145 related articles for article (PubMed ID: 27420398)
1. Computational model for noncontact atomic force microscopy: energy dissipation of cantilever.
Senda Y; Blomqvist J; Nieminen RM
J Phys Condens Matter; 2016 Sep; 28(37):375001. PubMed ID: 27420398
[TBL] [Abstract][Full Text] [Related]
2. A measurement of the hysteresis loop in force-spectroscopy curves using a tuning-fork atomic force microscope.
Lange M; van Vörden D; Möller R
Beilstein J Nanotechnol; 2012; 3():207-12. PubMed ID: 22496993
[TBL] [Abstract][Full Text] [Related]
3. Energy dissipation and dynamic response of an amplitude-modulation atomic-force microscopy subjected to a tip-sample viscous force.
Lin SM
Ultramicroscopy; 2007; 107(2-3):245-53. PubMed ID: 16982149
[TBL] [Abstract][Full Text] [Related]
4. Detection of single-electron charging in an individual InAs quantum dot by noncontact atomic-force microscopy.
Stomp R; Miyahara Y; Schaer S; Sun Q; Guo H; Grutter P; Studenikin S; Poole P; Sachrajda A
Phys Rev Lett; 2005 Feb; 94(5):056802. PubMed ID: 15783674
[TBL] [Abstract][Full Text] [Related]
5. Dissipation signals due to lateral tip oscillations in FM-AFM.
Klocke M; Wolf DE
Beilstein J Nanotechnol; 2014; 5():2048-57. PubMed ID: 25551032
[TBL] [Abstract][Full Text] [Related]
6. Energy dissipation in multifrequency atomic force microscopy.
Pukhova V; Banfi F; Ferrini G
Beilstein J Nanotechnol; 2014; 5():494-500. PubMed ID: 24778976
[TBL] [Abstract][Full Text] [Related]
7. The influence of a Si cantilever tip with/without tungsten coating on noncontact atomic force microscopy imaging of a Ge(001) surface.
Naitoh Y; Kinoshita Y; Jun Li Y; Kageshima M; Sugawara Y
Nanotechnology; 2009 Jul; 20(26):264011. PubMed ID: 19509444
[TBL] [Abstract][Full Text] [Related]
8. Coupled molecular and cantilever dynamics model for frequency-modulated atomic force microscopy.
Klocke M; Wolf DE
Beilstein J Nanotechnol; 2016; 7():708-20. PubMed ID: 27335760
[TBL] [Abstract][Full Text] [Related]
9. Nonequilibrium statistical mechanics of mixed quantum classical ensembles: application to noncontact atomic force microscopy.
Kantorovich LN
Phys Rev Lett; 2002 Aug; 89(9):096105. PubMed ID: 12190420
[TBL] [Abstract][Full Text] [Related]
10. Ab initio simulation of atomic-scale imaging in noncontact atomic force microscopy.
Caciuc V; Hölscher H
Nanotechnology; 2009 Jul; 20(26):264006. PubMed ID: 19509458
[TBL] [Abstract][Full Text] [Related]
11. Fabrication of electron beam deposited tip for atomic-scale atomic force microscopy in liquid.
Miyazawa K; Izumi H; Watanabe-Nakayama T; Asakawa H; Fukuma T
Nanotechnology; 2015 Mar; 26(10):105707. PubMed ID: 25697199
[TBL] [Abstract][Full Text] [Related]
12. Quantitative force and dissipation measurements in liquids using piezo-excited atomic force microscopy: a unifying theory.
Kiracofe D; Raman A
Nanotechnology; 2011 Dec; 22(48):485502. PubMed ID: 22071495
[TBL] [Abstract][Full Text] [Related]
13. Dynamic spring constants for higher flexural modes of cantilever plates with applications to atomic force microscopy.
Hähner G
Ultramicroscopy; 2010 Jun; 110(7):801-6. PubMed ID: 20188476
[TBL] [Abstract][Full Text] [Related]
14. Influence of Poisson's ratio variation on lateral spring constant of atomic force microscopy cantilevers.
Yeh MK; Tai NH; Chen BY
Ultramicroscopy; 2008 Sep; 108(10):1025-9. PubMed ID: 18547729
[TBL] [Abstract][Full Text] [Related]
15. Accurate measurement of Atomic Force Microscope cantilever deflection excluding tip-surface contact with application to force calibration.
Slattery AD; Blanch AJ; Quinton JS; Gibson CT
Ultramicroscopy; 2013 Aug; 131():46-55. PubMed ID: 23685172
[TBL] [Abstract][Full Text] [Related]
16. Characterization of surface stiffness and probe-sample dissipation using the band excitation method of atomic force microscopy: a numerical analysis.
Kareem AU; Solares SD
Nanotechnology; 2012 Jan; 23(1):015706. PubMed ID: 22155951
[TBL] [Abstract][Full Text] [Related]
17. Energy dissipation in atomic force microscopy and atomic loss processes.
Hoffmann PM; Jeffery S; Pethica JB; Ozer HO; Oral A
Phys Rev Lett; 2001 Dec; 87(26):265502. PubMed ID: 11800839
[TBL] [Abstract][Full Text] [Related]
18. A method to quantitatively evaluate the Hamaker constant using the jump-into-contact effect in atomic force microscopy.
Das S; Sreeram PA; Raychaudhuri AK
Nanotechnology; 2007 Jan; 18(3):035501. PubMed ID: 19636120
[TBL] [Abstract][Full Text] [Related]
19. High-resolution noncontact atomic force microscopy.
Pérez R; García R; Schwarz U
Nanotechnology; 2009 Jul; 20(26):260201. PubMed ID: 19531843
[TBL] [Abstract][Full Text] [Related]
20. Identification of nanoscale dissipation processes by dynamic atomic force microscopy.
Garcia R; Gómez CJ; Martinez NF; Patil S; Dietz C; Magerle R
Phys Rev Lett; 2006 Jul; 97(1):016103. PubMed ID: 16907387
[TBL] [Abstract][Full Text] [Related]
[Next] [New Search]