These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.
246 related articles for article (PubMed ID: 26381074)
21. On the Limits of Scanning Thermal Microscopy of Ultrathin Films. Metzke C; Frammelsberger W; Weber J; Kühnel F; Zhu K; Lanza M; Benstetter AG Materials (Basel); 2020 Jan; 13(3):. PubMed ID: 31978971 [TBL] [Abstract][Full Text] [Related]
22. Interpreting Kelvin probe force microscopy under an applied electric field: local electronic behavior of vapor-liquid-solid Si nanowires. Quitoriano NJ; Sanderson RN; Bae SS; Ragan R Nanotechnology; 2013 May; 24(20):205704. PubMed ID: 23609527 [TBL] [Abstract][Full Text] [Related]
23. Large area scanning probe microscope in ultra-high vacuum demonstrated for electrostatic force measurements on high-voltage devices. Gysin U; Glatzel T; Schmölzer T; Schöner A; Reshanov S; Bartolf H; Meyer E Beilstein J Nanotechnol; 2015; 6():2485-97. PubMed ID: 26885461 [TBL] [Abstract][Full Text] [Related]
24. Experimental setup for thermal measurements at the nanoscale using a SThM probe with niobium nitride thermometer. Swami R; Julié G; Le-Denmat S; Pernot G; Singhal D; Paterson J; Maire J; Motte JF; Paillet N; Guillou H; Gomès S; Bourgeois O Rev Sci Instrum; 2024 May; 95(5):. PubMed ID: 38814363 [TBL] [Abstract][Full Text] [Related]
25. Kelvin probe force microscopy in application to biomolecular films: frequency modulation, amplitude modulation, and lift mode. Moores B; Hane F; Eng L; Leonenko Z Ultramicroscopy; 2010 May; 110(6):708-11. PubMed ID: 20363077 [TBL] [Abstract][Full Text] [Related]
26. Ultra-high vacuum scanning thermal microscopy for nanometer resolution quantitative thermometry. Kim K; Jeong W; Lee W; Reddy P ACS Nano; 2012 May; 6(5):4248-57. PubMed ID: 22530657 [TBL] [Abstract][Full Text] [Related]
28. A dark mode in scanning thermal microscopy. Ramiandrisoa L; Allard A; Joumani Y; Hay B; Gomés S Rev Sci Instrum; 2017 Dec; 88(12):125115. PubMed ID: 29289173 [TBL] [Abstract][Full Text] [Related]
29. Open-loop band excitation Kelvin probe force microscopy. Guo S; Kalinin SV; Jesse S Nanotechnology; 2012 Mar; 23(12):125704. PubMed ID: 22407131 [TBL] [Abstract][Full Text] [Related]
30. Practical aspects of single-pass scan Kelvin probe force microscopy. Li G; Mao B; Lan F; Liu L Rev Sci Instrum; 2012 Nov; 83(11):113701. PubMed ID: 23206065 [TBL] [Abstract][Full Text] [Related]
31. Nano-Localized Thermal Analysis and Mapping of Surface and Sub-Surface Thermal Properties Using Scanning Thermal Microscopy (SThM). Pereira MJ; Amaral JS; Silva NJ; Amaral VS Microsc Microanal; 2016 Dec; 22(6):1270-1280. PubMed ID: 27869043 [TBL] [Abstract][Full Text] [Related]
32. The influence of surface topography on Kelvin probe force microscopy. Sadewasser S; Leendertz C; Streicher F; Lux-Steiner MCh Nanotechnology; 2009 Dec; 20(50):505503. PubMed ID: 19934483 [TBL] [Abstract][Full Text] [Related]
33. High resolution direct measurement of temperature distribution in silicon nanophotonics devices. Tzur M; Desiatov B; Goykhman I; Grajower M; Levy U Opt Express; 2013 Dec; 21(24):29195-204. PubMed ID: 24514471 [TBL] [Abstract][Full Text] [Related]
34. Determination of effective tip geometries in Kelvin probe force microscopy on thin insulating films on metals. Glatzel T; Zimmerli L; Koch S; Such B; Kawai S; Meyer E Nanotechnology; 2009 Jul; 20(26):264016. PubMed ID: 19509456 [TBL] [Abstract][Full Text] [Related]
35. Real-space measurement of potential distribution in PECVD ONO electrets by Kelvin probe force microscopy. Emmerich F; Thielemann C Nanotechnology; 2016 May; 27(20):205703. PubMed ID: 27053633 [TBL] [Abstract][Full Text] [Related]
36. Know your full potential: Quantitative Kelvin probe force microscopy on nanoscale electrical devices. Axt A; Hermes IM; Bergmann VW; Tausendpfund N; Weber SAL Beilstein J Nanotechnol; 2018; 9():1809-1819. PubMed ID: 29977714 [TBL] [Abstract][Full Text] [Related]
37. High-speed digitization of the amplitude and frequency in open-loop sideband frequency-modulation Kelvin probe force microscopy. Stan G Nanotechnology; 2020 Jun; 31(38):385706. PubMed ID: 32516761 [TBL] [Abstract][Full Text] [Related]