These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.
230 related articles for article (PubMed ID: 26141289)
1. Theoretical study of precision and accuracy of strain analysis by nano-beam electron diffraction. Mahr C; Müller-Caspary K; Grieb T; Schowalter M; Mehrtens T; Krause FF; Zillmann D; Rosenauer A Ultramicroscopy; 2015 Nov; 158():38-48. PubMed ID: 26141289 [TBL] [Abstract][Full Text] [Related]
2. Strain measurement at the nanoscale: Comparison between convergent beam electron diffraction, nano-beam electron diffraction, high resolution imaging and dark field electron holography. Béché A; Rouvière JL; Barnes JP; Cooper D Ultramicroscopy; 2013 Aug; 131():10-23. PubMed ID: 23673283 [TBL] [Abstract][Full Text] [Related]
3. Accurate measurement of strain at interfaces in 4D-STEM: A comparison of various methods. Mahr C; Müller-Caspary K; Grieb T; Krause FF; Schowalter M; Rosenauer A Ultramicroscopy; 2021 Feb; 221():113196. PubMed ID: 33341079 [TBL] [Abstract][Full Text] [Related]
4. Strain analysis from nano-beam electron diffraction: Influence of specimen tilt and beam convergence. Grieb T; Krause FF; Schowalter M; Zillmann D; Sellin R; Müller-Caspary K; Mahr C; Mehrtens T; Bimberg D; Rosenauer A Ultramicroscopy; 2018 Jul; 190():45-57. PubMed ID: 29783102 [TBL] [Abstract][Full Text] [Related]
5. Optimization of NBED simulations for disc-detection measurements. Grieb T; Krause FF; Mahr C; Zillmann D; Müller-Caspary K; Schowalter M; Rosenauer A Ultramicroscopy; 2017 Oct; 181():50-60. PubMed ID: 28500987 [TBL] [Abstract][Full Text] [Related]
6. Two-dimensional Gaussian fitting for precise measurement of lattice constant deviation from a selected-area diffraction map. Bekarevich R; Mitsuishi K; Ohnishi T; Uesugi F; Takeguchi M; Inaguma Y; Ohno T; Takada K Microscopy (Oxf); 2018 Mar; 67(suppl_1):i142-i149. PubMed ID: 29253238 [TBL] [Abstract][Full Text] [Related]
7. Influence of distortions of recorded diffraction patterns on strain analysis by nano-beam electron diffraction. Mahr C; Müller-Caspary K; Ritz R; Simson M; Grieb T; Schowalter M; Krause FF; Lackmann A; Soltau H; Wittstock A; Rosenauer A Ultramicroscopy; 2019 Jan; 196():74-82. PubMed ID: 30291992 [TBL] [Abstract][Full Text] [Related]
8. High-resolution scanning precession electron diffraction: Alignment and spatial resolution. Barnard JS; Johnstone DN; Midgley PA Ultramicroscopy; 2017 Mar; 174():79-88. PubMed ID: 28042983 [TBL] [Abstract][Full Text] [Related]
9. Improvement of the precision of lattice parameter determination by nano-beam electron diffraction. Saitoh K; Nakahara H; Tanaka N Microscopy (Oxf); 2013; 62(5):533-9. PubMed ID: 23599358 [TBL] [Abstract][Full Text] [Related]
10. Towards the interpretation of a shift of the central beam in nano-beam electron diffraction as a change in mean inner potential. Mahr C; Grieb T; Krause FF; Schowalter M; Rosenauer A Ultramicroscopy; 2022 Jun; 236():113503. PubMed ID: 35278874 [TBL] [Abstract][Full Text] [Related]
11. Assessing the precision of strain measurements using electron backscatter diffraction--part 1: detector assessment. Britton TB; Jiang J; Clough R; Tarleton E; Kirkland AI; Wilkinson AJ Ultramicroscopy; 2013 Dec; 135():126-35. PubMed ID: 24018163 [TBL] [Abstract][Full Text] [Related]
12. Strain mapping in selected area electron diffraction method combining a Cs-corrected TEM with a stage scanning system. Uesugi F Ultramicroscopy; 2013 Dec; 135():80-3. PubMed ID: 23942311 [TBL] [Abstract][Full Text] [Related]
13. Accuracy and precision of thickness determination from position-averaged convergent beam electron diffraction patterns using a single-parameter metric. Pollock JA; Weyland M; Taplin DJ; Allen LJ; Findlay SD Ultramicroscopy; 2017 Oct; 181():86-96. PubMed ID: 28527314 [TBL] [Abstract][Full Text] [Related]
14. Lattice strain mapping using circular Hough transform for electron diffraction disk detection. Yuan R; Zhang J; Zuo JM Ultramicroscopy; 2019 Dec; 207():112837. PubMed ID: 31539866 [TBL] [Abstract][Full Text] [Related]
15. Improving accuracy and precision of strain analysis by energy-filtered nanobeam electron diffraction. Hähnel A; Reiche M; Moutanabbir O; Blumtritt H; Geisler H; Höntschel J; Engelmann HJ Microsc Microanal; 2012 Feb; 18(1):229-40. PubMed ID: 22258726 [TBL] [Abstract][Full Text] [Related]
16. Refinement of the 200 structure factor for GaAs using parallel and convergent beam electron nanodiffraction data. Müller K; Schowalter M; Jansen J; Tsuda K; Titantah J; Lamoen D; Rosenauer A Ultramicroscopy; 2009 Jun; 109(7):802-14. PubMed ID: 19386419 [TBL] [Abstract][Full Text] [Related]
17. Strain measurement in semiconductor heterostructures by scanning transmission electron microscopy. Müller K; Rosenauer A; Schowalter M; Zweck J; Fritz R; Volz K Microsc Microanal; 2012 Oct; 18(5):995-1009. PubMed ID: 23026441 [TBL] [Abstract][Full Text] [Related]
18. Position averaged convergent beam electron diffraction: theory and applications. Lebeau JM; Findlay SD; Allen LJ; Stemmer S Ultramicroscopy; 2010 Jan; 110(2):118-25. PubMed ID: 19939565 [TBL] [Abstract][Full Text] [Related]
19. Bloch wave simulations in the frozen lattice approximation. Yamazaki T; Ohtsuka M; Kotaka Y; Watanabe K Ultramicroscopy; 2013 Dec; 135():16-23. PubMed ID: 23872038 [TBL] [Abstract][Full Text] [Related]
20. Development of splitting convergent beam electron diffraction (SCBED). Houdellier F; Röder F; Snoeck E Ultramicroscopy; 2015 Dec; 159 Pt 1():59-66. PubMed ID: 26319180 [TBL] [Abstract][Full Text] [Related] [Next] [New Search]