These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.


BIOMARKERS

Molecular Biopsy of Human Tumors

- a resource for Precision Medicine *

243 related articles for article (PubMed ID: 25955058)

  • 1. Atomic-Resolution STEM Imaging of Graphene at Low Voltage of 30 kV with Resolution Enhancement by Using Large Convergence Angle.
    Sawada H; Sasaki T; Hosokawa F; Suenaga K
    Phys Rev Lett; 2015 Apr; 114(16):166102. PubMed ID: 25955058
    [TBL] [Abstract][Full Text] [Related]  

  • 2. Resolution enhancement at a large convergence angle by a delta corrector with a CFEG in a low-accelerating-voltage STEM.
    Sawada H; Sasaki T; Hosokawa F; Suenaga K
    Micron; 2014 Aug; 63():35-9. PubMed ID: 24618015
    [TBL] [Abstract][Full Text] [Related]  

  • 3. Performance of low-voltage STEM/TEM with delta corrector and cold field emission gun.
    Sasaki T; Sawada H; Hosokawa F; Kohno Y; Tomita T; Kaneyama T; Kondo Y; Kimoto K; Sato Y; Suenaga K
    J Electron Microsc (Tokyo); 2010 Aug; 59 Suppl 1():S7-13. PubMed ID: 20581425
    [TBL] [Abstract][Full Text] [Related]  

  • 4. Aberration-corrected STEM/TEM imaging at 15kV.
    Sasaki T; Sawada H; Hosokawa F; Sato Y; Suenaga K
    Ultramicroscopy; 2014 Oct; 145():50-5. PubMed ID: 24842229
    [TBL] [Abstract][Full Text] [Related]  

  • 5. Choice of operating voltage for a transmission electron microscope.
    Egerton RF
    Ultramicroscopy; 2014 Oct; 145():85-93. PubMed ID: 24679438
    [TBL] [Abstract][Full Text] [Related]  

  • 6. Chromatic Aberration Correction for Atomic Resolution TEM Imaging from 20 to 80 kV.
    Linck M; Hartel P; Uhlemann S; Kahl F; Müller H; Zach J; Haider M; Niestadt M; Bischoff M; Biskupek J; Lee Z; Lehnert T; Börrnert F; Rose H; Kaiser U
    Phys Rev Lett; 2016 Aug; 117(7):076101. PubMed ID: 27563976
    [TBL] [Abstract][Full Text] [Related]  

  • 7. Atomic Resolution Imaging at an Ultralow Accelerating Voltage by a Monochromatic Transmission Electron Microscope.
    Morishita S; Mukai M; Suenaga K; Sawada H
    Phys Rev Lett; 2016 Oct; 117(15):153004. PubMed ID: 27768334
    [TBL] [Abstract][Full Text] [Related]  

  • 8. Evaluation of residual aberration in fifth-order geometrical aberration correctors.
    Morishita S; Kohno Y; Hosokawa F; Suenaga K; Sawada H
    Microscopy (Oxf); 2018 Jun; 67(3):156-163. PubMed ID: 29474670
    [TBL] [Abstract][Full Text] [Related]  

  • 9. Attainment of 40.5 pm spatial resolution using 300 kV scanning transmission electron microscope equipped with fifth-order aberration corrector.
    Morishita S; Ishikawa R; Kohno Y; Sawada H; Shibata N; Ikuhara Y
    Microscopy (Oxf); 2018 Feb; 67(1):46-50. PubMed ID: 29309606
    [TBL] [Abstract][Full Text] [Related]  

  • 10. Aberration Correction for Large-Angle Illumination Scanning Transmission Electron Microscopy by Using Iterative Electron Ptychography Algorithms.
    Ma Y; Shi J; Guzman R; Li A; Zhou W
    Microsc Microanal; 2024 Apr; 30(2):226-235. PubMed ID: 38578297
    [TBL] [Abstract][Full Text] [Related]  

  • 11. Resolving 45-pm-separated Si-Si atomic columns with an aberration-corrected STEM.
    Sawada H; Shimura N; Hosokawa F; Shibata N; Ikuhara Y
    Microscopy (Oxf); 2015 Jun; 64(3):213-7. PubMed ID: 25825509
    [TBL] [Abstract][Full Text] [Related]  

  • 12. STEM imaging of 47-pm-separated atomic columns by a spherical aberration-corrected electron microscope with a 300-kV cold field emission gun.
    Sawada H; Tanishiro Y; Ohashi N; Tomita T; Hosokawa F; Kaneyama T; Kondo Y; Takayanagi K
    J Electron Microsc (Tokyo); 2009 Dec; 58(6):357-61. PubMed ID: 19546144
    [TBL] [Abstract][Full Text] [Related]  

  • 13. Atomic-resolution STEM in the aberration-corrected JEOL JEM2200FS.
    Klie RF; Johnson C; Zhu Y
    Microsc Microanal; 2008 Feb; 14(1):104-12. PubMed ID: 18171499
    [TBL] [Abstract][Full Text] [Related]  

  • 14. Future trends in aberration-corrected electron microscopy.
    Rose HH
    Philos Trans A Math Phys Eng Sci; 2009 Sep; 367(1903):3809-23. PubMed ID: 19687067
    [TBL] [Abstract][Full Text] [Related]  

  • 15. Examining the stability of folded graphene edges against electron beam induced sputtering with atomic resolution.
    Warner JH; Rümmeli MH; Bachmatiuk A; Büchner B
    Nanotechnology; 2010 Aug; 21(32):325702. PubMed ID: 20639589
    [TBL] [Abstract][Full Text] [Related]  

  • 16. Atomic and nanoscale imaging of a cellulose nanofiber and Pd nanoparticles composite using lower-voltage high-resolution TEM.
    Ohwada M; Mizukoshi Y; Shimokawa T; Hayashi N; Hayasaka Y; Konno TJ
    Microscopy (Oxf); 2017 Oct; 66(5):348-355. PubMed ID: 29016921
    [TBL] [Abstract][Full Text] [Related]  

  • 17. Aberration corrected STEM by means of diffraction gratings.
    Linck M; Ercius PA; Pierce JS; McMorran BJ
    Ultramicroscopy; 2017 Nov; 182():36-43. PubMed ID: 28651199
    [TBL] [Abstract][Full Text] [Related]  

  • 18. The formation and utility of sub-angstrom to nanometer-sized electron probes in the aberration-corrected transmission electron microscope at the University of Illinois.
    Wen J; Mabon J; Lei C; Burdin S; Sammann E; Petrov I; Shah AB; Chobpattana V; Zhang J; Ran K; Zuo JM; Mishina S; Aoki T
    Microsc Microanal; 2010 Apr; 16(2):183-93. PubMed ID: 20187990
    [TBL] [Abstract][Full Text] [Related]  

  • 19. Examining co-based nanocrystals on graphene using low-voltage aberration-corrected transmission electron microscopy.
    Warner JH; Rümmeli MH; Bachmatiuk A; Wilson M; Büchner B
    ACS Nano; 2010 Jan; 4(1):470-6. PubMed ID: 20020749
    [TBL] [Abstract][Full Text] [Related]  

  • 20. Low voltage transmission electron microscopy of graphene.
    Bachmatiuk A; Zhao J; Gorantla SM; Martinez IG; Wiedermann J; Lee C; Eckert J; Rummeli MH
    Small; 2015 Feb; 11(5):515-42. PubMed ID: 25408379
    [TBL] [Abstract][Full Text] [Related]  

    [Next]    [New Search]
    of 13.