These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.
13. High resolution atomic force and Kelvin probe force microscopy image data of InAs(001) surface using frequency modulation method. Park YM; Park JS; Chung CH; Lee S Data Brief; 2020 Apr; 29():105177. PubMed ID: 32055662 [TBL] [Abstract][Full Text] [Related]
14. Quantitative 3D-KPFM imaging with simultaneous electrostatic force and force gradient detection. Collins L; Okatan MB; Li Q; Kravenchenko II; Lavrik NV; Kalinin SV; Rodriguez BJ; Jesse S Nanotechnology; 2015 May; 26(17):175707. PubMed ID: 25851168 [TBL] [Abstract][Full Text] [Related]
15. Breaking the Time Barrier in Kelvin Probe Force Microscopy: Fast Free Force Reconstruction Using the G-Mode Platform. Collins L; Ahmadi M; Wu T; Hu B; Kalinin SV; Jesse S ACS Nano; 2017 Sep; 11(9):8717-8729. PubMed ID: 28780850 [TBL] [Abstract][Full Text] [Related]
16. High spatial resolution Kelvin probe force microscopy with coaxial probes. Brown KA; Satzinger KJ; Westervelt RM Nanotechnology; 2012 Mar; 23(11):115703. PubMed ID: 22369870 [TBL] [Abstract][Full Text] [Related]
17. Submolecular Imaging by Noncontact Atomic Force Microscopy with an Oxygen Atom Rigidly Connected to a Metallic Probe. Mönig H; Hermoso DR; Díaz Arado O; Todorović M; Timmer A; Schüer S; Langewisch G; Pérez R; Fuchs H ACS Nano; 2016 Jan; 10(1):1201-9. PubMed ID: 26605698 [TBL] [Abstract][Full Text] [Related]
18. On the relevance of the atomic-scale contact potential difference by amplitude-modulation and frequency-modulation Kelvin probe force microscopy. Nony L; Bocquet F; Loppacher C; Glatzel T Nanotechnology; 2009 Jul; 20(26):264014. PubMed ID: 19509441 [TBL] [Abstract][Full Text] [Related]
19. Pulsed Force Kelvin Probe Force Microscopy. Jakob DS; Wang H; Xu XG ACS Nano; 2020 Apr; 14(4):4839-4848. PubMed ID: 32283008 [TBL] [Abstract][Full Text] [Related]
20. The influence of surface topography on Kelvin probe force microscopy. Sadewasser S; Leendertz C; Streicher F; Lux-Steiner MCh Nanotechnology; 2009 Dec; 20(50):505503. PubMed ID: 19934483 [TBL] [Abstract][Full Text] [Related] [Next] [New Search]