These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.


BIOMARKERS

Molecular Biopsy of Human Tumors

- a resource for Precision Medicine *

133 related articles for article (PubMed ID: 26204428)

  • 1. Measuring Compositions in Organic Depth Profiling: Results from a VAMAS Interlaboratory Study.
    Shard AG; Havelund R; Spencer SJ; Gilmore IS; Alexander MR; Angerer TB; Aoyagi S; Barnes JP; Benayad A; Bernasik A; Ceccone G; Counsell JD; Deeks C; Fletcher JS; Graham DJ; Heuser C; Lee TG; Marie C; Marzec MM; Mishra G; Rading D; Renault O; Scurr DJ; Shon HK; Spampinato V; Tian H; Wang F; Winograd N; Wu K; Wucher A; Zhou Y; Zhu Z; Cristaudo V; Poleunis C
    J Phys Chem B; 2015 Aug; 119(33):10784-97. PubMed ID: 26204428
    [TBL] [Abstract][Full Text] [Related]  

  • 2. Argon cluster ion beams for organic depth profiling: results from a VAMAS interlaboratory study.
    Shard AG; Havelund R; Seah MP; Spencer SJ; Gilmore IS; Winograd N; Mao D; Miyayama T; Niehuis E; Rading D; Moellers R
    Anal Chem; 2012 Sep; 84(18):7865-73. PubMed ID: 22897795
    [TBL] [Abstract][Full Text] [Related]  

  • 3. Depth resolution at organic interfaces sputtered by argon gas cluster ions: the effect of energy, angle and cluster size.
    Seah MP; Spencer SJ; Havelund R; Gilmore IS; Shard AG
    Analyst; 2015 Oct; 140(19):6508-16. PubMed ID: 26325511
    [TBL] [Abstract][Full Text] [Related]  

  • 4. Quantitative analysis of ToF-SIMS data of a two organic compound mixture using an autoencoder and simple artificial neural networks.
    Aoyagi S; Matsuda K
    Rapid Commun Mass Spectrom; 2023 Feb; 37(4):e9445. PubMed ID: 36457202
    [TBL] [Abstract][Full Text] [Related]  

  • 5. Cluster ion beam profiling of organics by secondary ion mass spectrometry--does sodium affect the molecular ion intensity at interfaces?
    Green FM; Gilmore IS; Seah MP
    Rapid Commun Mass Spectrom; 2008 Dec; 22(24):4178-82. PubMed ID: 19039819
    [TBL] [Abstract][Full Text] [Related]  

  • 6. Organic depth profiling of a nanostructured delta layer reference material using large argon cluster ions.
    Lee JL; Ninomiya S; Matsuo J; Gilmore IS; Seah MP; Shard AG
    Anal Chem; 2010 Jan; 82(1):98-105. PubMed ID: 19957960
    [TBL] [Abstract][Full Text] [Related]  

  • 7. Quantitative and Qualitative Analyses of Mass Spectra of OEL Materials by Artificial Neural Network and Interface Evaluation: Results from a VAMAS Interlaboratory Study.
    Aoyagi S; Cant DJH; Dürr M; Eyres A; Fearn S; Gilmore IS; Iida SI; Ikeda R; Ishikawa K; Lagator M; Lockyer N; Keller P; Matsuda K; Murayama Y; Okamoto M; Reed BP; Shard AG; Takano A; Trindade GF; Vorng JL
    Anal Chem; 2023 Oct; 95(40):15078-15085. PubMed ID: 37715701
    [TBL] [Abstract][Full Text] [Related]  

  • 8. Sputtering Yields for Mixtures of Organic Materials Using Argon Gas Cluster Ions.
    Seah MP; Havelund R; Shard AG; Gilmore IS
    J Phys Chem B; 2015 Oct; 119(42):13433-9. PubMed ID: 26421437
    [TBL] [Abstract][Full Text] [Related]  

  • 9. Cluster secondary ion mass spectrometry and the temperature dependence of molecular depth profiles.
    Mao D; Wucher A; Brenes DA; Lu C; Winograd N
    Anal Chem; 2012 May; 84(9):3981-9. PubMed ID: 22455606
    [TBL] [Abstract][Full Text] [Related]  

  • 10. Sample cooling or rotation improves C60 organic depth profiles of multilayered reference samples: results from a VAMAS interlaboratory study.
    Sjövall P; Rading D; Ray S; Yang L; Shard AG
    J Phys Chem B; 2010 Jan; 114(2):769-74. PubMed ID: 20020719
    [TBL] [Abstract][Full Text] [Related]  

