262 related articles for article (PubMed ID: 26522311)
1. Nitric oxide assisted C60 secondary ion mass spectrometry for molecular depth profiling of polyelectrolyte multilayers.
Zappalà G; Motta V; Tuccitto N; Vitale S; Torrisi A; Licciardello A
Rapid Commun Mass Spectrom; 2015 Dec; 29(23):2204-10. PubMed ID: 26522311
[TBL] [Abstract][Full Text] [Related]
2. Improving secondary ion mass spectrometry C60(n+) sputter depth profiling of challenging polymers with nitric oxide gas dosing.
Havelund R; Licciardello A; Bailey J; Tuccitto N; Sapuppo D; Gilmore IS; Sharp JS; Lee JL; Mouhib T; Delcorte A
Anal Chem; 2013 May; 85(10):5064-70. PubMed ID: 23590425
[TBL] [Abstract][Full Text] [Related]
3. Parallel detection, quantification, and depth profiling of peptides with dynamic-secondary ion mass spectrometry (D-SIMS) ionized by C60(+)-Ar(+) co-sputtering.
Chang CJ; Chang HY; You YW; Liao HY; Kuo YT; Kao WL; Yen GJ; Tsai MH; Shyue JJ
Anal Chim Acta; 2012 Mar; 718():64-9. PubMed ID: 22305899
[TBL] [Abstract][Full Text] [Related]
4. Molecular depth profiling of multilayer polymer films using time-of-flight secondary ion mass spectrometry.
Wagner MS
Anal Chem; 2005 Feb; 77(3):911-22. PubMed ID: 15679361
[TBL] [Abstract][Full Text] [Related]
5. Depth profiling of peptide films with TOF-SIMS and a C60 probe.
Cheng J; Winograd N
Anal Chem; 2005 Jun; 77(11):3651-9. PubMed ID: 15924401
[TBL] [Abstract][Full Text] [Related]
6. TOF-SIMS 3D biomolecular imaging of Xenopus laevis oocytes using buckminsterfullerene (C60) primary ions.
Fletcher JS; Lockyer NP; Vaidyanathan S; Vickerman JC
Anal Chem; 2007 Mar; 79(6):2199-206. PubMed ID: 17302385
[TBL] [Abstract][Full Text] [Related]
7. TOF-SIMS with argon gas cluster ion beams: a comparison with C60+.
Rabbani S; Barber AM; Fletcher JS; Lockyer NP; Vickerman JC
Anal Chem; 2011 May; 83(10):3793-800. PubMed ID: 21462969
[TBL] [Abstract][Full Text] [Related]
8. Depth resolution during C60+ profiling of multilayer molecular films.
Zheng L; Wucher A; Winograd N
Anal Chem; 2008 Oct; 80(19):7363-71. PubMed ID: 18778034
[TBL] [Abstract][Full Text] [Related]
9. TOF-SIMS analysis using C60. Effect of impact energy on yield and damage.
Fletcher JS; Conlan XA; Jones EA; Biddulph G; Lockyer NP; Vickerman JC
Anal Chem; 2006 Mar; 78(6):1827-31. PubMed ID: 16536417
[TBL] [Abstract][Full Text] [Related]
10. Protocols for three-dimensional molecular imaging using mass spectrometry.
Wucher A; Cheng J; Winograd N
Anal Chem; 2007 Aug; 79(15):5529-39. PubMed ID: 17583913
[TBL] [Abstract][Full Text] [Related]
11. ToF-SIMS Depth Profiling of PS-b-PMMA Block Copolymers Using Ar
Terlier T; Zappalà G; Marie C; Leonard D; Barnes JP; Licciardello A
Anal Chem; 2017 Jul; 89(13):6984-6991. PubMed ID: 28617583
[TBL] [Abstract][Full Text] [Related]
12. C60+ secondary ion microscopy using a delay line detector.
Klerk LA; Lockyer NP; Kharchenko A; MacAleese L; Dankers PY; Vickerman JC; Heeren RM
Anal Chem; 2010 Feb; 82(3):801-7. PubMed ID: 20043656
[TBL] [Abstract][Full Text] [Related]
13. Depth profiling cross-linked poly(methyl methacrylate) films: a time-of-flight secondary ion mass spectrometry approach.
Naderi-Gohar S; Huang KM; Wu Y; Lau WM; Nie HY
Rapid Commun Mass Spectrom; 2017 Feb; 31(4):381-388. PubMed ID: 27933719
[TBL] [Abstract][Full Text] [Related]
14. Effects of the temperature and beam parameters on depth profiles in X-ray photoelectron spectrometry and secondary ion mass spectrometry under C60(+)-Ar(+) cosputtering.
Liao HY; Tsai MH; Kao WL; Kuo DY; Shyue JJ
Anal Chim Acta; 2014 Dec; 852():129-36. PubMed ID: 25441889
[TBL] [Abstract][Full Text] [Related]
15. A C60 primary ion beam system for time of flight secondary ion mass spectrometry: its development and secondary ion yield characteristics.
Weibel D; Wong S; Lockyer N; Blenkinsopp P; Hill R; Vickerman JC
Anal Chem; 2003 Apr; 75(7):1754-64. PubMed ID: 12705613
[TBL] [Abstract][Full Text] [Related]
16. Enhancing the sensitivity of molecular secondary ion mass spectrometry with C60+-O2+ cosputtering.
Liao HY; Lin KY; Kao WL; Chang HY; Huang CC; Shyue JJ
Anal Chem; 2013 Apr; 85(7):3781-8. PubMed ID: 23461551
[TBL] [Abstract][Full Text] [Related]
17. Evaluation of C60 secondary ion mass spectrometry for the chemical analysis and imaging of fingerprints.
Sisco E; Demoranville LT; Gillen G
Forensic Sci Int; 2013 Sep; 231(1-3):263-9. PubMed ID: 23890648
[TBL] [Abstract][Full Text] [Related]
18. Secondary ion MS imaging of lipids in picoliter vials with a buckminsterfullerene ion source.
Ostrowski SG; Szakal C; Kozole J; Roddy TP; Xu J; Ewing AG; Winograd N
Anal Chem; 2005 Oct; 77(19):6190-6. PubMed ID: 16194078
[TBL] [Abstract][Full Text] [Related]
19. Carbon-13 labeled polymers: an alternative tracer for depth profiling of polymer films and multilayers using secondary ion mass spectrometry.
Harton SE; Stevie FA; Zhu Z; Ade H
Anal Chem; 2006 May; 78(10):3452-60. PubMed ID: 16689549
[TBL] [Abstract][Full Text] [Related]
20. Molecular depth profiling of organic photovoltaic heterojunction layers by ToF-SIMS: comparative evaluation of three sputtering beams.
Mouhib T; Poleunis C; Wehbe N; Michels JJ; Galagan Y; Houssiau L; Bertrand P; Delcorte A
Analyst; 2013 Nov; 138(22):6801-10. PubMed ID: 24058924
[TBL] [Abstract][Full Text] [Related]
[Next] [New Search]
