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4. Measuring Three-Dimensional Strain and Structural Defects in a Single InGaAs Nanowire Using Coherent X-ray Multiangle Bragg Projection Ptychography. Hill MO; Calvo-Almazan I; Allain M; Holt MV; Ulvestad A; Treu J; Koblmüller G; Huang C; Huang X; Yan H; Nazaretski E; Chu YS; Stephenson GB; Chamard V; Lauhon LJ; Hruszkewycz SO Nano Lett; 2018 Feb; 18(2):811-819. PubMed ID: 29345956 [TBL] [Abstract][Full Text] [Related]
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