These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.
22. Identification of electron beam vibration sources by separation of magnetic distortion from electric distortion on scanning electron microscope imaging. Pluska M; Czerwinski A; Ratajczak J; Katcki J; Oskwarek Ł; Rak R J Microsc; 2010 Mar; 237(3):325-8. PubMed ID: 20500389 [TBL] [Abstract][Full Text] [Related]
23. An improved visual tracking method in scanning electron microscope. Ru C; Zhang Y; Huang H; Chen T Microsc Microanal; 2012 Jun; 18(3):612-20. PubMed ID: 22559813 [TBL] [Abstract][Full Text] [Related]
24. Analytical scanning electron microscopy for solid surface. Ichinokawa T J Electron Microsc Tech; 1989 Jul; 12(3):219-27. PubMed ID: 2795228 [TBL] [Abstract][Full Text] [Related]
25. Quasi in situ scanning force microscope with an automatic operated reaction chamber. Hund M; Olszowka V; Fischer F; Krejtschi H Rev Sci Instrum; 2011 Nov; 82(11):113709. PubMed ID: 22128986 [TBL] [Abstract][Full Text] [Related]
26. A novel apparatus for in situ compression of submicron structures and particles in a high resolution SEM. Romeis S; Paul J; Ziener M; Peukert W Rev Sci Instrum; 2012 Sep; 83(9):095105. PubMed ID: 23020417 [TBL] [Abstract][Full Text] [Related]
27. High spatial resolution confocal microscope with independent excitation and detection scanning capabilities. Marcet S; Ouellet-Plamondon C; Francoeur S Rev Sci Instrum; 2009 Jun; 80(6):063101. PubMed ID: 19566190 [TBL] [Abstract][Full Text] [Related]
28. The environmental scanning electron microscope and its applications. Danilatos GD; Postle R Scan Electron Microsc; 1982; (Pt 1):1-16. PubMed ID: 7167743 [TBL] [Abstract][Full Text] [Related]
29. In-vivo observation of cells with a combined high-resolution multiphoton-acoustic scanning microscope. Schenkl S; Weiss EC; Stracke F; Sauer D; Stark M; Riemann I; Lemor RM; König K Microsc Res Tech; 2007 May; 70(5):476-80. PubMed ID: 17380494 [TBL] [Abstract][Full Text] [Related]
30. Electron tomography of HEK293T cells using scanning electron microscope-based scanning transmission electron microscopy. You YW; Chang HY; Liao HY; Kao WL; Yen GJ; Chang CJ; Tsai MH; Shyue JJ Microsc Microanal; 2012 Oct; 18(5):1037-42. PubMed ID: 23026379 [TBL] [Abstract][Full Text] [Related]
31. Annoyance from industrial noise: indicators for a wide variety of industrial sources. Alayrac M; Marquis-Favre C; Viollon S; Morel J; Le Nost G J Acoust Soc Am; 2010 Sep; 128(3):1128-39. PubMed ID: 20815449 [TBL] [Abstract][Full Text] [Related]
32. Low voltage and variable-pressure scanning electron microscopy of fractured composites. Hein LR; de Campos KA; Caltabiano PC Micron; 2012 Oct; 43(10):1039-49. PubMed ID: 22595459 [TBL] [Abstract][Full Text] [Related]
33. A high vacuum photoelectron microscope for the study of biological specimens. Griffith OH; Rempfer GF; Lesch GH Scan Electron Microsc; 1981; (Pt 2):123-30. PubMed ID: 7323723 [TBL] [Abstract][Full Text] [Related]
34. Nanomachining with a mechanical manipulation system. Chang M; Deka JR; Lin CH J Nanosci Nanotechnol; 2008 Dec; 8(12):6266-73. PubMed ID: 19205193 [TBL] [Abstract][Full Text] [Related]
35. Direct observation of graphene growth and associated copper substrate dynamics by in situ scanning electron microscopy. Wang ZJ; Weinberg G; Zhang Q; Lunkenbein T; Klein-Hoffmann A; Kurnatowska M; Plodinec M; Li Q; Chi L; Schloegl R; Willinger MG ACS Nano; 2015 Feb; 9(2):1506-19. PubMed ID: 25584770 [TBL] [Abstract][Full Text] [Related]
36. Note: Mechanical and electrical characterization of nanowires in scanning electron microscope. Ru C; Sun L Rev Sci Instrum; 2011 Oct; 82(10):106105. PubMed ID: 22047343 [TBL] [Abstract][Full Text] [Related]
37. Miniature active damping stage for scanning probe applications in ultra high vacuum. Assig M; Koch A; Stiepany W; Strasser C; Ast A; Kern K; Ast CR Rev Sci Instrum; 2012 Mar; 83(3):033701. PubMed ID: 22462923 [TBL] [Abstract][Full Text] [Related]
38. Control of specimen orientation and environment. Turner JN; Valdrè U; Fukami A J Electron Microsc Tech; 1989 Apr; 11(4):258-71. PubMed ID: 2723809 [TBL] [Abstract][Full Text] [Related]
39. Charge-related problems associated with X-ray microanalysis in the variable pressure scanning electron microscope at low pressures. Griffin BJ; Suvorova AA Microsc Microanal; 2003 Apr; 9(2):155-65. PubMed ID: 12639242 [TBL] [Abstract][Full Text] [Related]
40. High resolution fluorescent bio-imaging with electron beam excitation. Kawata Y; Nawa Y; Inami W Microscopy (Oxf); 2014 Nov; 63 Suppl 1():i16. PubMed ID: 25359807 [TBL] [Abstract][Full Text] [Related] [Previous] [Next] [New Search]