  • 11. Argon cluster ion source evaluation on lipid standards and rat brain tissue samples.
    Bich C; Havelund R; Moellers R; Touboul D; Kollmer F; Niehuis E; Gilmore IS; Brunelle A
    Anal Chem; 2013 Aug; 85(16):7745-52. PubMed ID: 23875833
    [TBL] [Abstract][Full Text] [Related]  

  • 12. Enhanced surface sensitivity in secondary ion mass spectrometric analysis of organic thin films using size-selected Ar gas-cluster ion projectiles.
    Tanaka M; Moritani K; Hirota T; Toyoda N; Yamada I; Inui N; Mochiji K
    Rapid Commun Mass Spectrom; 2010 May; 24(10):1405-10. PubMed ID: 20411579
    [TBL] [Abstract][Full Text] [Related]  

  • 13. Evaluation of Time-of-Flight Secondary Ion Mass Spectrometry Spectra of Peptides by Random Forest with Amino Acid Labels: Results from a Versailles Project on Advanced Materials and Standards Interlaboratory Study.
    Aoyagi S; Fujiwara Y; Takano A; Vorng JL; Gilmore IS; Wang YC; Tallarek E; Hagenhoff B; Iida SI; Luch A; Jungnickel H; Lang Y; Shon HK; Lee TG; Li Z; Matsuda K; Mihara I; Miisho A; Murayama Y; Nagatomi T; Ikeda R; Okamoto M; Saiga K; Tsuchiya T; Uemura S
    Anal Chem; 2021 Mar; 93(9):4191-4197. PubMed ID: 33635050
    [TBL] [Abstract][Full Text] [Related]  

  • 14. Analyzing 3D hyperspectral TOF-SIMS depth profile data using self-organizing map-relational perspective mapping.
    Gardner W; Winkler DA; Ballabio D; Muir BW; Pigram PJ
    Biointerphases; 2020 Nov; 15(6):061004. PubMed ID: 33198474
    [TBL] [Abstract][Full Text] [Related]  

  • 15. Quantification of calcium content in bone by using ToF-SIMS--a first approach.
    Henss A; Rohnke M; Knaack S; Kleine-Boymann M; Leichtweiss T; Schmitz P; El Khassawna T; Gelinsky M; Heiss C; Janek J
    Biointerphases; 2013 Dec; 8(1):31. PubMed ID: 24706141
    [TBL] [Abstract][Full Text] [Related]  

  • 16. Hybrid Perovskites Depth Profiling with Variable-Size Argon Clusters and Monatomic Ions Beams.
    Noël C; Pescetelli S; Agresti A; Franquet A; Spampinato V; Felten A; di Carlo A; Houssiau L; Busby Y
    Materials (Basel); 2019 Mar; 12(5):. PubMed ID: 30832309
    [TBL] [Abstract][Full Text] [Related]  

  • 17. SIMS of Organic Materials-Interface Location in Argon Gas Cluster Depth Profiles Using Negative Secondary Ions.
    Havelund R; Seah MP; Tiddia M; Gilmore IS
    J Am Soc Mass Spectrom; 2018 Apr; 29(4):774-785. PubMed ID: 29468500
    [TBL] [Abstract][Full Text] [Related]  

  • 18. Precise and fast secondary ion mass spectrometry depth profiling of polymer materials with large Ar cluster ion beams.
    Ninomiya S; Ichiki K; Yamada H; Nakata Y; Seki T; Aoki T; Matsuo J
    Rapid Commun Mass Spectrom; 2009 Jun; 23(11):1601-6. PubMed ID: 19399762
    [TBL] [Abstract][Full Text] [Related]  

  • 19. Parallel detection, quantification, and depth profiling of peptides with dynamic-secondary ion mass spectrometry (D-SIMS) ionized by C60(+)-Ar(+) co-sputtering.
    Chang CJ; Chang HY; You YW; Liao HY; Kuo YT; Kao WL; Yen GJ; Tsai MH; Shyue JJ
    Anal Chim Acta; 2012 Mar; 718():64-9. PubMed ID: 22305899
    [TBL] [Abstract][Full Text] [Related]  

  • 20. Depth resolution, angle dependence, and the sputtering yield of Irganox 1010 by coronene primary ions.
    Seah MP; Spencer SJ; Shard AG
    J Phys Chem B; 2013 Oct; 117(39):11885-92. PubMed ID: 24010582
    [TBL] [Abstract][Full Text] [Related]  

    [Next]    [New Search]
    of 7.