These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.
353 related articles for article (PubMed ID: 27000483)
1. Improvement of the gas cluster ion beam-(GCIB)-based molecular secondary ion mass spectroscopy (SIMS) depth profile with O2(+) cosputtering. Chu YH; Liao HY; Lin KY; Chang HY; Kao WL; Kuo DY; You YW; Chu KJ; Wu CY; Shyue JJ Analyst; 2016 Apr; 141(8):2523-33. PubMed ID: 27000483 [TBL] [Abstract][Full Text] [Related]
2. Effect of energy per atom (E/n) on the Ar gas cluster ion beam (Ar-GCIB) and O Wang SK; Chang HY; Chu YH; Kao WL; Wu CY; Lee YW; You YW; Chu KJ; Hung SH; Shyue JJ Analyst; 2019 May; 144(10):3323-3333. PubMed ID: 30968864 [TBL] [Abstract][Full Text] [Related]
3. Enhancing the sensitivity of molecular secondary ion mass spectrometry with C60+-O2+ cosputtering. Liao HY; Lin KY; Kao WL; Chang HY; Huang CC; Shyue JJ Anal Chem; 2013 Apr; 85(7):3781-8. PubMed ID: 23461551 [TBL] [Abstract][Full Text] [Related]
4. Study on the detection limits of a new argon gas cluster ion beam secondary ion mass spectrometry apparatus using lipid compound samples. Fujii M; Nakagawa S; Matsuda K; Man N; Seki T; Aoki T; Matsuo J Rapid Commun Mass Spectrom; 2014 Apr; 28(8):917-20. PubMed ID: 24623696 [TBL] [Abstract][Full Text] [Related]
5. Large O Holzer S; Krivec S; Kayser S; Zakel J; Hutter H Anal Chem; 2017 Feb; 89(4):2377-2382. PubMed ID: 28192950 [TBL] [Abstract][Full Text] [Related]
6. Improved mass resolution and mass accuracy in TOF-SIMS spectra and images using argon gas cluster ion beams. Shon HK; Yoon S; Moon JH; Lee TG Biointerphases; 2016 Jun; 11(2):02A321. PubMed ID: 26861497 [TBL] [Abstract][Full Text] [Related]
7. Molecular dynamic-secondary ion mass spectrometry (D-SIMS) ionized by co-sputtering with C60+ and Ar+. You YW; Chang HY; Lin WC; Kuo CH; Lee SH; Kao WL; Yen GJ; Chang CJ; Liu CP; Huang CC; Liao HY; Shyue JJ Rapid Commun Mass Spectrom; 2011 Oct; 25(19):2897-904. PubMed ID: 21913268 [TBL] [Abstract][Full Text] [Related]
8. Hybrid Perovskites Depth Profiling with Variable-Size Argon Clusters and Monatomic Ions Beams. Noël C; Pescetelli S; Agresti A; Franquet A; Spampinato V; Felten A; di Carlo A; Houssiau L; Busby Y Materials (Basel); 2019 Mar; 12(5):. PubMed ID: 30832309 [TBL] [Abstract][Full Text] [Related]
9. Intact lipid imaging of mouse brain samples: MALDI, nanoparticle-laser desorption ionization, and 40 keV argon cluster secondary ion mass spectrometry. Mohammadi AS; Phan NT; Fletcher JS; Ewing AG Anal Bioanal Chem; 2016 Sep; 408(24):6857-68. PubMed ID: 27549796 [TBL] [Abstract][Full Text] [Related]
10. Enhanced surface sensitivity in secondary ion mass spectrometric analysis of organic thin films using size-selected Ar gas-cluster ion projectiles. Tanaka M; Moritani K; Hirota T; Toyoda N; Yamada I; Inui N; Mochiji K Rapid Commun Mass Spectrom; 2010 May; 24(10):1405-10. PubMed ID: 20411579 [TBL] [Abstract][Full Text] [Related]
