These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.
218 related articles for article (PubMed ID: 27482855)
21. Quality assessment of atomic force microscopy probes by scanning electron microscopy: correlation of tip structure with rendered images. Taatjes DJ; Quinn AS; Lewis MR; Bovill EG Microsc Res Tech; 1999 Mar; 44(5):312-26. PubMed ID: 10090206 [TBL] [Abstract][Full Text] [Related]
23. Fabrication of electron beam deposited tip for atomic-scale atomic force microscopy in liquid. Miyazawa K; Izumi H; Watanabe-Nakayama T; Asakawa H; Fukuma T Nanotechnology; 2015 Mar; 26(10):105707. PubMed ID: 25697199 [TBL] [Abstract][Full Text] [Related]
24. High-speed atomic force microscopy for large scan sizes using small cantilevers. Braunsmann C; Schäffer TE Nanotechnology; 2010 Jun; 21(22):225705. PubMed ID: 20453273 [TBL] [Abstract][Full Text] [Related]
25. A compact vertical scanner for atomic force microscopes. Park JH; Shim J; Lee DY Sensors (Basel); 2010; 10(12):10673-82. PubMed ID: 22163492 [TBL] [Abstract][Full Text] [Related]
26. High-speed atomic force microscope combined with single-molecule fluorescence microscope. Fukuda S; Uchihashi T; Iino R; Okazaki Y; Yoshida M; Igarashi K; Ando T Rev Sci Instrum; 2013 Jul; 84(7):073706. PubMed ID: 23902075 [TBL] [Abstract][Full Text] [Related]
27. Reconstruction of a scanned topographic image distorted by the creep effect of a Z scanner in atomic force microscopy. Han C; Chung CC Rev Sci Instrum; 2011 May; 82(5):053709. PubMed ID: 21639509 [TBL] [Abstract][Full Text] [Related]
28. Contact atomic force microscopy using piezoresistive cantilevers in load force modulation mode. Biczysko P; Dzierka A; Jóźwiak G; Rudek M; Gotszalk T; Janus P; Grabiec P; Rangelow IW Ultramicroscopy; 2018 Jan; 184(Pt A):199-208. PubMed ID: 28950210 [TBL] [Abstract][Full Text] [Related]
29. Note: High-speed Z tip scanner with screw cantilever holding mechanism for atomic-resolution atomic force microscopy in liquid. Akrami SM; Miyata K; Asakawa H; Fukuma T Rev Sci Instrum; 2014 Dec; 85(12):126106. PubMed ID: 25554342 [TBL] [Abstract][Full Text] [Related]
30. Non-optical tip-sample distance control method for scanning near-field optical microscopy using a piezoresistive micro cantilever. Muramatsu H; Egawa A; Homma K; Kim JM; Takahashi H; Shirakawabe Y; Shimizu N J Microsc; 2001 Apr; 202(Pt 1):154-61. PubMed ID: 11298886 [TBL] [Abstract][Full Text] [Related]
31. Software for drift compensation, particle tracking and particle analysis of high-speed atomic force microscopy image series. Husain M; Boudier T; Paul-Gilloteaux P; Casuso I; Scheuring S J Mol Recognit; 2012 May; 25(5):292-8. PubMed ID: 22528191 [TBL] [Abstract][Full Text] [Related]
32. Atomic-resolution imaging in liquid by frequency modulation atomic force microscopy using small cantilevers with megahertz-order resonance frequencies. Fukuma T; Onishi K; Kobayashi N; Matsuki A; Asakawa H Nanotechnology; 2012 Apr; 23(13):135706. PubMed ID: 22421199 [TBL] [Abstract][Full Text] [Related]
33. Atomic Force Microscopy Imaging in Turbid Liquids: A Promising Tool in Nanomedicine. Leitner M; Seferovic H; Stainer S; Buchroithner B; Schwalb CH; Deutschinger A; Ebner A Sensors (Basel); 2020 Jul; 20(13):. PubMed ID: 32630829 [TBL] [Abstract][Full Text] [Related]
34. Advanced tip design for liquid phase vibration mode atomic force microscopy. Muramatsu H; Yamamoto Y; Shigeno M; Shirakawabe Y; Inoue A; Kim WS; Kim SJ; Chang SM; Kim JM Anal Chim Acta; 2008 Mar; 611(2):233-8. PubMed ID: 18328326 [TBL] [Abstract][Full Text] [Related]
35. Study of sensitivity and noise in the piezoelectric self-sensing and self-actuating cantilever with an integrated Wheatstone bridge circuit. Shin C; Jeon I; Khim ZG; Hong JW; Nam H Rev Sci Instrum; 2010 Mar; 81(3):035109. PubMed ID: 20370215 [TBL] [Abstract][Full Text] [Related]
36. Atomic force microscopy with integrated on-chip interferometric readout. Zawierta M; Jeffery RD; Putrino G; Silva KKMBD; Keating A; Martyniuk M; Faraone L Ultramicroscopy; 2019 Oct; 205():75-83. PubMed ID: 31247456 [TBL] [Abstract][Full Text] [Related]
37. Wide-area scanner for high-speed atomic force microscopy. Watanabe H; Uchihashi T; Kobashi T; Shibata M; Nishiyama J; Yasuda R; Ando T Rev Sci Instrum; 2013 May; 84(5):053702. PubMed ID: 23742553 [TBL] [Abstract][Full Text] [Related]
38. Multi-actuation and PI control: a simple recipe for high-speed and large-range atomic force microscopy. Soltani Bozchalooi I; Youcef-Toumi K Ultramicroscopy; 2014 Nov; 146():117-24. PubMed ID: 25164496 [TBL] [Abstract][Full Text] [Related]
39. Cantilevered bimorph-based scanner for high speed atomic force microscopy with large scanning range. Zhou Y; Shang G; Cai W; Yao JE Rev Sci Instrum; 2010 May; 81(5):053708. PubMed ID: 20515146 [TBL] [Abstract][Full Text] [Related]
40. Resonance frequencies of AFM cantilevers in contact with a surface. Verbiest GJ; Rost MJ Ultramicroscopy; 2016 Dec; 171():70-76. PubMed ID: 27615394 [TBL] [Abstract][Full Text] [Related] [Previous] [Next] [New Search]