phys Chem Chem Phys; 2012 Oct; 14(40):13971-8. PubMed ID: 22986702 [TBL] [Abstract][Full Text] [Related]
5. Relating surface chemistry and oxygen surface exchange in LnBaCo2O(5+δ) air electrodes. Téllez H; Druce J; Kilner JA; Ishihara T Faraday Discuss; 2015; 182():145-57. PubMed ID: 26212446 [TBL] [Abstract][Full Text] [Related]
6. Parallel detection, quantification, and depth profiling of peptides with dynamic-secondary ion mass spectrometry (D-SIMS) ionized by C60(+)-Ar(+) co-sputtering. Chang CJ; Chang HY; You YW; Liao HY; Kuo YT; Kao WL; Yen GJ; Tsai MH; Shyue JJ Anal Chim Acta; 2012 Mar; 718():64-9. PubMed ID: 22305899 [TBL] [Abstract][Full Text] [Related]
7. High-resolution secondary ion mass spectrometry depth profiling of nanolayers. Baryshev SV; Zinovev AV; Tripa CE; Pellin MJ; Peng Q; Elam JW; Veryovkin IV Rapid Commun Mass Spectrom; 2012 Oct; 26(19):2224-30. PubMed ID: 22956313 [TBL] [Abstract][Full Text] [Related]
8. Precise and fast secondary ion mass spectrometry depth profiling of polymer materials with large Ar cluster ion beams. Ninomiya S; Ichiki K; Yamada H; Nakata Y; Seki T; Aoki T; Matsuo J Rapid Commun Mass Spectrom; 2009 Jun; 23(11):1601-6. PubMed ID: 19399762 [TBL] [Abstract][Full Text] [Related]
9. Study on the detection limits of a new argon gas cluster ion beam secondary ion mass spectrometry apparatus using lipid compound samples. Fujii M; Nakagawa S; Matsuda K; Man N; Seki T; Aoki T; Matsuo J Rapid Commun Mass Spectrom; 2014 Apr; 28(8):917-20. PubMed ID: 24623696 [TBL] [Abstract][Full Text] [Related]
11. High-precision measurement of (186)Os/(188)Os and (187)Os/(188)Os: isobaric oxide corrections with in-run measured oxygen isotope ratios. Chu ZY; Li CF; Chen Z; Xu JJ; Di YK; Guo JH Anal Chem; 2015 Sep; 87(17):8765-71. PubMed ID: 26255581 [TBL] [Abstract][Full Text] [Related]
12. Assessing dead time effects when attempting isotope ratio quantification by time-of-flight secondary ion mass spectrometry. Baqué LC; Cabello FM; Viva FA; Corti HR Biointerphases; 2023 Nov; 18(6):. PubMed ID: 37916884 [TBL] [Abstract][Full Text] [Related]
13. Dislocations Accelerate Oxygen Ion Diffusion in La Navickas E; Chen Y; Lu Q; Wallisch W; Huber TM; Bernardi J; Stöger-Pollach M; Friedbacher G; Hutter H; Yildiz B; Fleig J ACS Nano; 2017 Nov; 11(11):11475-11487. PubMed ID: 28981249 [TBL] [Abstract][Full Text] [Related]
14. Cation diffusion in La(0.6)Sr(0.4)CoO(3-δ) below 800 °C and its relevance for Sr segregation. Kubicek M; Rupp GM; Huber S; Penn A; Opitz AK; Bernardi J; Stöger-Pollach M; Hutter H; Fleig J Phys Chem Chem Phys; 2014 Feb; 16(6):2715-26. PubMed ID: 24390268 [TBL] [Abstract][Full Text] [Related]
16. Analysis of structural distribution of nitrogen-incorporated species at the interface of silicon oxide films on silicon using time-of-flight secondary ion mass spectrometry and poisson approximation. Chiba K Anal Chem; 2008 Aug; 80(16):6286-92. PubMed ID: 18642880 [TBL] [Abstract][Full Text] [Related]
17. A SIMS study of cation and anion diffusion in tantalum oxide. Gries UN; Schraknepper H; Skaja K; Gunkel F; Hoffmann-Eifert S; Waser R; De Souza RA Phys Chem Chem Phys; 2018 Jan; 20(2):989-996. PubMed ID: 29234759 [TBL] [Abstract][Full Text] [Related]
18. Structural effects in the analysis of supported lipid bilayers by time-of-flight secondary ion mass spectrometry. Prinz C; Höök F; Malm J; Sjövall P Langmuir; 2007 Jul; 23(15):8035-41. PubMed ID: 17569548 [TBL] [Abstract][Full Text] [Related]
19. Quantitative profiling of SiGe/Si superlattices by time-of-flight secondary ion mass spectrometry: the advantages of the extended Full Spectrum protocol. Py M; Barnes JP; Lafond D; Hartmann JM Rapid Commun Mass Spectrom; 2011 Mar; 25(5):629-38. PubMed ID: 21290450 [TBL] [Abstract][Full Text] [Related]
20. Back-exchange: a novel approach to quantifying oxygen diffusion and surface exchange in ambient atmospheres. Cooper SJ; Niania M; Hoffmann F; Kilner JA Phys Chem Chem Phys; 2017 May; 19(19):12199-12205. PubMed ID: 28447675 [TBL] [Abstract][Full Text] [Related] [Next] [New Search]