These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.


BIOMARKERS

Molecular Biopsy of Human Tumors

- a resource for Precision Medicine *

150 related articles for article (PubMed ID: 27056544)

  • 1. Preparation and Analysis of Atom Probe Tips by Xenon Focused Ion Beam Milling.
    Estivill R; Audoit G; Barnes JP; Grenier A; Blavette D
    Microsc Microanal; 2016 Jun; 22(3):576-82. PubMed ID: 27056544
    [TBL] [Abstract][Full Text] [Related]  

  • 2. Application of focused ion beam to atom probe tomography specimen preparation from mechanically alloyed powders.
    Choi PP; Al-Kassab T; Kwon YS; Kim JS; Kirchheim R
    Microsc Microanal; 2007 Oct; 13(5):347-53. PubMed ID: 17900385
    [TBL] [Abstract][Full Text] [Related]  

  • 3. On the fabrication of atom probe tomography specimens of Al alloys at room temperature using focused ion beam milling with liquid Ga ion source.
    Mondal S; Bansal U; Makineni SK
    Microsc Res Tech; 2022 Sep; 85(9):3040-3049. PubMed ID: 35560854
    [TBL] [Abstract][Full Text] [Related]  

  • 4. A multi-ion plasma FIB study: Determining ion implantation depths of Xe, N, O and Ar in tungsten via atom probe tomography.
    Eder K; Bhatia V; Qu J; Van Leer B; Dutka M; Cairney JM
    Ultramicroscopy; 2021 Sep; 228():113334. PubMed ID: 34102569
    [TBL] [Abstract][Full Text] [Related]  

  • 5. In situ site-specific specimen preparation for atom probe tomography.
    Thompson K; Lawrence D; Larson DJ; Olson JD; Kelly TF; Gorman B
    Ultramicroscopy; 2007; 107(2-3):131-9. PubMed ID: 16938398
    [TBL] [Abstract][Full Text] [Related]  

  • 6. Direct Observation of PFIB-Induced Clustering in Precipitation-Strengthened Al Alloys by Atom Probe Tomography.
    Tweddle D; Johnson JA; Kapoor M; Mileski S; Carsley JE; Thompson GB
    Microsc Microanal; 2022 Jan; ():1-6. PubMed ID: 35067265
    [TBL] [Abstract][Full Text] [Related]  

  • 7. An in-situ approach for preparing atom probe tomography specimens by xenon plasma-focussed ion beam.
    Halpin JE; Webster RWH; Gardner H; Moody MP; Bagot PAJ; MacLaren DA
    Ultramicroscopy; 2019 Jul; 202():121-127. PubMed ID: 31005819
    [TBL] [Abstract][Full Text] [Related]  

  • 8. A new method for mapping the three-dimensional atomic distribution within nanoparticles by atom probe tomography (APT).
    Kim SH; Kang PW; Park OO; Seol JB; Ahn JP; Lee JY; Choi PP
    Ultramicroscopy; 2018 Jul; 190():30-38. PubMed ID: 29680520
    [TBL] [Abstract][Full Text] [Related]  

  • 9. Modern Focused-Ion-Beam-Based Site-Specific Specimen Preparation for Atom Probe Tomography.
    Prosa TJ; Larson DJ
    Microsc Microanal; 2017 Apr; 23(2):194-209. PubMed ID: 28162119
    [TBL] [Abstract][Full Text] [Related]  

  • 10. Effect of gallium focused ion beam milling on preparation of aluminium thin foils.
    Unocic KA; Mills MJ; Daehn GS
    J Microsc; 2010 Dec; 240(3):227-38. PubMed ID: 21077883
    [TBL] [Abstract][Full Text] [Related]  

  • 11. Xenon gas field ion source from a single-atom tip.
    Lai WC; Lin CY; Chang WT; Li PC; Fu TY; Chang CS; Tsong TT; Hwang IS
    Nanotechnology; 2017 Jun; 28(25):255301. PubMed ID: 28548051
    [TBL] [Abstract][Full Text] [Related]  

  • 12. Effect of Ion Irradiation Introduced by Focused Ion-Beam Milling on the Mechanical Behaviour of Sub-Micron-Sized Samples.
    Liu J; Niu R; Gu J; Cabral M; Song M; Liao X
    Sci Rep; 2020 Jun; 10(1):10324. PubMed ID: 32587335
    [TBL] [Abstract][Full Text] [Related]  

  • 13. Correlative Approach for Atom Probe Sample Preparation of Interfaces Using Plasma Focused Ion Beam Without Lift-Out.
    Rielli VV; Theska F; Primig S
    Microsc Microanal; 2021 Apr; ():1-11. PubMed ID: 33875032
    [TBL] [Abstract][Full Text] [Related]  

  • 14. Broadening the applications of the atom probe technique by ultraviolet femtosecond laser.
    Hono K; Ohkubo T; Chen YM; Kodzuka M; Oh-ishi K; Sepehri-Amin H; Li F; Kinno T; Tomiya S; Kanitani Y
    Ultramicroscopy; 2011 May; 111(6):576-83. PubMed ID: 21177036
    [TBL] [Abstract][Full Text] [Related]  

  • 15. Liftout of High-Quality Thin Sections of a Perovskite Oxide Thin Film Using a Xenon Plasma Focused Ion Beam Microscope.
    MacLaren I; Nord M; Jiao C; Yücelen E
    Microsc Microanal; 2019 Feb; 25(1):115-118. PubMed ID: 30696493
    [TBL] [Abstract][Full Text] [Related]  

  • 16. Using Xe Plasma FIB for High-Quality TEM Sample Preparation.
    Vitale SM; Sugar JD
    Microsc Microanal; 2022 Mar; ():1-13. PubMed ID: 35289261
    [TBL] [Abstract][Full Text] [Related]  

  • 17. Investigation of the milling characteristics of different focused-ion-beam sources assessed by three-dimensional electron diffraction from crystal lamellae.
    Parkhurst JM; Crawshaw AD; Siebert CA; Dumoux M; Owen CD; Nunes P; Waterman D; Glen T; Stuart DI; Naismith JH; Evans G
    IUCrJ; 2023 May; 10(Pt 3):270-287. PubMed ID: 36952226
    [TBL] [Abstract][Full Text] [Related]  

  • 18. Laser assisted atom probe analysis of thin film on insulating substrate.
    Kodzuka M; Ohkubo T; Hono K
    Ultramicroscopy; 2011 May; 111(6):557-61. PubMed ID: 21172729
    [TBL] [Abstract][Full Text] [Related]  

  • 19. Transmission electron microscopy and atom probe specimen preparation from mechanically alloyed powder using the focused ion-beam lift-out technique.
    Choi PP; Kwon YS; Kim JS; Al-Kassab T
    J Electron Microsc (Tokyo); 2007 Apr; 56(2):43-9. PubMed ID: 17928320
    [TBL] [Abstract][Full Text] [Related]  

  • 20. Evaluation of neon focused ion beam milling for TEM sample preparation.
    Pekin TC; Allen FI; Minor AM
    J Microsc; 2016 Oct; 264(1):59-63. PubMed ID: 27172066
    [TBL] [Abstract][Full Text] [Related]  

    [Next]    [New Search]
    of 8.