158 related articles for article (PubMed ID: 27074103)
1. Determining Projections of Grain Boundaries from Diffraction Data in Transmission Electron Microscope.
Kiss ÁK; Lábár JL
Microsc Microanal; 2016 Jun; 22(3):551-64. PubMed ID: 27074103
[TBL] [Abstract][Full Text] [Related]
2. A Tool for Local Thickness Determination and Grain Boundary Characterization by CTEM and HRTEM Techniques.
Kiss ÁK; Rauch EF; Pécz B; Szívós J; Lábár JL
Microsc Microanal; 2015 Apr; 21(2):422-35. PubMed ID: 25801740
[TBL] [Abstract][Full Text] [Related]
3. Grain boundary character distribution of nanocrystalline Cu thin films using stereological analysis of transmission electron microscope orientation maps.
Darbal AD; Ganesh KJ; Liu X; Lee SB; Ledonne J; Sun T; Yao B; Warren AP; Rohrer GS; Rollett AD; Ferreira PJ; Coffey KR; Barmak K
Microsc Microanal; 2013 Feb; 19(1):111-9. PubMed ID: 23380005
[TBL] [Abstract][Full Text] [Related]
4. Height-resolved quantification of microstructure and texture in polycrystalline thin films using TEM orientation mapping.
Aebersold AB; Alexander DT; Hébert C
Ultramicroscopy; 2015 Dec; 159 Pt 1():112-23. PubMed ID: 26363209
[TBL] [Abstract][Full Text] [Related]
5. Comparing Scanning Electron Microscope and Transmission Electron Microscope Grain Mapping Techniques Applied to Well-Defined and Highly Irregular Nanoparticles.
Mariano RG; Yau A; McKeown JT; Kumar M; Kanan MW
ACS Omega; 2020 Feb; 5(6):2791-2799. PubMed ID: 32095702
[TBL] [Abstract][Full Text] [Related]
6. Three-dimensional geometrical and topological characteristics of grains in conventional and grain boundary engineered 316L stainless steel.
Liu T; Xia S; Zhou B; Bai Q; Rohrer GS
Micron; 2018 Jun; 109():58-70. PubMed ID: 29665457
[TBL] [Abstract][Full Text] [Related]
7. Characterization of the Absolute Crystal Polarity across Twin Boundaries in Gallium Phosphide Using Convergent-Beam Electron Diffraction.
Cohen D; McKernan S; Carter CB
Microsc Microanal; 1999 May; 5(3):173-186. PubMed ID: 10383990
[TBL] [Abstract][Full Text] [Related]
8. Highlighting material structure with transmission electron diffraction correlation coefficient maps.
Kiss ÁK; Rauch EF; Lábár JL
Ultramicroscopy; 2016 Apr; 163():31-7. PubMed ID: 26866276
[TBL] [Abstract][Full Text] [Related]
9. Using transmission Kikuchi diffraction to study intergranular stress corrosion cracking in type 316 stainless steels.
Meisnar M; Vilalta-Clemente A; Gholinia A; Moody M; Wilkinson AJ; Huin N; Lozano-Perez S
Micron; 2015 Aug; 75():1-10. PubMed ID: 25974882
[TBL] [Abstract][Full Text] [Related]
10. First combined electron backscatter diffraction and transmission electron microscopy study of grain boundary structure of deformed quartzite.
Shigematsu N; Prior DJ; Wheeler J
J Microsc; 2006 Dec; 224(Pt 3):306-21. PubMed ID: 17210063
[TBL] [Abstract][Full Text] [Related]
11. A novel approach for site-specific atom probe specimen preparation by focused ion beam and transmission electron backscatter diffraction.
Babinsky K; De Kloe R; Clemens H; Primig S
Ultramicroscopy; 2014 Sep; 144():9-18. PubMed ID: 24815026
[TBL] [Abstract][Full Text] [Related]
12. Three-dimensional EBSD study on the relationship between triple junctions and columnar grains in electrodeposited Co-Ni films.
Bastos A; Zaefferer S; Raabe D
J Microsc; 2008 Jun; 230(Pt 3):487-98. PubMed ID: 18503675
[TBL] [Abstract][Full Text] [Related]
13. Orientation and phase mapping in the transmission electron microscope using precession-assisted diffraction spot recognition: state-of-the-art results.
Viladot D; Véron M; Gemmi M; Peiró F; Portillo J; Estradé S; Mendoza J; Llorca-Isern N; Nicolopoulos S
J Microsc; 2013 Oct; 252(1):23-34. PubMed ID: 23889078
[TBL] [Abstract][Full Text] [Related]
14. Nanometres-resolution Kikuchi patterns from materials science specimens with transmission electron forward scatter diffraction in the scanning electron microscope.
Brodusch N; Demers H; Gauvin R
J Microsc; 2013 Apr; 250(1):1-14. PubMed ID: 23346885
[TBL] [Abstract][Full Text] [Related]
15. Effect of crystallographic orientation on subcritical grain boundary cracking in a conventionally cast polycrystalline nickel-based superalloy.
Swaminathan K; Blendell JE; Trumble KP
Microsc Microanal; 2013 Aug; 19(4):978-87. PubMed ID: 23718929
[TBL] [Abstract][Full Text] [Related]
16. Fast Grain Mapping with Sub-Nanometer Resolution Using 4D-STEM with Grain Classification by Principal Component Analysis and Non-Negative Matrix Factorization.
Allen FI; Pekin TC; Persaud A; Rozeveld SJ; Meyers GF; Ciston J; Ophus C; Minor AM
Microsc Microanal; 2021 Aug; 27(4):794-803. PubMed ID: 34169813
[TBL] [Abstract][Full Text] [Related]
17. Enhanced electrical properties at boundaries including twin boundaries of polycrystalline CdTe thin-film solar cells.
Li H; Liu XX; Lin YS; Yang B; Du ZM
Phys Chem Chem Phys; 2015 May; 17(17):11150-5. PubMed ID: 25857742
[TBL] [Abstract][Full Text] [Related]
18. Orientation mapping of graphene using 4D STEM-in-SEM.
Caplins BW; Holm JD; White RM; Keller RR
Ultramicroscopy; 2020 Dec; 219():113137. PubMed ID: 33096294
[TBL] [Abstract][Full Text] [Related]
19. Grain Boundary Plane Measurement Using Transmission Electron Microscopy Automated Crystallographic Orientation Mapping for Atom Probe Tomography Specimens.
Hartshorne M; Leff A; Vetterick G; Hopkins EM; Taheri ML
Microsc Microanal; 2023 Jun; 29(3):1018-1025. PubMed ID: 37749674
[TBL] [Abstract][Full Text] [Related]
20. Orientation imaging microscopy with optimized convergence angle using CBED patterns in TEMs.
Kumar V
IEEE Trans Image Process; 2013 Jul; 22(7):2637-45. PubMed ID: 23549890
[TBL] [Abstract][Full Text] [Related]
[Next] [New Search]