These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.
125 related articles for article (PubMed ID: 26125394)
1. Measurement of absolute optical thickness of mask glass by wavelength-tuning Fourier analysis. Kim Y; Hbino K; Sugita N; Mitsuishi M Opt Lett; 2015 Jul; 40(13):3169-72. PubMed ID: 26125394 [TBL] [Abstract][Full Text] [Related]
2. Absolute optical thickness measurement of transparent plate using excess fraction method and wavelength-tuning Fizeau interferometer. Kim Y; Hibino K; Sugita N; Mitsuishi M Opt Express; 2015 Feb; 23(4):4065-73. PubMed ID: 25836445 [TBL] [Abstract][Full Text] [Related]
3. Measurement of optical thickness variation of BK7 plate by wavelength tuning interferometry. Kim Y; Hibino K; Sugita N; Mitsuishi M Opt Express; 2015 Aug; 23(17):22928-38. PubMed ID: 26368260 [TBL] [Abstract][Full Text] [Related]
4. Interferometric profile measurement of optical-thickness by wavelength tuning with suppression of spatially uniform error. Kim Y; Hibino K; Mitsuishi M Opt Express; 2018 Apr; 26(8):10870-10878. PubMed ID: 29716017 [TBL] [Abstract][Full Text] [Related]
5. Simultaneous measurement of surface shape and optical thickness using wavelength tuning and a polynomial window function. Kim Y; Hibino K; Sugita N; Mitsuishi M Opt Express; 2015 Dec; 23(25):32869-80. PubMed ID: 26699074 [TBL] [Abstract][Full Text] [Related]
6. Surface measurement of indium tin oxide thin film by wavelength-tuning Fizeau interferometry. Kim Y; Hibino K; Sugita N; Mitsuishi M Appl Opt; 2015 Aug; 54(23):7135-41. PubMed ID: 26368388 [TBL] [Abstract][Full Text] [Related]
7. Simultaneous measurement of surface shape and variation in optical thickness of a transparent parallel plate in wavelength-scanning Fizeau interferometer. Hibino K; Oreb BF; Fairman PS; Burke J Appl Opt; 2004 Feb; 43(6):1241-9. PubMed ID: 15008525 [TBL] [Abstract][Full Text] [Related]
8. Discontinuous surface measurement by wavelength-tuning interferometry with the excess fraction method correcting scanning nonlinearity. Hibino K; Tani Y; Bitou Y; Takatsuji T; Warisawa S; Mitsuishi M Appl Opt; 2011 Feb; 50(6):962-9. PubMed ID: 21343977 [TBL] [Abstract][Full Text] [Related]
9. Simultaneous measurement of the surface shape and thickness for an optical flat with a wavelength-tuning Fizeau interferometer with suppression of drift error. Kim Y; Moon Y; Hibino K; Sugita N; Mitsuishi M Appl Opt; 2020 Feb; 59(4):991-997. PubMed ID: 32225236 [TBL] [Abstract][Full Text] [Related]
10. Optical homogeneity measurement of parallel plates by wavelength-tuning interferometry using nonuniform fast Fourier transform. Guo R; Liao Z; Li J; Li A; Song P; Zhu R Opt Express; 2019 Apr; 27(9):13072-13082. PubMed ID: 31052837 [TBL] [Abstract][Full Text] [Related]
11. Interferometric measurement of surface shape by wavelength tuning suppressing random intensity error. Kim Y; Hibino K; Sugita N; Mitsuishi M Appl Opt; 2016 Aug; 55(23):6464-70. PubMed ID: 27534496 [TBL] [Abstract][Full Text] [Related]
12. Phase-shifting algorithm inside an optical cavity for absolute length measurement. Hibino K Appl Opt; 2016 Feb; 55(5):1101-6. PubMed ID: 26906383 [TBL] [Abstract][Full Text] [Related]
13. Compensation for correlated error in multilayer interferometer. Kim Y; Hibino K; Sugita N; Mitsuishi M Appl Opt; 2016 Jan; 55(1):171-7. PubMed ID: 26835638 [TBL] [Abstract][Full Text] [Related]
14. Thickness measurement of transparent glass plates using a lateral shearing cyclic path optical configuration setup and polarization phase shifting interferometry. Kumar YP; Chatterjee S Appl Opt; 2010 Nov; 49(33):6552-7. PubMed ID: 21102682 [TBL] [Abstract][Full Text] [Related]
16. Wavelength-scanning interferometry of a transparent parallel plate with refractive-index dispersion. Hibino K; Oreb BF; Fairman PS Appl Opt; 2003 Jul; 42(19):3888-95. PubMed ID: 12868827 [TBL] [Abstract][Full Text] [Related]
17. Absolute wavelength scanning interferometry for measuring the thickness of optical elements. Psota P; Kredba J; Stašík M; Nečásek J; Matoušek O; Lédl V Opt Express; 2023 Jan; 31(3):3565-3578. PubMed ID: 36785346 [TBL] [Abstract][Full Text] [Related]
18. Phase-sensitive swept-source interferometry for absolute ranging with application to measurements of group refractive index and thickness. Moore ED; McLeod RR Opt Express; 2011 Apr; 19(9):8117-26. PubMed ID: 21643062 [TBL] [Abstract][Full Text] [Related]
19. Multiple-surface interferometry of highly reflective wafer by wavelength tuning. Kim Y; Hibino K; Hanayama R; Sugita N; Mitsuishi M Opt Express; 2014 Sep; 22(18):21145-56. PubMed ID: 25321495 [TBL] [Abstract][Full Text] [Related]
20. Wavelength-shift interferometry for distance measurements using the Fourier transform technique for fringe analysis. Suematsu M; Takeda M Appl Opt; 1991 Oct; 30(28):4046-55. PubMed ID: 20706502 [TBL] [Abstract][Full Text] [Related] [Next] [New Search]