These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.


BIOMARKERS

Molecular Biopsy of Human Tumors

- a resource for Precision Medicine *

110 related articles for article (PubMed ID: 27376976)

  • 21. Peak Force Infrared-Kelvin Probe Force Microscopy.
    Jakob DS; Wang H; Zeng G; Otzen DE; Yan Y; Xu XG
    Angew Chem Int Ed Engl; 2020 Sep; 59(37):16083-16090. PubMed ID: 32463936
    [TBL] [Abstract][Full Text] [Related]  

  • 22. Quantitative comparison of closed-loop and dual harmonic Kelvin probe force microscopy techniques.
    Kilpatrick JI; Collins L; Weber SAL; Rodriguez BJ
    Rev Sci Instrum; 2018 Dec; 89(12):123708. PubMed ID: 30599628
    [TBL] [Abstract][Full Text] [Related]  

  • 23. Charge trapping states at the SiO2-oligothiophene monolayer interface in field effect transistors studied by Kelvin probe force microscopy.
    Zhang Y; Ziegler D; Salmeron M
    ACS Nano; 2013 Sep; 7(9):8258-65. PubMed ID: 23987138
    [TBL] [Abstract][Full Text] [Related]  

  • 24. Carrier density distribution in silicon nanowires investigated by scanning thermal microscopy and Kelvin probe force microscopy.
    Wielgoszewski G; Pałetko P; Tomaszewski D; Zaborowski M; Jóźwiak G; Kopiec D; Gotszalk T; Grabiec P
    Micron; 2015 Dec; 79():93-100. PubMed ID: 26381074
    [TBL] [Abstract][Full Text] [Related]  

  • 25. Reconstruction of surface potential from Kelvin probe force microscopy images.
    Cohen G; Halpern E; Nanayakkara SU; Luther JM; Held C; Bennewitz R; Boag A; Rosenwaks Y
    Nanotechnology; 2013 Jul; 24(29):295702. PubMed ID: 23807266
    [TBL] [Abstract][Full Text] [Related]  

  • 26. High spatial resolution Kelvin probe force microscopy with coaxial probes.
    Brown KA; Satzinger KJ; Westervelt RM
    Nanotechnology; 2012 Mar; 23(11):115703. PubMed ID: 22369870
    [TBL] [Abstract][Full Text] [Related]  

  • 27. Towards nanoscale electrical measurements in liquid by advanced KPFM techniques: a review.
    Collins L; Kilpatrick JI; Kalinin SV; Rodriguez BJ
    Rep Prog Phys; 2018 Aug; 81(8):086101. PubMed ID: 29990308
    [TBL] [Abstract][Full Text] [Related]  

  • 28. Open-loop band excitation Kelvin probe force microscopy.
    Guo S; Kalinin SV; Jesse S
    Nanotechnology; 2012 Mar; 23(12):125704. PubMed ID: 22407131
    [TBL] [Abstract][Full Text] [Related]  

  • 29. Role of selenium addition to CdZnTe matrix for room-temperature radiation detector applications.
    Roy UN; Camarda GS; Cui Y; Gul R; Hossain A; Yang G; Zazvorka J; Dedic V; Franc J; James RB
    Sci Rep; 2019 Feb; 9(1):1620. PubMed ID: 30733586
    [TBL] [Abstract][Full Text] [Related]  

  • 30. The influence of surface topography on Kelvin probe force microscopy.
    Sadewasser S; Leendertz C; Streicher F; Lux-Steiner MCh
    Nanotechnology; 2009 Dec; 20(50):505503. PubMed ID: 19934483
    [TBL] [Abstract][Full Text] [Related]  

  • 31. Surface potential imaging with atomic resolution by frequency-modulation Kelvin probe force microscopy without bias voltage feedback.
    Kou L; Ma Z; Li YJ; Naitoh Y; Komiyama M; Sugawara Y
    Nanotechnology; 2015 May; 26(19):195701. PubMed ID: 25895740
    [TBL] [Abstract][Full Text] [Related]  

  • 32. Characterizing defects and transport in Si nanowire devices using Kelvin probe force microscopy.
    Bae SS; Prokopuk N; Quitoriano NJ; Adams SM; Ragan R
    Nanotechnology; 2012 Oct; 23(40):405706. PubMed ID: 22995919
    [TBL] [Abstract][Full Text] [Related]  

  • 33. The stray capacitance effect in Kelvin probe force microscopy using FM, AM and heterodyne AM modes.
    Ma ZM; Kou L; Naitoh Y; Li YJ; Sugawara Y
    Nanotechnology; 2013 Jun; 24(22):225701. PubMed ID: 23633495
    [TBL] [Abstract][Full Text] [Related]  

  • 34. Interpreting Kelvin probe force microscopy under an applied electric field: local electronic behavior of vapor-liquid-solid Si nanowires.
    Quitoriano NJ; Sanderson RN; Bae SS; Ragan R
    Nanotechnology; 2013 May; 24(20):205704. PubMed ID: 23609527
    [TBL] [Abstract][Full Text] [Related]  

  • 35. Utilizing the surface potential of a solid electrolyte region as the potential reference in Kelvin probe force microscopy.
    Ishida N
    Beilstein J Nanotechnol; 2022; 13():1558-1563. PubMed ID: 36628111
    [TBL] [Abstract][Full Text] [Related]  

  • 36. New insights on atomic-resolution frequency-modulation Kelvin-probe force-microscopy imaging of semiconductors.
    Sadewasser S; Jelinek P; Fang CK; Custance O; Yamada Y; Sugimoto Y; Abe M; Morita S
    Phys Rev Lett; 2009 Dec; 103(26):266103. PubMed ID: 20366324
    [TBL] [Abstract][Full Text] [Related]  

  • 37. Study of charge separation and interface formation in a single nanorod CdS-Cu(x)S heterojunction solar cell using Kelvin probe force microscopy.
    Gupta S; Batra Y; Mehta BR; Satsangi VR
    Nanotechnology; 2013 Jun; 24(25):255703. PubMed ID: 23708491
    [TBL] [Abstract][Full Text] [Related]  

  • 38. On the relevance of the atomic-scale contact potential difference by amplitude-modulation and frequency-modulation Kelvin probe force microscopy.
    Nony L; Bocquet F; Loppacher C; Glatzel T
    Nanotechnology; 2009 Jul; 20(26):264014. PubMed ID: 19509441
    [TBL] [Abstract][Full Text] [Related]  

  • 39. Kelvin probe force microscopy on surfaces of UHV cleaved ionic crystals.
    Barth C; Henry CR
    Nanotechnology; 2006 Apr; 17(7):S155-61. PubMed ID: 21727407
    [TBL] [Abstract][Full Text] [Related]  

  • 40. Nanoscale quantitative measurement of the potential of charged nanostructures by electrostatic and Kelvin probe force microscopy: unraveling electronic processes in complex materials.
    Liscio A; Palermo V; Samorì P
    Acc Chem Res; 2010 Apr; 43(4):541-50. PubMed ID: 20058907
    [TBL] [Abstract][Full Text] [Related]  

    [Previous]   [Next]    [New Search]
    of 6.