11. The role of the auxiliary atomic ion beam in C60(+)-Ar+ co-sputtering. Lin WC; Liu CP; Kuo CH; Chang HY; Chang CJ; Hsieh TH; Lee SH; You YW; Kao WL; Yen GJ; Huang CC; Shyue JJ Analyst; 2011 Mar; 136(5):941-6. PubMed ID: 21152650 [TBL] [Abstract][Full Text] [Related]
12. Precise and fast secondary ion mass spectrometry depth profiling of polymer materials with large Ar cluster ion beams. Ninomiya S; Ichiki K; Yamada H; Nakata Y; Seki T; Aoki T; Matsuo J Rapid Commun Mass Spectrom; 2009 Jun; 23(11):1601-6. PubMed ID: 19399762 [TBL] [Abstract][Full Text] [Related]
13. Parallel detection, quantification, and depth profiling of peptides with dynamic-secondary ion mass spectrometry (D-SIMS) ionized by C60(+)-Ar(+) co-sputtering. Chang CJ; Chang HY; You YW; Liao HY; Kuo YT; Kao WL; Yen GJ; Tsai MH; Shyue JJ Anal Chim Acta; 2012 Mar; 718():64-9. PubMed ID: 22305899 [TBL] [Abstract][Full Text] [Related]
14. CO2 Cluster Ion Beam, an Alternative Projectile for Secondary Ion Mass Spectrometry. Tian H; Maciążek D; Postawa Z; Garrison BJ; Winograd N J Am Soc Mass Spectrom; 2016 Sep; 27(9):1476-82. PubMed ID: 27324648 [TBL] [Abstract][Full Text] [Related]
15. Effects of the temperature and beam parameters on depth profiles in X-ray photoelectron spectrometry and secondary ion mass spectrometry under C60(+)-Ar(+) cosputtering. Liao HY; Tsai MH; Kao WL; Kuo DY; Shyue JJ Anal Chim Acta; 2014 Dec; 852():129-36. PubMed ID: 25441889 [TBL] [Abstract][Full Text] [Related]
16. Enhancing ion yields in time-of-flight-secondary ion mass spectrometry: a comparative study of argon and water cluster primary beams. Sheraz née Rabbani S; Razo IB; Kohn T; Lockyer NP; Vickerman JC Anal Chem; 2015 Feb; 87(4):2367-74. PubMed ID: 25588151 [TBL] [Abstract][Full Text] [Related]
17. Molecular depth profiling of sucrose films: a comparative study of C60(n+) ions and traditional Cs(+) and O2(+) ions. Zhu Z; Nachimuthu P; Lea AS Anal Chem; 2009 Oct; 81(20):8272-9. PubMed ID: 19769372 [TBL] [Abstract][Full Text] [Related]
18. Yields and images of secondary ions from organic materials by different primary Bi ions in time-of-flight secondary ion mass spectrometry. Shishido R; Fujii M; Seki T; Aoki T; Matsuo J; Suzuki S Rapid Commun Mass Spectrom; 2016 Feb; 30(4):476-82. PubMed ID: 26777677 [TBL] [Abstract][Full Text] [Related]
19. Method for Molecular Layer Deposition Using Gas Cluster Ion Beam Sputtering with Example Application Lorenz M; Zhang J; Shard AG; Vorng JL; Rakowska PD; Gilmore IS Anal Chem; 2021 Feb; 93(7):3436-3444. PubMed ID: 33571411 [TBL] [Abstract][Full Text] [Related]
20. Improving secondary ion mass spectrometry C60(n+) sputter depth profiling of challenging polymers with nitric oxide gas dosing. Havelund R; Licciardello A; Bailey J; Tuccitto N; Sapuppo D; Gilmore IS; Sharp JS; Lee JL; Mouhib T; Delcorte A Anal Chem; 2013 May; 85(10):5064-70. PubMed ID: 23590425 [TBL] [Abstract][Full Text] [Related] [Next] [New Search]