158 related articles for article (PubMed ID: 26522311)
61. Effects of cryogenic sample analysis on molecular depth profiles with TOF-secondary ion mass spectrometry.
Piwowar AM; Fletcher JS; Kordys J; Lockyer NP; Winograd N; Vickerman JC
Anal Chem; 2010 Oct; 82(19):8291-9. PubMed ID: 20836508
[TBL] [Abstract][Full Text] [Related]
62. Chemically alternating Langmuir-Blodgett thin films as a model for molecular depth profiling by mass spectrometry.
Zheng L; Wucher A; Winograd N
J Am Soc Mass Spectrom; 2008 Jan; 19(1):96-102. PubMed ID: 18293488
[TBL] [Abstract][Full Text] [Related]
63. Modeling of the sputtering process of cubic silver halide microcrystals and its relevance in depth profiling by secondary-ion mass spectrometry (SIMS).
Lenaerts J; Verlinden G; Ignatova VA; Van Vaeck L; Gijbels R; Geuens I
Fresenius J Anal Chem; 2001 Jul; 370(5):654-62. PubMed ID: 11497001
[TBL] [Abstract][Full Text] [Related]
64. Three-dimensional localization of polymer nanoparticles in cells using ToF-SIMS.
Graham DJ; Wilson JT; Lai JJ; Stayton PS; Castner DG
Biointerphases; 2015 Jun; 11(2):02A304. PubMed ID: 26531772
[TBL] [Abstract][Full Text] [Related]
65. Label free biochemical 2D and 3D imaging using secondary ion mass spectrometry.
Fletcher JS; Vickerman JC; Winograd N
Curr Opin Chem Biol; 2011 Oct; 15(5):733-40. PubMed ID: 21664172
[TBL] [Abstract][Full Text] [Related]
66. Recent advances in biological tissue imaging with Time-of-flight Secondary Ion Mass Spectrometry: polyatomic ion sources, sample preparation, and applications.
Brunelle A; Laprévote O
Curr Pharm Des; 2007; 13(32):3335-43. PubMed ID: 18045187
[TBL] [Abstract][Full Text] [Related]
67. Mass spectrometric imaging of brain tissue by time-of-flight secondary ion mass spectrometry--How do polyatomic primary beams C₆₀⁺, Ar₂₀₀₀⁺, water-doped Ar₂₀₀₀⁺ and (H₂O)₆₀₀₀⁺ compare?
Razo IB; Sheraz Sn; Henderson A; Lockyer NP; Vickerman JC
Rapid Commun Mass Spectrom; 2015 Oct; 29(20):1851-62. PubMed ID: 26411506
[TBL] [Abstract][Full Text] [Related]
68. Identifying individual cell types in heterogeneous cultures using secondary ion mass spectrometry imaging with C60 etching and multivariate analysis.
Barnes CA; Brison J; Robinson M; Graham DJ; Castner DG; Ratner BD
Anal Chem; 2012 Jan; 84(2):893-900. PubMed ID: 22098081
[TBL] [Abstract][Full Text] [Related]
69. Influence of the organic layer thickness in (metal-assisted) secondary ion mass spectrometry using Ga+ and C60+ projectiles.
Wehbe N; Mouhib T; Prabhakaran A; Bertrand P; Delcorte A
J Am Soc Mass Spectrom; 2009 Dec; 20(12):2294-303. PubMed ID: 19811931
[TBL] [Abstract][Full Text] [Related]
70. Temperature Effects of Sputtering of Langmuir-Blodgett Multilayers.
Mao D; Brenes DA; Lu C; Wucher A; Winograd N
Surf Interface Anal; 2013 Jan; 45(1):65-67. PubMed ID: 23397359
[TBL] [Abstract][Full Text] [Related]
71. Reducing the Matrix Effect in Organic Cluster SIMS Using Dynamic Reactive Ionization.
Tian H; Wucher A; Winograd N
J Am Soc Mass Spectrom; 2016 Dec; 27(12):2014-2024. PubMed ID: 27659034
[TBL] [Abstract][Full Text] [Related]
72. Ionization effects in molecular depth profiling of trehalose films using buckminsterfullerene (C
Lu C; Wucher A; Winograd N
Surf Interface Anal; 2011 Feb; 43(1-2):. PubMed ID: 24347742
[TBL] [Abstract][Full Text] [Related]
73. Sputtering yields for C60 and Au3 bombardment of water ice as a function of incident kinetic energy.
Russo MF; Szakal C; Kozole J; Winograd N; Garrison BJ
Anal Chem; 2007 Jun; 79(12):4493-8. PubMed ID: 17503768
[TBL] [Abstract][Full Text] [Related]
74. Depth-profiling X-ray photoelectron spectroscopy (XPS) analysis of interlayer diffusion in polyelectrolyte multilayers.
Gilbert JB; Rubner MF; Cohen RE
Proc Natl Acad Sci U S A; 2013 Apr; 110(17):6651-6. PubMed ID: 23569265
[TBL] [Abstract][Full Text] [Related]
75. Fundamental studies of molecular depth profiling using organic delta layers as model systems.
Lu C; Wucher A; Winograd N
Surf Interface Anal; 2011 Jan; 43(1-2):. PubMed ID: 24347743
[TBL] [Abstract][Full Text] [Related]
76. Using Focused Ion Beam Time-of-Flight Secondary Ion Mass Spectrometry to Depth Profile Nanoparticles in Polymer Nanocomposites.
Zhang AC; Maguire SM; Ford JT; Composto RJ
Microsc Microanal; 2023 Sep; 29(5):1557-1565. PubMed ID: 37639375
[TBL] [Abstract][Full Text] [Related]
77. Retrospective sputter depth profiling using 3D mass spectral imaging.
Zheng L; Wucher A; Winograd N
Surf Interface Anal; 2011 Feb; 43(1-2):. PubMed ID: 24347744
[TBL] [Abstract][Full Text] [Related]
78. C60-SIMS imaging of nanoparticles within mammalian cells.
Bloom AN; Tian H; Winograd N
Biointerphases; 2015 Jul; 11(2):02A306. PubMed ID: 26721414
[TBL] [Abstract][Full Text] [Related]
79. Chemical microcharacterization of ultrathin iodide conversion layers and adsorbed thiocyanate surface layers on silver halide microcrystals with time-of-flight SIMS.
Verlinden G; Gijbels R; Geuens I
Microsc Microanal; 2002 Jun; 8(3):216-26. PubMed ID: 12533237
[TBL] [Abstract][Full Text] [Related]
80. Quantitative depth profiling of argon in tungsten films by secondary ion mass spectrometry.
Yamazaki H
Anal Sci; 2001 Mar; 17(3):407-10. PubMed ID: 11990617
[TBL] [Abstract][Full Text] [Related]
[Previous] [Next] [New Search]